HYPERSPECTRAL IMAGING OF MOVING MICROSCOPIC SAMPLE ELEMENTS

    公开(公告)号:US20250060252A1

    公开(公告)日:2025-02-20

    申请号:US18712579

    申请日:2022-11-21

    Applicant: CYTOVIVA, INC.

    Abstract: Various examples are provided related to hyperspectral imaging of moving microscopic sample elements. In one example, a method for hyperspectral imaging includes acquiring a series of optical images and corresponding hyperspectral data of a sample; compiling a movie comprising a series of frames each including one of the series of optical images and a slit line indicating a location of a slit for acquisition of the hyperspectral data; identifying a frame comprising an element of the sample located on the slit line; and analyzing the hyperspectral data corresponding to the optical image in the identified frame. Each optical image and its corresponding hyperspectral data are acquired simultaneously and identified by a time stamp or sequence number. The analysis can generate hyperspectral information about the element. In another example, a system for hyperspectral imaging includes a hyperspectral imaging device; an optical imaging device; and a computing device.

    Optical spectrometer with high-efficiency optical coupling

    公开(公告)号:US12019272B2

    公开(公告)日:2024-06-25

    申请号:US17713770

    申请日:2022-04-05

    CPC classification number: G02B6/14 G01J3/04 G01J3/4412

    Abstract: One embodiment provides an optical spectrometer. The optical spectrometer can include a lens-and-filter system configured to collect light scattered from a sample, a spot converter configured to convert a substantially circular beam outputted from the lens-and-filter system into a substantially rectangular beam, and a slit comprising a rectangular aperture to allow a predetermined portion of the substantially rectangular beam to enter the rectangular aperture while blocking noise. The slit can further include at least one microelectromechanical systems (MEMS)-based movable structure configured to adjust a width of the rectangular aperture.

    Curved-slit imaging spectrometer
    155.
    发明授权

    公开(公告)号:US11959804B2

    公开(公告)日:2024-04-16

    申请号:US17636844

    申请日:2020-12-09

    CPC classification number: G01J3/2823 G01J3/021 G01J3/0218 G01J3/04

    Abstract: The invention provides a curved-slit imaging spectrometer, wherein a fiber bundle transfers a straight line image of a front objective lens to a curved slit, and the front objective lens doesn't need to have a curved image plane to directly abut the spectrometer, so that the system is less complicated, and the front objective lens and spectrometer have a simple structure. The arc-shaped or approximately arc-shaped curved slit matches the optimum imaging circle of the Offner-type spectrometer, thereby achieving an extra-long slit. The arced slit is 5 to 10 times longer than the straight slit of the classical Offner-type spectrometer. In the case of a compact size, the length of the slit can be greater than 100 mm. Also, the same spectral response function applies in different fields of view while presenting desirable imaging quality.

    Freeform offner spectrometer
    156.
    发明授权

    公开(公告)号:US11898907B1

    公开(公告)日:2024-02-13

    申请号:US17948153

    申请日:2022-09-19

    CPC classification number: G01J3/0208 G01J3/04 G01J3/18 G01J3/2823

    Abstract: A spectrometer is configured to form a spectrally resolved image of electromagnetic radiation from an electromagnetic radiation source. The spectrometer can include an optical guide device configured to guide electromagnetic radiation along an optical path. The optical guide device can include a first prism positioned in the optical path. The optical guide device can further include a focusing optic. The first prism can include at least one freeform prism surface that comprises at least some degree of cylindrical curvature having freeform polynomial terms formed thereon, which surface can be a substantially cylindrical, a substantially acylindrical, or a substantially flat surface having freeform polynomial terms formed thereon.

    SPECTROMETER HAVING A SUPPORT PLATE AND HAVING A HOUSING

    公开(公告)号:US20230273068A1

    公开(公告)日:2023-08-31

    申请号:US18016084

    申请日:2021-07-05

    CPC classification number: G01J3/28 G01J3/18 G01J3/0291 G01J3/04 G01J3/0202

    Abstract: The present invention relates to a spectrometer for spectral analysis of electromagnetic radiation. The spectrometer comprises an entry slit for entry of the electromagnetic radiation to be analysed and an imaging grating for diffraction of the electromagnetic radiation which has entered. The spectrometer additionally comprises a detector extending at least in one direction to detect the diffracted electromagnetic radiation, and also a support plate in which the entry slit is located. The spectrometer further comprises a housing which is mounted on the support plate, covers the detector and the entry slit and supports the imaging grating. According to the invention the spectrometer further comprises at least three floating bearings for floating mounting of the housing on the support plate, the floating bearings each enabling a displacement between the housing and the support plate on a directional axis and being distributed about a central axis of the housing.

    Coma-elimination broadband high-resolution spectrograph

    公开(公告)号:US11293803B2

    公开(公告)日:2022-04-05

    申请号:US16932870

    申请日:2020-07-20

    Abstract: The present invention discloses a coma-elimination broadband high-resolution spectrograph, comprising incident slits, a collimating mirror, an integrated grating, a two-dimensional focus imaging mirror and a two-dimensional area array detector, wherein the incident slits enters along the incident slits, passes through a light through hole in the center of the integrated grating and is incident to the collimating mirror, the incident light enters the integrated grating along a coaxial optical path L1 after collimation of the collimating mirror and is focused by the two-dimensional focus imaging mirror after diffraction of each sub-grating, diffraction light in full spectrum region enters a focal plane of the two-dimensional area array detector for detection along an coaxial optical path L2, and off-axis angles of the L1 and the L2 are zero.

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