Apparatus and method for the spectrochemical analysis of liquids using
the laser spark
    132.
    发明授权
    Apparatus and method for the spectrochemical analysis of liquids using the laser spark 失效
    使用激光火花对液体进行光谱化学分析的装置和方法

    公开(公告)号:US4925307A

    公开(公告)日:1990-05-15

    申请号:US606037

    申请日:1984-05-01

    CPC classification number: G01N21/718 G01J3/443 G01N21/63

    Abstract: A method and apparatus for the qualitative and quantitative spectroscopic investigation of elements present in a liquid sample using the laser spark. A series of temporally closely spaced spark pairs is induced in the liquid sample utilizing pulsed electromagnetic radiation from a pair of lasers. The light pulses are not significantly absorbed by the sample so that the sparks occur inside of the liquid. The emitted light from the breakdown events is spectrally and temporally resolved, and the time period between the two laser pulses in each spark pair is adjusted to maximize the signal-to-noise ratio of the emitted signals. In comparison with the single pulse technique, a substantial reduction in the limits of detectability for many elements has been demonstrated. Narrowing of spectral features results in improved discrimination against interfering species.

    Abstract translation: 一种用于使用激光火花对存在于液体样品中的元素进行定性和定量光谱研究的方法和装置。 利用来自一对激光器的脉冲电磁辐射,在液体样品中诱发了一系列时间上紧密的间隔的火花对。 光脉冲不被样品显着吸收,使得火花发生在液体内部。 来自击穿事件的发射光被光谱和时间分辨,并且调整每个火花对中的两个激光脉冲之间的时间周期以最大化发射信号的信噪比。 与单脉冲技术相比,已经证明了许多元件的可检测限度的显着降低。 光谱特征的缩小导致改善对干扰物种的歧视。

    Standardization of spectral lines
    133.
    发明授权
    Standardization of spectral lines 失效
    谱线标准化

    公开(公告)号:US4893259A

    公开(公告)日:1990-01-09

    申请号:US201510

    申请日:1988-06-02

    CPC classification number: G01J3/28 G01J2003/2866 G01J2003/2869 G01J3/443

    Abstract: A method and apparatus for standardizing spectral line intensities in a spectral monochromator separate an input beam into a sample spectral line characteristic of a sample element, a reference spectral line, a standard spectral line and a background spectral band. At a first point in time an intensity I.sub.A of the sample line, a first intensity I.sub.R1 of the reference line and a first intensity I.sub.B1 of the background band are measured. At a second point in time an intensity I.sub.S of the standard line, a second intensity I.sub.R2 of the reference line and a second intensity I.sub.B2 of the background band are measured. An intensity ratio IR defined by the formula ##EQU1## is computed wherein the intensity ratio IR represents a standardized intensity of the sample line compensated for source fluctuations.

    Systems for the direct analysis of solid samples by atomic emission
spectroscopy
    134.
    发明授权
    Systems for the direct analysis of solid samples by atomic emission spectroscopy 失效
    通过原子发射光谱直接分析固体样品的系统

    公开(公告)号:US4824249A

    公开(公告)日:1989-04-25

    申请号:US165261

    申请日:1987-12-01

    CPC classification number: G01N21/67 G01J2003/283 G01J3/443

    Abstract: An analysis system for directly analyzing solid samples by atomic emission spectroscopy wherein the system includes an atomic spectral lamp (1) of the type which enables a solid sample to be analyzed to be demountably located as a cathode of the lamp (1), means (2) for producing a primary electric discharge by cathodic sputtering from the sample via connection (8) and a secondary boosted discharge for analytical emission via connection (9), spectral wave length analysis device (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and control means (3) for controlling the system, the current level of the sample cathode and the operation of the spectral wave length analysis device (4) being controlled on the basis of output from the photomultiplier tube (7) such that the intensity of the spectral lines is maximized and the relationship between spectral line intensity and concentration of the corresponding element in the sample is maintained in a region which is substantially linear.

    Abstract translation: PCT No.PCT / AU87 / 00101 Sec。 371 1987年12月1日第 102(e)1987年12月1日PCT PCT 1987年4月15日PCT公布。 公开号WO87 / 06341 日本1987年10月22日。用于通过原子发射光谱直接分析固体样品的分析系统,其中所述系统包括能够使固体样品被分析的类型的原子光谱灯(1)可拆卸地定位为 灯(1),用于通过连接(8)从样品通过阴极溅射产生一次放电的装置(2)和经由连接(9)进行分析发射的次级升压放电,光谱波长分析装置(4)被布置 接收和确定由灯(1)发射的光谱线的强度,以及用于控制系统的控制装置(3),样品阴极的电流水平和光谱波长分析装置(4)的操作被控制 基于光电倍增管(7)的输出,使得光谱线的强度最大化,并且光谱线强度与sa中相应元素的浓度之间的关系 mple保持在基本上线性的区域中。

    Optical position-measuring sensor
    136.
    发明授权
    Optical position-measuring sensor 失效
    光学位置测量传感器

    公开(公告)号:US4714835A

    公开(公告)日:1987-12-22

    申请号:US795742

    申请日:1985-11-06

    Abstract: An optical position-measuring sensor has a monolithic structure which includes at least two masses of photoluminescent material, which on excitation emit photoluminescent light with non-identical spectra. The at least two masses are supported in the sensor by a resilient part (e.g. a beam or diaphragm), the deflection of which determines the wavelength distribution of the luminescent light which is coupled into an optical wave conductor (e.g. a light fiber) terminating in the sensor.

    Abstract translation: 光学位置测量传感器具有整体结构,其包括至少两个光致发光材料质量,其在激发时发出具有不相同光谱的光致发光。 至少两个质量块通过弹性部分(例如光束或光阑)支撑在传感器中,弹性部分(例如光束或光阑)决定耦合到终端于光波导体(例如光纤)的发光的波长分布 传感器。

    Wavelength specific detection system for measuring the partial pressure
of a gas excited by an electron beam
    137.
    发明授权
    Wavelength specific detection system for measuring the partial pressure of a gas excited by an electron beam 失效
    用于测量由电子束激发的气体的分压的波长特异性检测系统

    公开(公告)号:US4692630A

    公开(公告)日:1987-09-08

    申请号:US867093

    申请日:1986-05-27

    Applicant: Carl A. Gogol

    Inventor: Carl A. Gogol

    CPC classification number: G01N21/62 G01J3/36 G01J3/443

    Abstract: An optical partial pressure gas analyzer employs an electron beam to excite the outer electrons of gas atoms or molecules, and one or more photomultiplier tubes or other similar detectors to detect wavelengths of photons characteristic of the decay of the outer electrons of one or more species of gas molecules. The photomultiplier tubes have a viewing direction substantially at right angles to the electron beam. A Faraday trap or similar device is employed to avoid secondary electron generation. Thin-film interference filters are favorably employed to pass a specific characteristic wavelength of the desired species, and to reject other wavelengths. An electromechanical filter changer permits each photomultiplier tube to analyze two or more gasses alternately.

    Abstract translation: 光学分压气体分析仪采用电子束来激发气体原子或分子的外部电子,以及一个或多个光电倍增管或其它类似的检测器,以检测一种或多种物质的外部电子的衰变特性的光子的波长 气体分子。 光电倍增管具有基本上与电子束成直角的观察方向。 采用法拉第陷阱或类似装置避免二次电子产生。 有利地使用薄膜干涉滤光片来传递所需物质的特定波长并抑制其它波长。 机电过滤器更换器允许每个光电倍增管交替分析两个或更多个气体。

    Spectrophosphorimetry
    138.
    发明授权
    Spectrophosphorimetry 失效
    光谱法

    公开(公告)号:US4647202A

    公开(公告)日:1987-03-03

    申请号:US687915

    申请日:1984-12-31

    CPC classification number: G01J3/4406 G01N2021/641

    Abstract: A spectrophosphorimeter with a single spectrometer so as to obviate the need of a couple of spectrometers of conventional spectrophosphorimeters, wherein one spectrometer is operated as an excitation-side spectrometer only when the light is allowed to pass a light interceptor, and the other spectrometer works as a phosphorescence-side spectrometer only when the light is substantially interrupted. The single spectrometer is used on the excitation side when the light is allowed to pass and on the phosphorescence side when the light is interrupted.

    Abstract translation: 具有单个光谱仪的分光光度计,以便消除对传统分光光度计的几个光谱仪的需要,其中一个光谱仪仅在允许光通过光拦截器时作为激发侧光谱仪操作,另一个光谱仪的工作原理如 磷光侧光谱仪只有当光线基本上被中断时。 当光被中断时,当允许光通过时和在磷光侧,单个光谱仪用于激发侧。

    Spectrometer
    139.
    发明授权

    公开(公告)号:US4591267A

    公开(公告)日:1986-05-27

    申请号:US691834

    申请日:1985-01-16

    CPC classification number: G01N21/6404 G01N21/73 G01N2021/6406 G01N2021/6417

    Abstract: A fluorescence spectrometer for multielement analysis including a source for atomizing a dispersed sample along an axis and a plurality of energizers and detectors preferably arranged in pairs about the source, with each of the pairs designed for analyzing one element. Preferably, the source is an inductively coupled plasma. Means is provided for each of the pairs to view a different segment of the source along its axis, depending on the element to be analyzed. Preferably, such means includes: a source movable along its axis; fiber optics interposed between the energizers and the source and between the source and the detectors; and a movable optical element interposed between the energizers and the source and between the source and the detectors. The spectrometer further features a polychromator for use in lieu of matched optical filters in the detectors and demountable hollow cathode lamps as energizers.

    Apparatus for measuring anisotropy of light emitted from the sample
    140.
    发明授权
    Apparatus for measuring anisotropy of light emitted from the sample 失效
    用于测量从样品发射的光的各向异性的装置

    公开(公告)号:US4586820A

    公开(公告)日:1986-05-06

    申请号:US594482

    申请日:1984-03-27

    CPC classification number: G01N21/6445 G01J3/443

    Abstract: An apparatus for measuring anisotropy of light emitted from the sample, in which photodetectors are each disposed by either side of the sample and TACs are connected to the abovesaid apparatus each correspondingly to one photodetector so that a vertical polarized component and a horizontal one of light emitted from the sample can be measured at the same time for enabling analysis operation in a short period of time and measurement in high precision.

    Abstract translation: 用于测量从样品发射的光的各向异性的装置,其中光电检测器各自由样品的两侧设置,并且TAC相应于一个光电检测器连接到上述装置,使得垂直偏振分量和水平的光发射 可以同时测量样品在短时间内进行分析操作,并以高精度进行测量。

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