Abstract:
A non-volatile memory device is proposed. The memory device (100) includes a plurality of blocks (115) of memory cells (125), each block having a common biasing node (SL) for all the memory cells of the block, biasing means (150) for providing a biasing voltage, and selection means (140, 145) for selectively applying the biasing voltage to the biasing node of a selected block, for each block the selection means including first switching means (N8, N9, N10) and second switching means (N7) connected in series, the first switching means being connected with the biasing node and the second switching means being connected with the biasing means, wherein the second switching means of all the blocks are connected in parallel, the selection means including means (145) for closing the first switching means of the selected block and the second switching means of all the blocks, and for opening the second switching means of each unselected block.
Abstract:
A circuit for sensing a ferroelectric non-volatile information storage unit (103,403) comprises a pre-charge circuit (113;413t,413c) for applying a prescribed pre-charge voltage (Vprch) to a storage capacitor (C;Ct,Cc) of the information storage unit. The pre-charge voltage causes a variation in a polarization charge of the storage capacitor, depending on an initial polarization state of the storage capacitor. A charge integration circuit (115,CAP;115t,115c,CAPt,CAPc) is provided for integrating an electric charge proportional to the variation in polarization charge experienced by the storage capacitor. The charge integration circuit thus provides an output voltage (Voutsw,Voutln) depending on the polarization state of the storage capacitor. The charge integration circuit may comprises an integration capacitor (CAP;CAPt,CAPc) and current mirror circuit (115;415t,415c) , with a first mirror branch (115a) coupled to the pre-charge circuit and a second mirror branch (115b) coupled to the integration capacitor, for mirroring into the second mirror branch an electric charge (Qsw,Qln) supplied to the information storage unit to compensate for the variation in the polarization charge experienced by the storage capacitor.