公开(公告)号：US20240328952A1

公开(公告)日：2024-10-03

申请号：US18698204

申请日：2022-10-14

Applicant: ATONARP INC.

Inventor： Neil OU ,  Ankita KHANOLKAR

IPC: G01N21/65

CPC classification number: G01N21/65 ,  G01N2021/653 ,  G01N2201/06113 ,  G01N2201/08 ,  G01N2201/10

Abstract: A system includes a laser module that includes a first laser source configured to generate a narrowband first source laser light; and a plurality of routes configured by optical fibers without using a free space. The plurality of routes includes: a first route for splitting the first source light pulses for generating Stokes light pulses and pump light pulses; a second route for amplifying and broadening a range of wavelengths with a first train including a first amplifier, a first HCPCF, and HNLPCF spliced to supply the Stokes light pulses; and a third route for amplifying with a second train including a second amplifier and a second HCPCF spliced to supply the pump light pulses.

公开(公告)号：US12066387B2

公开(公告)日：2024-08-20

申请号：US17389456

申请日：2021-07-30

Applicant: SEDDI, INC.

Inventor： Carlos Aliaga ,  Raúl Alcain ,  Carlos Heras ,  Iñigo Salinas ,  Sergio Suja ,  Elena Garcés ,  Jorge López

IPC: G01N21/88 ,  G01N21/84 ,  G02B13/00 ,  G03B15/07

CPC classification number: G01N21/8806 ,  G02B13/0055 ,  G03B15/07 ,  G01N2021/8444 ,  G01N2021/8816 ,  G01N2201/062 ,  G01N2201/0633 ,  G01N2201/10

Abstract: According to various embodiments of the present invention, an optical capture system is provided. In one embodiment, a micro-scale optical capturing system is provided with low divergence (approximately 1°) of the incident light and low acceptance angle (

公开(公告)号：US12038389B2

公开(公告)日：2024-07-16

申请号：US17717150

申请日：2022-04-11

Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor： Chung-Pin Chou

IPC: G01N21/95 ,  G01B11/30 ,  H01L21/67

CPC classification number: G01N21/9505 ,  G01B11/303 ,  H01L21/67288 ,  G01N2201/06113 ,  G01N2201/066 ,  G01N2201/10

Abstract: Wafer inspection apparatuses and methods are described. The wafer inspection apparatus includes an optical module, at least one wafer holder for carrying a plurality of wafers, and a plurality of optical sensors. The optical module is configured to emit a plurality of light beams for simultaneously scanning the plurality of wafers carried by the at least one wafer holder. The plurality of optical sensors is configured to receive the light beams reflected by the plurality of wafers.

公开(公告)号：US20180275055A1

公开(公告)日：2018-09-27

申请号：US15992182

申请日：2018-05-30

Applicant: SHENZHEN UNIVERSITY

Inventor： Yonghong SHAO

IPC: G01N21/552

CPC classification number: G01N21/554 ,  G01N21/553 ,  G01N2201/063 ,  G01N2201/10

Abstract: The present invention provides a surface plasmon resonance (SPR) detection system and method. This system utilizes a detection light path to form a detection image containing incident angle information and wavelength information. During testing, full-spectrum scan is performed first to obtain a resonance wavelength of a sample. Then, partial-spectrum scanning is performed by continuously tracking the resonance wavelength, and the number of scanning points in each scanning cycle is controlled according to specific situation to shorten the scanning time, thereby obtaining the resonance wavelength of the sample in real time. When the refractive index of the sample changes, the corresponding resonance wavelength changes as well; by obtaining the change of the resonance wavelength, variation of the reflective index of the sample is calculated, which is rapid SPR detection of wavelength modulation.

公开(公告)号：US10081376B2

公开(公告)日：2018-09-25

申请号：US14982212

申请日：2015-12-29

Applicant: Sameer Singh

Inventor： Sameer Singh

IPC: G06K9/00 ,  B61L23/04 ,  B61K9/08 ,  B61L15/00 ,  G06K9/46 ,  G06K9/62 ,  H04N5/247 ,  B61L25/02 ,  G01B11/22 ,  G01N21/88

CPC classification number: B61L23/042 ,  B61K9/08 ,  B61L15/0072 ,  B61L15/0081 ,  B61L23/04 ,  B61L23/044 ,  B61L23/045 ,  B61L23/047 ,  B61L23/048 ,  B61L25/021 ,  B61L25/023 ,  B61L25/025 ,  B61L2205/04 ,  G01B11/22 ,  G01N21/8851 ,  G01N2201/10 ,  G01N2201/12 ,  G06K9/00771 ,  G06K9/46 ,  G06K9/6202 ,  G06K9/6215 ,  G06K9/6218 ,  G06K9/628 ,  G06K2209/19 ,  H04N5/247

Abstract: The present application involves a railroad track asset surveying system comprising an image capture sensor, a location determining system, and an image processor. The image capture sensor is mounted to a railroad vehicle. The location determining system holds images captured by the image capture sensor. The image processor includes an asset classifier and an asset status analyzer. The asset classifier detects an asset in one or more captured images and classifies the detected asset by assigning an asset type to the detected asset from a predetermined list of asset types according to one or more features in the captured image. The asset status analyzer identifies an asset status characteristic and compares the identified status characteristic to a predetermined asset characteristic so as to evaluate a deviation therefrom.

公开(公告)号：US20180259453A1

公开(公告)日：2018-09-13

申请号：US15975686

申请日：2018-05-09

Applicant: Quidel Corporation

Inventor： David Dickson Booker ,  Jhobe Steadman

IPC: G01N21/64 ,  G01N21/27 ,  G01N33/543

CPC classification number: G01N21/645 ,  G01N21/274 ,  G01N21/278 ,  G01N33/54386 ,  G01N2201/062 ,  G01N2201/068 ,  G01N2201/10 ,  G01N2201/12746 ,  G01N2201/12753 ,  G01N2201/12761

Abstract: Disclosed herein is a method for improving the precision of a test result from an instrument with an optical system that detects a signal. The method comprises including in the instrument a normalization target disposed directly or indirectly in the optical path of the optical system. Also disclosed are instruments comprising a normalization target, and systems comprising such an instrument and a test device that receives a sample suspected of containing an analyte.

公开(公告)号：US20180246143A1

公开(公告)日：2018-08-30

申请号：US15965175

申请日：2018-04-27

Applicant: PRESIDENT AND FELLOWS OF HARVARD COLLEGE

Inventor： Michael S. GRINOLDS ,  Sungkun HONG ,  Patrick MALETINSKY ,  Amir YACOBY

IPC: G01Q70/14 ,  G01N21/64 ,  G01R33/60 ,  G01R33/12 ,  G01Q60/54 ,  G01Q60/38

CPC classification number: G01Q70/14 ,  G01N21/645 ,  G01N24/10 ,  G01N2201/10 ,  G01Q30/025 ,  G01Q60/08 ,  G01Q60/38 ,  G01Q60/54 ,  G01R33/022 ,  G01R33/032 ,  G01R33/1284 ,  G01R33/323 ,  G01R33/60

Abstract: A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

公开(公告)号：US20180224371A1

公开(公告)日：2018-08-09

申请号：US15948602

申请日：2018-04-09

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Gabriel P. Borges ,  Claude Falbriard ,  Grant D. Miller ,  Nader M. Nassar

IPC: G01N21/25 ,  G01N21/21 ,  G01J3/46 ,  G01N21/55 ,  G01N21/23

CPC classification number: G01N21/25 ,  G01J3/46 ,  G01J2003/466 ,  G01N21/21 ,  G01N21/23 ,  G01N21/55 ,  G01N2201/10 ,  G01N2201/12

Abstract: Polarized light characteristics are detected and mapped to an application, such as product identification. A process of reflecting a directed light emission through a polarizing filter, and sensing the processed light emission having particular characteristics is provided. The characteristics of the sensed light emission is associated with a “color code” that is cross-referenced within a database of color codes.

公开(公告)号：US20180218537A1

公开(公告)日：2018-08-02

申请号：US15935989

申请日：2018-03-26

Applicant: STATE FARM MUTUAL AUTOMOBILE INSURANCE COMPANY

Inventor： James M. Freeman ,  Roger D. Schmidgall ,  Patrick H. Boyer ,  Nicholas U. Christopulos ,  Jonathan D. Maurer ,  Nathan L. Tofte ,  Jackie O. Jordan, II

IPC: G06T17/20 ,  H04R23/00 ,  G01S17/02 ,  G06F17/50 ,  H04N13/00 ,  G06T7/00 ,  G06Q50/16 ,  G06Q40/08 ,  G01S17/89 ,  G06Q30/02 ,  G01S15/89 ,  G01S13/89

CPC classification number: G06T17/20 ,  B64C39/024 ,  G01N21/64 ,  G01N21/8851 ,  G01N22/02 ,  G01N2201/06113 ,  G01N2201/10 ,  G01S7/4817 ,  G01S13/89 ,  G01S15/89 ,  G01S17/023 ,  G01S17/89 ,  G06F17/5004 ,  G06Q30/0278 ,  G06Q30/0283 ,  G06Q40/08 ,  G06Q50/16 ,  G06Q50/163 ,  G06T1/0007 ,  G06T7/0002 ,  G06T2200/08 ,  G06T2207/10028 ,  G06T2207/10032 ,  H04N7/185 ,  H04N13/106 ,  H04N13/254 ,  H04N13/271 ,  H04N13/275 ,  H04R23/008

Abstract: In a system and method for inspecting a property, a microphone receives one or more audio waves propagating from a structure. One or more processors generate a 3D point cloud based on the received audio waves, analyzed the generated 3D point cloud to identify features of a surface or subsurface of the structure, and generate an estimate of a condition of the surface or subsurface.

公开(公告)号：US20180190170A1

公开(公告)日：2018-07-05

申请号：US15654480

申请日：2017-07-19

Applicant: LG DISPLAY CO., LTD.

Inventor： Jeong-Bok YANG

IPC: G09G3/00 ,  G09G3/3208 ,  G01R31/11 ,  G01R31/317 ,  H01L51/50

CPC classification number: G01N21/94 ,  G01B11/06 ,  G01N21/8422 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/958 ,  G01N2201/10 ,  G01R31/11 ,  G01R31/31728 ,  G09G3/006 ,  G09G3/3208 ,  G09G2330/12 ,  H01L51/0031 ,  H01L51/50 ,  H01L51/5253 ,  H01L51/56

Abstract: An inspection method includes: irradiating light through a prism to an inspection object; scanning an inspection region of the inspection object using a photographing unit; receiving, by the photographing unit, reflected light that is reflected from the inspection object; converting the reflected light received by the photographing unit into an intensity of light; and detecting a defect of the inspection object by comparing a thickness of the inspection object corresponding to the intensity of the light with a predetermined thickness of the inspection object. Therefore, the encapsulation layer is inspected before post-processes of cells or the module process, such that the yield and productivity of the OLED device can be improved.