Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis
    141.
    发明授权
    Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis 有权
    在具有测量轴的单个检查站处光学检查制造部件的端部的方法和系统

    公开(公告)号:US09372160B2

    公开(公告)日:2016-06-21

    申请号:US14876192

    申请日:2015-10-06

    Abstract: A method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis are provided. The system includes a fixture assembly having a rotatable first fixturing component and a rotatable second fixturing component mating with and removably connected to the first fixturing component to transmit torque from the first fixturing component to the second fixturing component. The second fixturing component has a device for holding the part in a generally horizontal orientation and permit rotation of the horizontally held part between first and second angular positions about the measurement axis. The system also includes an actuator assembly, an illumination device, a lens and detector assembly and at least one processor to process electrical signals generated by the lens and detector assembly to determine at least one geometric dimension or any visual defects at the ends of the part.

    Abstract translation: 提供了一种用于在具有测量轴的单个检查站上光学地检查制造部件的端部的方法和系统。 该系统包括具有可旋转的第一夹紧部件和可旋转的第二夹紧部件的夹具组件,该可旋转的第二夹紧部件配合并可拆卸地连接到第一夹持部件,以将力矩从第一夹持部件传递到第二夹持部件。 第二固定部件具有用于将部件保持在大致水平取向并允许水平保持部分围绕测量轴线在第一和第二角度位置之间旋转的装置。 该系统还包括致动器组件,照明装置,透镜和检测器组件以及至少一个处理器,用于处理由透镜和检测器组件产生的电信号,以确定部件端部处的至少一个几何尺寸或任何视觉缺陷 。

    Method and system for imaging a target
    142.
    发明授权
    Method and system for imaging a target 有权
    用于成像目标的方法和系统

    公开(公告)号:US09322776B2

    公开(公告)日:2016-04-26

    申请号:US14463004

    申请日:2014-08-19

    Abstract: A system for characterizing a bi-directional reflectance distribution function scattered light pattern of a portion of a sample is disclosed. The system can comprise a hemispherical member comprising an reflective inner surface; an entrance port operable to receive electromagnetic radiation from an electromagnetic radiation source; a first reflective optical element operable to receive at least a portion of the electromagnetic radiation and to direct the at least the portion of the electromagnetic radiation onto the portion of the sample to be characterized; a wide-angle lens operable receive the electromagnetic radiation that was specularly reflected and diffusely scattered from the portion of the sample onto the inner surface of the hemispherical member; and an imaging device operable to record intensity information imaged by the wide-angle lens to characterize the bi-directional reflectance distribution function scattered light pattern of the portion of the sample.

    Abstract translation: 公开了一种用于表征样品的一部分的双向反射分布函数散射光图案的系统。 该系统可以包括半球形构件,其包括反射内表面; 入口端口,其可操作以从电磁辐射源接收电磁辐射; 第一反射光学元件,其可操作以接收所述电磁辐射的至少一部分并且将所述电磁辐射的至少一部分引导到要表征的所述样品的所述部分上; 广角镜可操作地接收从样品部分镜面反射和漫射散射到半球形构件的内表面上的电磁辐射; 以及成像装置,其可操作以记录由广角镜头成像的强度信息,以表征样品部分的双向反射分布函数散射光图案。

    DEVICE AND METHOD FOR EXAMINING SAMPLES IN A LIQUID
    143.
    发明申请
    DEVICE AND METHOD FOR EXAMINING SAMPLES IN A LIQUID 审中-公开
    用于在液体中检验样品的装置和方法

    公开(公告)号:US20160109357A1

    公开(公告)日:2016-04-21

    申请号:US14895107

    申请日:2014-06-03

    Abstract: The invention relates to a device for examining samples (1) in a liquid (5), comprising a movable shaft (2), to which the sample (1) is fastened, and a cuvette (4), wherein the device further comprises a bath (3), which surrounds the movable shaft (2), and wherein the bath (3) is fillable with the liquid (5), the movable shaft (2) is configured to receive the sample (1) at the upper side (24) thereof, the movable shaft (2) reaches into the cuvette (4) from below, wherein said cuvette is open at least toward the bottom and configured to be immersed into the liquid (5) in the bath (3) with the underside thereof, and, moreover, means are provided to generate a pressure difference between the interior of the cuvette (4) and the region outside of the cuvette (4) such that the fill level (21) of the liquid (5) in the cuvette (4) is adjustable.Moreover, the invention relates to a method for examining samples (1) in a liquid (5).

    Abstract translation: 本发明涉及一种用于检查液体(5)中的样品(1)的装置,包括一个可移动的轴(2),样品(1)被固定到该容器上,以及一个试管(4),其中该装置还包括一个 (3),其包围所述可移动轴(2),并且其中所述浴(3)可以被所述液体(5)填充,所述可移动轴(2)构造成在所述上侧接纳所述样品(1) 24),可动轴(2)从下方到达比丘杯(4),其中所述比色杯至少朝向底部打开,并被构造成浸入浴槽(3)中的液体(5)中,底面 并且还提供了用于在反应杯(4)的内部和比色皿(4)外部的区域之间产生压力差的装置,使得比色皿中的液体(5)的填充液位(21) (4)可调。 此外,本发明涉及一种用于检查液体(5)中的样品(1)的方法。

    INSPECTION SYSTEM
    144.
    发明申请
    INSPECTION SYSTEM 审中-公开

    公开(公告)号:US20160107198A1

    公开(公告)日:2016-04-21

    申请号:US14970961

    申请日:2015-12-16

    Abstract: An inspection system is configured for use with a conveyer apparatus including carrier bars. Each carrier bar conveys pellet-shaped articles along a predetermined path. The inspection system includes at least one camera unit for sensing a predetermined characteristic of the pellet-shaped articles, a removal unit, and a controller. The removal unit, downstream from the at least one camera unit, removes selected pellet-shaped article(s) from the carrier bar(s) depending on whether the characteristic is sensed by the at least one camera unit. The controller is in communication with the at least one camera unit and the removal unit. The controller provides a signal to the removal unit in accordance with the sensed characteristic. The removal unit includes a rotatable ejection drum having extended vacuum nozzles along its length, equal to the number of articles conveyed in each carrier bar. Each vacuum nozzle selectively removes article(s) from the carrier bar(s) by suction.

    SERS STRUCTURES WITH NANOPOROUS MATERIALS
    147.
    发明申请
    SERS STRUCTURES WITH NANOPOROUS MATERIALS 有权
    SERS结构与纳米材料

    公开(公告)号:US20150316465A1

    公开(公告)日:2015-11-05

    申请号:US14377708

    申请日:2012-02-28

    CPC classification number: G01N21/01 G01N21/658 G01N2201/02 G01N2201/068

    Abstract: The present disclosure describes a surface enhanced Raman spectroscopy (SERS) apparatus and methods of forming and using the SERS apparatus. An example of a SERS apparatus includes a nanoporous material on an upper surface of a substrate, a plurality of SERS-active structures on an upper surface of the nanoporous material, and a Raman-active material on a surface of each of SERS-active structures.

    Abstract translation: 本公开描述了表面增强拉曼光谱(SERS)装置以及形成和使用SERS装置的方法。 SERS装置的实例包括在基底的上表面上的纳米多孔材料,在纳米多孔材料的上表面上的多个SERS-活性结构,以及每个SERS活性结构的表面上的拉曼活性物质 。

    METHOD FOR FABRICATING MICROSTRUCTURE TO GENERATE SURFACE PLASMON WAVES

    公开(公告)号:US20150228863A1

    公开(公告)日:2015-08-13

    申请号:US14694553

    申请日:2015-04-23

    Abstract: A method for fabricating a microstructure to generate surface plasmon waves comprises steps of: preparing a substrate, and using a carrier material to carry a plurality of metallic nanoparticles and letting the metallic nanoparticles undertake self-assembly to form a microstructure on the substrate, wherein the metallic nanoparticles are separated from each other or partially agglomerated to allow the microstructure to be formed with a discontinuous surface. The present invention fabricates the microstructure having the discontinuous surface by a self-assembly method to generate the surface plasmon waves, thus exempts from using the expensive chemical vapor deposition (CVD) technology and is able to reduce the time and cost of fabrication. The present invention also breaks the structural limitation on generation of surface plasmon waves to enhance the effect of generating the surface plasmon waves.

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