Abstract:
An apparatus includes (i) a bright light source for providing an illumination beam at multiple wavelengths selectable with a range from a deep ultraviolet wavelength to an infrared wavelength, (ii) illumination optics for directing the illumination beam towards a sample at selectable sets of angles of incidence (AOI's) or azimuth angles (AZ's) and polarization states to provide spectroscopic ellipsometry, wherein the illumination optics include an apodizer for controlling a spot size of the illumination beam on the sample at each of the selectable AOI/AZ sets, (iii) collection optics for directing an output beam from the sample in response to the illumination beam at each of the selectable AOI/AZ sets and polarization states towards a detector that generates an output signal or image based on the output beam, and (v) a controller for characterizing a feature of the sample based on the output signal or image.
Abstract:
A gas measurement module (16) for use with an airway adapter (22) is configured such that both an emitter (48) and a detector (52, 54) are disposed on the same side of a sampling chamber (46) formed within the airway adapter. Optical elements (56) that guide electromagnetic radiation from the emitter back and forth across the sampling chamber to the detector include at least one toric element. The at least one toric element compensates for a tilted folding mirror positioned on a side of the sampling chamber opposite from the emitter and the detector.
Abstract:
A closed path infrared sensor includes an enclosure, a first energy source within the enclosure, at least a second energy source within the enclosure, at least one detector system within the enclosure and a mirror system external to the enclosure and spaced from the enclosure. The mirror system reflects energy from the first energy source to the at least one detector system via a first analytical path and reflects energy from the second energy source to the at least one detector system via a second analytical path. Each of the first analytical path and the second analytical path are less than two feet in length.
Abstract:
Electronic field effect devices, and methods of manufacture of these electronic field effect devices are disclosed. In particular, there is disclosed an electronic field effect device which has improved electrical properties due to the formation of a highly mobile two-dimensional charge-carrier gas in a simple structure formed from diamond in combination with polar materials.
Abstract:
An illumination device for visual inspection includes: a transmissive reflector plate that is formed of a light transmitting material, has an opening in a center, assumes a dome shape, a radius of which is gradually expanded downward with a center axis of the opening set as a center, and has a lower surface formed of a reflecting surface on which fine unevenness for diffusing and reflecting light from below is formed and an upper surface located on an opposite side of the lower surface; first, second, and third light source units that irradiate light on an inspection object, the first, second, and third light source units being provided on the upper surface of the transmissive reflector plate and arranged in a place below the opening and passing the center axis; and a fourth light source unit that irradiates light on the inspection object and being provided below the transmissive reflector plate.
Abstract:
Control of the angle-of-incidence of a beam of electromagnetic radiation provided by a horizontally oriented arc-lamp in ellipsometer, polarimeter, spectrophotometer, reflectometer, Mueller matrix measuring, or the like systems.
Abstract:
An opto-mechanical switch produces different optical paths from two optical path sections out of a plurality of optical path sections that are oriented in different spatial directions. The switch has an optical component on which one end of each optical path section impinges, and which is adapted to be moved linearly in a direction of movement at right angles to the optical path sections between different switching positions, in which it selectively couples different optical path sections optically with each other. Further provided is a measuring system for the analysis of fluids, having such an opto-mechanical switch.
Abstract:
An interferometric system having an illumination arm, including a light source and an illuminating optical system, for forming an illuminating beam; an object arm, including a reference element for measuring an object having an object surface to be measured, for forming an image-rays path, the object to be measured having an object surface inaccessible to direct illumination; a reference arm including a reference element; a detector arm including a detector; and a beam splitter, the reference element having one or more mirrored zones. Consequently, component parts which have undercut surfaces in the illumination direction can be measured in a single measuring operation.
Abstract:
In apparatus for the production and detection of fluorescence at a sample surface, the height of the apparatus above the sample surface is reduced, and loss of the emitted fluorescence due to reflection loss and light scattering is minimized. The apparatus comprises a three-dimensionally curved light reflecting surface (40) that directs light from a light source (32) transversely to its original path and focuses the light on to an illumination zone (30) at or below the sample surface. The reflecting surface (40) also collects, directs and at least partially collimates emitted fluorescence transversely to its original path and towards a detector (46).
Abstract:
In apparatus for the production and detection of fluorescence at a sample surface, the height of the apparatus above the sample surface is reduced, and loss of the emitted fluorescence due to reflection loss and light scattering is minimized. The apparatus comprises a three-dimensionally curved light reflecting surface (40) that directs light from a light source (32) transversely to its original path and focuses the light on to an illumination zone (30) at or below the sample surface. The reflecting surface (40) also collects, directs and at least partially collimates emitted fluorescence transversely to its original path and towards a detector (46).