Abstract:
A regulator circuit for a charge pump voltage generator comprises a voltage comparator means (400) for performing a voltage comparison between a charge pump output voltage (Vout) and a reference voltage (Vbg), and means (425) responsive to the voltage comparator means for conditioning a charge pump clocking to the result of the voltage comparison. The voltage comparator means includes sampling means (C3,C4,SW3-SW5,SMP) for sampling the charge pump output voltage at a sampling rate. Sampling rate control means (410,415) are provided, responsive to the voltage comparison, for controlling the sampling rate according to the result of the voltage comparison.
Abstract:
An electrically programmable non-volatile memory device (100) is proposed. The memory device includes a plurality of memory cells (110) and a driver circuit (115,120) for driving the memory cells (110); the driver circuit includes programming means (120) for providing a first programming voltage (VDs) to the drains and a second programming voltage (VSm) to the sources of a set of selected memory cells for programming the selected memory cells; the first programming voltage requires a first transient period (T 1 ) for reaching a first target value thereof. In the solution according to an embodiment of the present invention, the programming means includes means (605) for maintaining the second programming voltage substantially equal to the first programming voltage during a second transient period (T 2 ) being required by the second programming voltage to reach a second target value thereof, the two transient periods starting simultaneously.
Abstract:
There is disclosed an integrated control circuit (3) for a charge pump (1). The integrated circuit comprises a first device (112,N1,N2,R,12) suitable for regulating the output voltage (Vout) of the charge pump (1) and a second device (113,M10,M11,C11,11) suitable for increasing the output voltage (Vout) from the charge pump with a set ramp. The integrated circuit comprises means (111) suitable for activating said first device and providing it with a first value of a supply signal (Ireg) in a first period of time (A) and suitable for activating said second device and for providing it with a second value (Iramp) of the supply signal that is greater than the first value in a second period of time (C) after the first in such a way that the output voltage of the charge pump ascends a ramp from a first value (Vlow) to a second value (Vhigh) that is greater than the first value, said second value being fixed by the reactivation of the first device.
Abstract:
A non-volatile memory device is proposed. The memory device (100) includes a plurality of blocks (115) of memory cells (125), each block having a common biasing node (SL) for all the memory cells of the block, biasing means (150) for providing a biasing voltage, and selection means (140, 145) for selectively applying the biasing voltage to the biasing node of a selected block, for each block the selection means including first switching means (N8, N9, N10) and second switching means (N7) connected in series, the first switching means being connected with the biasing node and the second switching means being connected with the biasing means, wherein the second switching means of all the blocks are connected in parallel, the selection means including means (145) for closing the first switching means of the selected block and the second switching means of all the blocks, and for opening the second switching means of each unselected block.
Abstract:
A power management unit (115) for a non-volatile memory device (100) is proposed. The power management unit includes means (125) for providing a reference voltage, resistive means (Rr) for deriving a reference current from the reference voltage, means (135 1 -135 n ) for generating a plurality of operative voltages from a power supply voltage, and means (145 1 -145 n ) for regulating the operative voltages; in the power management unit of the invention, for each operative voltage the means for regulating includes means (220) for deriving a scaled reference current from the reference current according to a scaling factor, further resistive means (245 i ) for deriving a rating voltage from the scaled reference current, means (220,245 i ) for deriving a measuring voltage from the operative voltage and the rating voltage, and means (250 i ) for controlling the operative voltage according to a comparison between the measuring voltage and the reference voltage.