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公开(公告)号：US10890487B2
公开(公告)日：2021-01-12
申请号：US16075842
申请日：2017-01-26
Inventor： Dae Suk Kim
Abstract: An integrated polarization interferometer includes a polarization beam splitter for separating incident complex waves, a first mirror attached to a first surface of the polarization beam splitter, for reflecting a first polarization transmitted through the polarization beam splitter to the polarization beam splitter, and a second mirror attached to a second surface of the polarization beam splitter, for reflecting a second polarization transmitted through the polarization beam splitter to the polarization beam splitter. Accordingly, it is possible to measure dynamic spectroscopic polarization phenomenon with extremely high robustness disturbances due to an external vibration and the like by using the integrated polarization interferometer, thereby improving measurement repeatability and accuracy of measurement.
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公开(公告)号：US20200319026A1
公开(公告)日：2020-10-08
申请号：US16644077
申请日：2018-09-03
Applicant: Stichting Nederlandse Wetenschappelijk Onderzoek Instituten , Airbus Defence and Space Netherlands B.V.
Abstract: A multi-angle imager (10) comprises an imaging array (Mij) configured to receive light beams (Li) via one or more entrance pupils (A1) according to distinct fields of view (Vi) of an object (P0) along each of multiple entry angles (αi). The imaging array (Mij) comprises multiple imaging branches (M1j, M2j) configured to form respective optical paths for the light beams (L1,L2) through the imager (10) for imaging respective subsections (S1,S2) of the object (P0). Each imaging branch (M1j) comprises a distinct set of optical elements (M11,M21) configured to receive the respective light beam (L1) along the respective entry angle (α1) and redirect the respective light beam (L1) towards the imaging plane (P1). The light beams (L 1,L2) from each of the multiple imaging branches (M1j ,M2j) are redirected to travel in a common direction (y) between the imaging array (Mij) and the imaging plane (P1).
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公开(公告)号：US20200300703A1
公开(公告)日：2020-09-24
申请号：US16763424
申请日：2018-10-17
Applicant: KYOTO UNIVERSITY
Inventor： Takeshi HASEGAWA , Nobutaka SHIOYA
Abstract: A spectral analysis device includes a light source, a support body, a linear polarization filter, a detection unit, a regression computation unit, and an absorbance spectrum calculation unit. The support body is fixed such that an incident angle of the light is a predetermined incident angle θ. The linear polarization filter is configured such that lights with polarization angles ϕn ranging from 0° to 90° are irradiated to the support body. The detection unit detects a transmitted spectrum S from transmitted lights with the polarization angles ϕn. The regression computation unit obtains an in-plane spectrum sip and an out-of-plane spectrum sop through regression analysis by using the transmitted spectrum S and a mixing ratio R. The absorbance spectrum calculation unit calculates an in-plane absorbance spectrum Aip and an out-of-plane absorbance spectrum Aop of the thin film based on the in-plane spectrum and the out-of-plane spectrum.
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公开(公告)号：US10760970B2
公开(公告)日：2020-09-01
申请号：US16233036
申请日：2018-12-26
Applicant: Purdue Research Foundation
Inventor： Amr Mohammad E Shaltout , Alexander Kildishev , Vladimir Shalaev , Jingjing Liu
Abstract: A circular dichroism spectrometer which comprises a metasurface. The metasurface has a plurality of anisotropic antennas configured to simultaneously spatially separate LCP and RCP spectral components from an incoming light beam. An optical detector array is included which detects the LCP and RCP spectral components. A transparent medium is situated between the metasurface and the optical detector array.
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公开(公告)号：US20200049557A1
公开(公告)日：2020-02-13
申请号：US16536709
申请日：2019-08-09
Inventor： Daesuk KIM
Abstract: The present inventive concepts relate to an inspection apparatus that snapshots an interference image pattern having a high spatial carrier frequency produced from a one-piece off-axis polarimetric interferometer and that precisely and promptly measures a Stokes vector including spatial polarimetric information. The inspection apparatus dynamically measure in real-time a two-dimensional polarization information without employing a two-dimensional scanner.
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Patent Agency Ranking
公开(公告)号：US10386236B2
公开(公告)日：2019-08-20
申请号：US15597544
申请日：2017-05-17
Inventor： Hiroki Hayashi , Ichiro Ishimaru
Abstract: Reflected light detecting device and method with surface reflected light components collectively be extracted/removed when detecting reflected light arising in casting light onto target-object range having non-planar surface. The device includes: a first illuminating device causing first-measurement light in predetermined polarization direction to enter target-object first region from first direction; polarization optical system position part of first-surface reflected light enters the polarization optical system, the first-surface reflected light being the first-measurement in the first region surface; a second illuminating device causing second-measurement light in the same first-measurement light polarization direction to enter second region from second direction, the second region being on the target-object surface, different from the first region; adjusting direction of the second-measurement light optical axis so part of second-surface reflected light enters the polarization optical system, the second-surface reflected light being the second-measurement in second region surface; and detecting light having passed through the polarization optical system.
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公开(公告)号：US10341576B2
公开(公告)日：2019-07-02
申请号：US15395803
申请日：2016-12-30
Applicant: X Development LLC
Inventor： Martin Friedrich Schubert , Michael Jason Grundmann
IPC: G01J3/02 , H04N5/238 , G01J3/28 , G01J3/447 , H01L27/146 , H04N5/235 , H04N5/225 , H04N9/04 , G01J3/51
Abstract: A device includes a first multi-element image sensor; a second multi-element image sensor; and a polarizing layer positioned between the first and second multi-element image sensors. A portion of light having a first polarization state incident on the device along a first direction is transmitted through the first image sensor, is transmitted through the polarizing layer, and is detected by the second image sensor, and light having a second polarization state orthogonal to the first polarization state incident on the device along the first direction is transmitted through the first image sensor, is blocked by the polarizing layer.
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公开(公告)号：US10330462B2
公开(公告)日：2019-06-25
申请号：US16013664
申请日：2018-06-20
Applicant: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
Inventor： Yoel Arieli , Yoel Cohen
Abstract: Apparatus and methods are described including a line spectrometer that receives a point of light. The line spectrometer includes a first optical element, and a second optical element configured to convert the point of light to a line of light and to direct the line of light toward the first optical element. The first optical element defines first and second surfaces, a distance between the first and second surface varying as a function of distance along the first optical element, the first optical element thereby being configured to generate first and second reflected lines of light that reflect respectively from the first and second surfaces. A detector array receives the first and second lines of light, and generates an interferogram in response thereto. A computer processor determines a spectrum of the point of light, by analyzing the interferogram. Other applications are also described.
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公开(公告)号：US20190128741A1
公开(公告)日：2019-05-02
申请号：US16088875
申请日：2017-03-15
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Koji TAKAHASHI , Haruyasu ITO , Koyo WATANABE
CPC classification number: G01J11/00 , G01J3/0297 , G01J3/28 , G01J3/447 , G02F1/01 , G02F1/13 , G02F1/137
Abstract: In a waveform measurement method, first, initial pulsed light is spatially dispersed for respective wavelengths. Next, the initial pulsed light is input to a polarization dependent type SLM in a state where a polarization plane is inclined with respect to a modulation axis direction, and a phase spectrum of a first polarization component of the initial pulsed light along the modulation axis direction is modulated, to cause a time difference between first pulsed light Lp1 including the first polarization component and second pulsed light Lp2 including a second polarization component orthogonal to the first polarization component. After combining the wavelength components, an object is irradiated with the pulsed light Lp1 and the pulsed light Lp2, and light generated in the object is detected. The above detection operation is performed while changing the time difference, and a temporal waveform of the pulsed light Lp1 is obtained.
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公开(公告)号：US10168210B2
公开(公告)日：2019-01-01
申请号：US15554326
申请日：2015-09-25
Inventor： Lifu Zhang , Hongming Zhang
Abstract: Disclosed are a snapshot-type polarized hyperspectral camera and an imaging method. The camera comprises polarizers (11), an image sensor (12), and a spectra filter (13). The spectra filter (13) is located on the image sensor (12). The polarizers (11) are located on one side of the image sensor (12). The method comprises: shielding and transmitting incident light by means of polarizers (11), so as to obtain light signals (101) with different polarizing angles; receiving, by means of an image sensor (12), the light signals with different polarizing angles, which are obtained by the polarizers (11), and converting the light signals with different polarizing angles into electric signals (102); and receiving, by means of a spectra filter (13), the electric signals converted by the image sensor (12), and filtering the electric signals, so as to obtain high-frequency electric signals (103) with a preset wavelength. By integrating a spectra filter (13) on a tiled pixel array of a sensor, a rapidly changing scene can be imaged; and meanwhile, by sticking a plurality of polarizers (11) into each channel with a specific wavelength, more exquisite imaging is realized.
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