PARTICLE TRAP FOR A PLASMA SOURCE
    1.
    发明申请
    PARTICLE TRAP FOR A PLASMA SOURCE 审中-公开
    用于等离子体源的颗粒捕获

    公开(公告)号:WO2009158249A3

    公开(公告)日:2014-09-25

    申请号:PCT/US2009047631

    申请日:2009-06-17

    CPC classification number: H01J37/32357 H01J37/32871 Y10S55/15 Y10T29/4935

    Abstract: A particle trap for a remote plasma source includes a body structure having an inlet for coupling to a chamber of a remote plasma source and an outlet for coupling to a process chamber inlet. The particle trap for a remote plasma source also includes a gas channel formed in the body structure and in fluid communication with the body structure inlet and the body structure outlet. The gas channel can define a path through the body structure that causes particles in a gas passing from a first portion of the channel to strike a wall that defines a second portion of the gas channel at an angle relative to a surface of the wall. A coolant member can be in thermal communication with the gas channel.

    Abstract translation: 用于远程等离子体源的颗粒捕集器包括具有用于耦合到远程等离子体源的室的入口和用于耦合到处理室入口的出口的主体结构。 用于远程等离子体源的颗粒捕获器还包括形成在主体结构中并与主体结构入口和主体结构出口流体连通的气体通道。 气体通道可以限定穿过主体结构的路径,其使得从通道的第一部分通过的气体中的颗粒撞击限定气体通道的第二部分的壁,该壁相对于壁的表面成一定角度。 冷却剂构件可以与气体通道热连通。

    METHODS AND APPARATUS FOR PROTECTING PLASMA CHAMBER SURFACES

    公开(公告)号:SG177478A1

    公开(公告)日:2012-02-28

    申请号:SG2012000139

    申请日:2009-11-16

    Applicant: MKS INSTR INC

    Abstract: A method for creating a protective layer over a surface of an object comprising aluminum and magnesium for use in a semiconductor processing system, which includes oxidizing the surface of the object using a plasma electrolytic oxidation process. The method also includes generating a halogen-comprising plasma by exciting a gas comprising a halogen. The method also includes exposing the oxidized surface to the halogen-comprising plasma or excited gas.

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