Integrated electronic device comprising a mechanical stress protection structure
    2.
    发明公开
    Integrated electronic device comprising a mechanical stress protection structure 失效
    Integrierte elektronische Anordnung mit einer Schutzstruktur gegen mechansiche Spannungen

    公开(公告)号:EP0923126A1

    公开(公告)日:1999-06-16

    申请号:EP97830654.6

    申请日:1997-12-05

    CPC classification number: H01L23/585 H01L2924/0002 H01L2924/00

    Abstract: The integrated electronic device (1) comprises a protection structure (31) of metal, extending vertically and laterally to and along a predominant part of the periphery of an electronic component (3) integrated underneath the pad region (28). The protection structure (31) comprises a substantially annular region (21; 21b; 21c) formed from the second metal layer (20) and absorbing the stresses exerted on the pad during wire bonding. The annular region may be floating or form part of the path connecting the pad to the electronic component (3).

    Abstract translation: 集成电子设备(1)包括金属保护结构(31),该金属保护结构(31)在集成在焊盘区域(28)下方的电子部件(3)的主要部分的垂直和横向延伸并且沿其主要部分延伸。 保护结构(31)包括由第二金属层(20)形成的基本上环形的区域(21; 21b; 21c),并且在引线接合期间吸收施加在焊盘上的应力。 环形区域可以是浮动的或形成将焊盘连接到电子部件(3)的路径的一部分。

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