Abstract:
A bandgap voltage reference circuit ( 100' ) for generating a bandgap reference voltage ( Vbg ) according to a first current ( Iptat ) is provided. Said circuit comprises a current generator ( 104 ) controlled by a first driving voltage ( Vpgate ) to generate the first current ( Iptat ) depending on the driving voltage. Said circuit further comprises a first reference circuit clement (102 ) adapted to generate a first reference voltage ( Vpluse ) based on the first current and a second reference circuit element ( 106 ) adapted to generate a second reference voltage ( Vminuse ) according to the first current. The circuit further comprises an operational amplifier ( 124' ) having a first input terminal coupled with the first circuit element for receiving a first reference input voltage ( Vplus ) based on the first reference voltage, a second input terminal coupled with the second reference circuit element for receiving a second input voltage ( Vminus ) based on the second reference voltage, and an output terminal coupled with the current generator to provide the first driving voltage. The circuit also comprises a control circuit ( 134 ). Said control circuit comprises first capacitive means ( 136 ) having a first terminal coupled with the first reference circuit element to receive the first reference voltage and a second terminal coupled with the first input terminal to provide the first input voltage. The control circuit further comprises second capacitive means ( 138 ) comprising a first terminal coupled with the second reference circuit element for receiving the second reference voltage and a second terminal coupled with the second input terminal to provide the second input voltage. The control circuit further comprises first biasing means ( 140' ) for selectively providing a first common-mode voltage ( Vcm ) to the second terminal of the first and second capacitive means. The operational amplifier is an offset compensated operational amplifier further comprising a first compensation terminal for receiving the first common-mode voltage and a second compensation terminal coupled with a compensation offset management circuit ( 600 ) for receiving a first compensation voltage ( Vc1 ). The offset management circuit comprises an auxiliary operational amplifier ( 902 ) having a first input terminal adapted to receive a third input voltage ( Vplus2 ) corresponding to the first input voltage, a second input terminal adapted to receive a fourth input voltage ( Vminus2 ) corresponding to the second input voltage and an output terminal adapted to be selectively coupled with a second compensation terminal of the operational amplifier for providing the first compensation voltage.
Abstract:
A solution relating to a sense structure is proposed. Particularly, the sense structure (200) comprises a plurality of sense amplifiers (205 i ), each sense amplifier comprising at least one measuring terminal (INm) and a reference terminal (INr) for receiving a measuring current (Im) and a reference current (Ir), respectively, output means (225) for providing an output voltage (Vout) according to a comparison between the measuring current and the reference current, and voltage regulating means in cascode configuration (220m,220r) for regulating a voltage at the measuring terminal and at the reference terminal, the regulating means comprising a measuring regulating transistor (220m) and a reference regulating transistor (220r) having a first conduction terminal coupled with the measuring terminal and with the reference terminal, respectively, a second conduction terminal coupled with the output means and a control terminal coupled with a biasing terminal (Tb), the sense structure further comprising biasing means (230) for providing a biasing voltage (Vb) to the biasing terminal of all the sense amplifiers, and common regulating means (235) for regulating the biasing voltage for all the sense amplifiers, wherein each sense amplifier further comprises local regulating means (240) for regulating the biasing voltage applied to the biasing terminal, and in that the sense structure further comprises switching means (245) selectively controllable for coupling the local regulating means of each sense amplifier with the common regulating means to refresh the local regulating means in a rest condition and for decoupling the local regulating means of each sense amplifier from the common regulating means in an operative condition.
Abstract:
A bandgap voltage reference circuit ( 100 ) for generating a bandgap voltage reference ( Vbg ). Said circuit comprises a current generator ( 104 ) controlled by a first driving voltage ( Vpgate ) for generating a first current ( Iptat ) depending on the driving voltage, and a first reference circuit element ( 102 ) coupled to the controlled current generator ( 104 ) for receiving the first current and generating a first reference voltage ( Vpluse ) in response to the first current. The circuit further comprises a second reference circuit element ( 106 ) for receiving a second current ( Iptat ) corresponding to the first current; said second reference circuit element is adapted to generate a second reference voltage ( Vminuse ) in response to the second current. Said circuit further comprises a third reference circuit element ( 128 ) for receiving a third current ( Iptat ) corresponding to the first current and generating the bandgap reference voltage in response to the third current, and an operational amplifier ( 124 ). The operational amplifier has a first input terminal coupled to the first circuit element for receiving a first reference voltage input ( Vplus ) based on the first reference voltage, a second input terminal coupled to the second reference circuit element for receive a second input voltage ( Vminus ) based on the second reference voltage and an output terminal coupled to the controlled current generator to provide the first driving voltage ( Vpgate ) to the current generator according to the difference between the first input voltage and the second input voltage. The circuit also comprises a control circuit ( 134 ) comprising first capacitive means ( 136 ) and second capacitive means ( 138 ). The first capacitive means have a first terminal coupled to the first reference circuit element to receive the first reference voltage and a second terminal coupled to the first input terminal to provide the first input voltage. The second capacitive means comprise a first terminal coupled to the second reference circuit element for receiving the second reference voltage and a second terminal coupled to the second input terminal to provide the second input voltage. The control circuit also comprises biasing means ( 140 ) to selectively provide a common-mode voltage ( Vcm ) to the second terminals of the first and second capacitive means.
Abstract:
A solution relating to a sense structure is proposed. Particularly, the sense structure (200) comprises a plurality of sense amplifiers (205 i ), each sense amplifier comprising at least one measuring terminal (INm) and a reference terminal (INr) for receiving a measuring current (Im) and a reference current (Ir), respectively, output means (225) for providing an output voltage (Vout) according to a comparison between the measuring current and the reference current, and voltage regulating means in cascode configuration (220m,220r) for regulating a voltage at the measuring terminal and at the reference terminal, the regulating means comprising a measuring regulating transistor (220m) and a reference regulating transistor (220r) having a first conduction terminal coupled with the measuring terminal and with the reference terminal, respectively, a second conduction terminal coupled with the output means and a control terminal coupled with a biasing terminal (Tb), the sense structure further comprising biasing means (230) for providing a biasing voltage (Vb) to the biasing terminal of all the sense amplifiers, and common regulating means (235) for regulating the biasing voltage for all the sense amplifiers, wherein each sense amplifier further comprises local regulating means (240) for regulating the biasing voltage applied to the biasing terminal, and in that the sense structure further comprises switching means (245) selectively controllable for coupling the local regulating means of each sense amplifier with the common regulating means to refresh the local regulating means in a rest condition and for decoupling the local regulating means of each sense amplifier from the common regulating means in an operative condition.
Abstract:
A non-volatile memory device is proposed. The memory device (100) includes a plurality of blocks (115) of memory cells (125), each block having a common biasing node (SL) for all the memory cells of the block, biasing means (150) for providing a biasing voltage, and selection means (140, 145) for selectively applying the biasing voltage to the biasing node of a selected block, for each block the selection means including first switching means (N8, N9, N10) and second switching means (N7) connected in series, the first switching means being connected with the biasing node and the second switching means being connected with the biasing means, wherein the second switching means of all the blocks are connected in parallel, the selection means including means (145) for closing the first switching means of the selected block and the second switching means of all the blocks, and for opening the second switching means of each unselected block.