Abstract:
A method of making a high-precision optical surface which may be used either as a Wolter-type segment in an X-ray mirror system or in a collector of a EUVL system or as a spherical, aspherical, or free form normal or grazing incidence mirror in an EUVL system is prepared by sagging a thin flat glass sheet onto a masterpiece, in particular a mandrel, made from a temperature-resistant material, such as an alumina based ceramic or a keatite glass ceramic. The glass sheet is polished to the desired surface roughness (14), is positioned to an upper surface of the masterpiece (16), and is heated (18) to effect sagging onto the upper surface of the masterpiece for generating a shaped body. Thereafter, the shaped body is cooled and removed from the masterpiece, is mounted within a holder (22), is inspected for deviations from the specification (24) preferably using interferometric measurements, and is corrected for defects (26), preferably using ion beam figuring.
Abstract:
The present invention relates to an optical collector for use in EUV lithography, comprising at least one optically effective element in form of a mirror shell having a substantially cup-shaped structure which heats up when irradiated with light, further comprising at least one mounting element for fastening the at least one optically effective element on a holding structure, the at least one optically effective element having a body, and further comprising an active cooling system, which has at least one cooling conduit to which a cooling medium can be admitted, wherein the at least one cooling conduit is provided on a cooling body which is directly connected with the body of the optically effective element or is integrated in same.
Abstract:
Apparatus for measuring the absorption of transparent samples (11, 31, 41) (e.g. precious stones) consisting of a radiation source (13, 43), a device (14, 44, 54) (e.g. Ulbricht sphere) for multiple reflection without a privileged direction, and a photometric measuring device (15d, 46) (e.g. diode row spectrometer), the sample (11, 31, 41) being arranged in the device (14, 44, 54) for multiple reflection without a privileged direction, or between it and the photometric measuring device (15d, 46), and being diffusely illuminated. … …