公开(公告)号：US20150268097A1

公开(公告)日：2015-09-24

申请号：US14430658

申请日：2013-10-02

Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

Inventor： Ichiro Ishimaru

IPC: G01J3/45 ,  G01J3/02

CPC classification number: G01J3/45 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/2803 ,  G01J3/4531 ,  G01J3/4532 ,  G01N2021/3595

Abstract: A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.

Abstract translation: 光谱测量装置包括：分割光学系统，用于将位于待测物体的测量区域内的多个测量点中的每一个发射的测量光束分成第一测量光束和第二测量光束; 成像光学系统; 光路长度差提供装置; 检测器，其包括多个像素; 用于获取待测量对象的测量点的干涉图的处理器; 位于待测物体与分光光学系统之间的共轭平面成像光学系统; 以及位于共轭平面上的周期性提供装置。

公开(公告)号：US20150260573A1

公开(公告)日：2015-09-17

申请号：US14431573

申请日：2013-09-25

Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

Inventor： Ichiro Ishimaru

IPC: G01J3/26 ,  A61B5/00 ,  A61B5/1455 ,  A61B5/145 ,  G01J3/45 ,  G01J3/02

CPC classification number: G01J3/26 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/1455 ,  A61B5/7257 ,  A61B2562/0238 ,  F04C2270/0421 ,  G01J3/0205 ,  G01J3/0213 ,  G01J3/45 ,  G01J3/4532 ,  G01J3/4535 ,  G01J2003/1213 ,  G01N21/359 ,  G01N21/4738 ,  G01N21/49 ,  G01N2021/3595

Abstract: A spectroscopic measurement device includes a dark filter that is arranged on an optical path between an imaging optical system and a light detection unit and includes a plurality of regions having different transmittances, the filter being configured such that a fixed reflected measurement light and a movable reflected measurement light that are guided to a same point by the imaging optical system and form interference light are transmitted through a same region; and an arithmetic processing unit that obtains an interferogram of the measurement light at a transmittance corresponding to each of two or more regions from a detection signal of each pixel of a light detection unit when a movable reflection unit is moved, and obtains a spectrum of the measurement light based on the interferogram.

Abstract translation: 光谱测量装置包括配置在成像光学系统和光检测单元之间的光路上的暗滤波器，并且包括具有不同透射率的多个区域，所述滤光器被配置为使得固定的反射测量光和可移动的反射 通过成像光学系统被引导到同一点并形成干涉光的测量光通过相同的区域传输; 以及算术处理单元，当可移动反射单元移动时，从光检测单元的每个像素的检测信号中获得与两个或更多个区域中的每一个相对应的透射率的测量光的干涉图，并获得 基于干涉图的测量光。

公开(公告)号：US08885163B2

公开(公告)日：2014-11-11

申请号：US13147478

申请日：2009-12-23

Applicant: Marian L. Morys ,  Steve Zannoni ,  Christopher M. Jones

Inventor： Marian L. Morys ,  Steve Zannoni ,  Christopher M. Jones

IPC: G01N15/02 ,  G01B9/02 ,  G01J3/45 ,  G01J5/02 ,  G01N21/35 ,  E21B49/08 ,  G01N21/31 ,  G01N21/33

CPC classification number: G01N21/31 ,  E21B49/088 ,  G01J3/021 ,  G01J3/4532 ,  G01J3/4535 ,  G01J2003/4534 ,  G01N21/33 ,  G01N21/35 ,  G01N21/3577 ,  G01N2021/3595

Abstract: Various systems and methods for performing optical analysis downhole with an interferogram (a light beam having frequency components with a time variation that identifies those frequency components. The interferogram is produced by introducing an interferometer into the light path, with the two arms of the interferometer having a propagation time difference that varies as a function of time. Before or after the interferometer, the light encounters a material to be analyzed, such as a fluid sample from the formation, a borehole fluid sample, a core sample, or a portion of the borehole wall. The spectral characteristics of the material are imprinted on the light beam and can be readily analyzed by processing electronics that perform a Fourier Transform to obtain the spectrum or that enable a comparison with one or more templates. An interferometer designed to perform well in the hostile environments downhole is expected to enable laboratory-quality measurements.

Abstract translation: 用干涉图进行井下光学分析的各种系统和方法（具有识别那些频率分量的具有时间变化的频率分量的光束）通过将干涉仪引入光路而产生干涉图，干涉仪的两个臂具有 传播时间差随时间而变化在干涉仪之前或之后，光线遇到要分析的材料，例如来自地层的流体样品，井眼流体样品，核心样品或一部分 材料的光谱特性被印在光束上，并且可以通过进行傅里叶变换的处理电子装置容易地进行分析，以获得光谱或使得能够与一个或多个模板进行比较。 预计井下敌对环境将能够实现实验室质量测量。

公开(公告)号：US08446458B2

公开(公告)日：2013-05-21

申请号：US12744690

申请日：2008-12-01

Applicant: Hamed Hamid Muhammed

Inventor： Hamed Hamid Muhammed

IPC: G01J3/26 ,  G01J3/45 ,  G01J3/40

CPC classification number: G01J3/4532 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0256 ,  G01J3/2823 ,  G01J3/4531

Abstract: A miniaturized Holographic Fourier transform imaging spectrometer HFTIS, made from simple all-reflective components and with no moving parts, is provided. This HFTIS includes an all-reflective two beam interferometer, which provides two interfering beams; a two-dimensional detector array to detect the interference pattern created by the beams; a computing machine for correcting the distortions in the pattern and calculating the spectrum from the corrected interferogram. The same principle can be used to build spot spectrometers, line-scan imaging spectrometers (also called array spectrometers or line-scan hyperspectral cameras) as well as two-dimensional instantaneous imaging spectrometers (also called staring hyperspectral cameras). In all variants of HFTIS that can be built using this invention, the wave-signal collecting element can also be built of all-reflective components. Digital correction can be utilized to straighten the interference fringes and to compensate for the impact of used lenses and other refractive components, to produce correct spectra after Fourier Transformation.

Abstract translation: 提供了由简单的全反射组件制成并且没有移动部件的小型化全息傅里叶变换成像光谱仪HFTIS。 该HFTIS包括全反射双光束干涉仪，其提供两个干涉光束; 二维检测器阵列，用于检测波束产生的干涉图; 用于校正图案中的失真并根据校正的干涉图计算光谱的计算机。 同样的原理可用于构建点光谱仪，线扫描成像光谱仪（也称为阵列光谱仪或线扫描超光谱相机）以及二维瞬时成像光谱仪（也称为高光谱相机）。 在可以使用本发明构建的HFTIS的所有变型中，波信号收集元件也可以由全反射部件构成。 可以利用数字校正来矫正干涉条纹并补偿使用过的透镜和其它折射分量的影响，从而在傅里叶变换后产生正确的光谱。

公开(公告)号：US08351043B2

公开(公告)日：2013-01-08

申请号：US12531338

申请日：2008-03-20

Applicant: Pavel Cheben ,  Siegfried Janz ,  Miroslaw Florjanczyk ,  Dan-Xia Xu

Inventor： Pavel Cheben ,  Siegfried Janz ,  Miroslaw Florjanczyk ,  Dan-Xia Xu

IPC: G01J3/45 ,  G01B9/02

CPC classification number: G01J3/26 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/12 ,  G01J3/1895 ,  G01J3/4532 ,  G02B6/12007 ,  G02B6/12011 ,  G02B6/29301 ,  G02B6/29352 ,  G02B6/29356 ,  G02B6/4215

Abstract: A spectrometer has a multi-input aperture for admitting an input wavefront and an array of multiple waveguide structures terminating at the multi-input aperture. The input wavefront is incident on each of the waveguide structures, which provide a dispersive function for the input wavefront. Interferometers are formed by elements of the waveguide structures. The interferometers have different optical path length differences (OPDs). The interferometers provide a wavelength responsive output for spatially extended light sources. The output of the interferometers is detected with a detector array. The spectrometer has an improved etendue, and in some embodiments very high resolution.

Abstract translation: 光谱仪具有用于允许输入波前的多输入孔径和终止于多输入孔径处的多个波导结构的阵列。 输入波前入射在每个波导结构上，这为输入波前提供了色散函数。 干涉仪由波导结构的元件形成。 干涉仪具有不同的光程差（OPD）。 干涉仪为空间延伸的光源提供波长响应输出。 用检测器阵列检测干涉仪的输出。 光谱仪具有改进的光密度，并且在一些实施例中具有非常高的分辨率。

公开(公告)号：US20120281223A1

公开(公告)日：2012-11-08

申请号：US13522665

申请日：2011-01-14

Applicant: Hugh Mortimer

Inventor： Hugh Mortimer

IPC: G01B9/02 ,  G01J3/45

CPC classification number: G01J3/02 ,  G01B9/0209 ,  G01J3/0208 ,  G01J3/4531 ,  G01J3/4532

Abstract: An interferometer is disclosed, such as may be incorporated into a hand-held spectrometer. The interferometer comprises enclosed path optics and a detector, the enclosed path optics comprise at least two reflecting elements and a beamsplitter, the beamsplitter is arranged to divide an input beam into first and second beams. The enclosed path optics are arranged to direct the first and second beams in opposite directions around paths enclosing an area and to output the first and second beams towards the detector. The enclosed path optics also focus the first and second beams onto the detector. The detector is arranged to detect a pattern produced by interference of the first and second beams. In a preferred embodiment the two reflecting elements are a pair of concave mirrors, and the enclosed path optics enclose a triangular area. The use of concave mirrors for both reflection and focussing provides the interferometer with compactness.

Abstract translation: 公开了干涉仪，例如可以并入到手持式光谱仪中。 干涉仪包括封闭路径光学器件和检测器，封闭路径光学器件包括至少两个反射元件和分束器，分束器被布置成将输入光束分成第一和第二光束。 封闭路径光学器件被布置成围绕围绕一个区域的路径沿相反的方向引导第一和第二光束，并且将第一和第二光束朝向检测器输出。 封闭路径光学器件还将第一和第二光束聚焦到检测器上。 检测器被布置成检测由第一和第二光束的干涉产生的图案。 在优选实施例中，两个反射元件是一对凹面镜，并且封闭路径光学器件包围三角形区域。 使用凹面反射镜进行反射和聚焦为干涉仪提供了紧凑性。

公开(公告)号：US20120050744A1

公开(公告)日：2012-03-01

申请号：US13192577

申请日：2011-07-28

Applicant: Kazumasa TAKADA ,  Katsunari OKAMOTO

Inventor： Kazumasa TAKADA ,  Katsunari OKAMOTO

IPC: G01J3/45

CPC classification number: G01J3/4531 ,  G01J3/45 ,  G01J3/4532

Abstract: A transform spectrometer measurement apparatus and method for a planar waveguide circuit (PLC). The spectrometer typically includes an input optical signal waveguide carrying an input optical signal; a plurality of couplers, each connected to the input optical signal waveguide, and each including a coupler output for carrying a coupled optical signal related to the input optical signal; and an array of interleaved, waveguide Mach-Zehnder interferometers (MZI), each having at least one input MZI waveguide, each MZI input waveguide receiving a coupled optical signal from a respective coupler output. A phase shifting circuit is applied to at least one arm of the MZIs to induce an active phase shift on the arm to thereby measure phase error in the MZIs. Light output from the MZIs is measured under intrinsic phase error conditions and after an active phase shift by the phase shifting circuit.

Abstract translation: 一种用于平面波导电路（PLC）的变换光谱仪测量装置和方法。 光谱仪通常包括承载输入光信号的输入光信号波导; 多个耦合器，各自连接到输入光信号波导，并且每个耦合器包括耦合器输出，用于承载与输入光信号相关的耦合光信号; 以及每个具有至少一个输入MZI波导的交错的波导马赫 - 策德尔干涉仪阵列（MZI），每个MZI输入波导从相应的耦合器输出接收耦合的光信号。 移相电路施加到MZI的至少一个臂，以引起臂上的有源相移，从而测量MZI中的相位误差。 来自MZI的光输出在固有相位误差条件下测量，并在相移电路进行有源相移之后测量。

公开(公告)号：US08018597B2

公开(公告)日：2011-09-13

申请号：US12142860

申请日：2008-06-20

Applicant: Alan Douglas Scott

Inventor： Alan Douglas Scott

IPC: G01B9/02 ,  G01J3/45

CPC classification number: G01J3/4532 ,  G01J3/02 ,  G01J3/024 ,  G01J3/0259 ,  G01J3/0289 ,  G01J3/0294 ,  G01J3/1895 ,  G01J3/4531 ,  G02B6/29352 ,  G02B6/29358 ,  G02B6/29389 ,  G02B6/30 ,  G02B2006/12119 ,  G02B2006/12159

Abstract: An optical broadband micro-spectrometer containing an input optical assembly, a group of slab waveguide spatial heterodyne spectrometer (SHS) integrated circuits (ICs), a detection module and a processor for multi-line detection. The input optical assembly applies an input light signal uniformly with respect to brightness and frequency to the apertures of the waveguides and may project a pupil image onto the SHS input face and may be a scanner. Each slab waveguide spatial heterodyne spectrometer (SHS) integrated circuit (IC) contains at least one slab waveguide SHS IC. The detection module bonds directly to the slab waveguide output apertures. Each slab waveguide SHS IC may contain one or more slab waveguide SHS.

Abstract translation: 一种含有输入光学组件，一组平板波导空间外差光谱仪（SHS）集成电路（IC），检测模块和用于多线检测的处理器的光学宽带微光谱仪。 输入光学组件将输入光信号相对于亮度和频率均匀地施加到波导的孔，并且可以将瞳孔图像投影到SHS输入面上，并且可以是扫描仪。 每个平板波导空间外差谱仪（SHS）集成电路（IC）包含至少一个平板波导SHS IC。 检测模块直接连接到平板波导输出孔。 每个平板波导SHS IC可以包含一个或多个平板波导SHS。

公开(公告)号：US08004692B2

公开(公告)日：2011-08-23

申请号：US11768265

申请日：2007-06-26

Applicant: Chian Chiu Li

Inventor： Chian Chiu Li

IPC: G01B9/02

CPC classification number: G01N21/45 ,  G01B9/0201 ,  G01B9/02049 ,  G01B2290/35 ,  G01B2290/45 ,  G01J3/4532

Abstract: Disclosed are compact optical interferometer array, miniature optical interferometer array, and miniature optical interferometer. The interferometer arrays contain a spatial phase modulator array and a detector array. They are used for conducting multiple measurements. The miniature interferometer has only one component—a spatial phase modulator. Without passing through any focus lens, beam portions coming out of the modulator spread and merge together by themselves. Size of the miniature interferometer can reach subwavelength or even nanoscale. The interferometer array and miniature interferometer find applications in miniature spectrometer, color filter, display, adjustable subwavelength grating, etc.

Abstract translation: 公开了紧凑型光学干涉仪阵列，微型光学干涉仪阵列和微型光学干涉仪。 干涉仪阵列包含空间相位调制器阵列和检测器阵列。 它们用于进行多次测量。 微型干涉仪只有一个组件 - 空间相位调制器。 不通过任何聚焦透镜，从调制器出来的光束部分自身扩散并合并在一起。 微型干涉仪的尺寸可达到亚波长甚至纳米级。 干涉仪阵列和微型干涉仪可用于微型光谱仪，滤色片，显示屏，可调式亚波长光栅等。

公开(公告)号：US07652771B2

公开(公告)日：2010-01-26

申请号：US11931622

申请日：2007-10-31

Applicant: Greg C Felix

Inventor： Greg C Felix

IPC: G01B9/02

CPC classification number: G01B9/02018 ,  G01B9/02019 ,  G01B9/02059 ,  G01B2290/70 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0224 ,  G01J3/0256 ,  G01J3/4532 ,  G01J3/4535 ,  G02B27/283

Abstract: An interferometer has a first reflective surface having a nominal orientation; a second reflective surface having a nominal orientation orthogonal to the nominal orientation of the first reflective surface; a retroreflector facing the first reflective surface; a double polarizing beam splitter (DPBS) between the first reflective surface and the retroreflector; and a respective quarter-wave plate between the DPBS and each of the reflective surfaces. The DPBS has first and second beam-splitting surfaces each having a nominal orientation with respect to the first reflective surface. At least part of at least one of the first reflective surface, the second reflective surface and the beam-splitting surfaces is effectively tilted relative to the respective nominal orientation of such surface, and constitutes a respective tilted surface.

Abstract translation: 干涉仪具有具有标称取向的第一反射表面; 具有与第一反射表面的标称取向正交的标称取向的第二反射表面; 面向第一反射面的回射器; 在所述第一反射表面和所述后向反射器之间的双偏振分束器（DPBS）; 以及在DPBS和每个反射表面之间的相应四分之一波片。 DPBS具有第一和第二光束分离表面，每个具有相对于第一反射表面的标称取向。 第一反射表面，第二反射表面和分束表面中的至少一个的至少一部分相对于这种表面的相应标称取向被有效地倾斜，并且构成相应的倾斜表面。