Hand-held probe for intra-operative detection of fluorescence labeled compounds and antibodies
    181.
    发明授权
    Hand-held probe for intra-operative detection of fluorescence labeled compounds and antibodies 失效
    用于术中检测荧光标记化合物和抗体的手持式探针

    公开(公告)号:US08227766B2

    公开(公告)日:2012-07-24

    申请号:US12464855

    申请日:2009-05-12

    Inventor: Gregg J. Chapman

    Abstract: A hand-held probe for intra-operative detection of fluorescence labeled compounds includes a housing comprising a handle and a columnar portion, and a power source within the housing. A light emission source proximate the columnar portion of the housing is configured to fluoresce at least one of predetermined compounds and predetermined antibodies. An excitation switch proximate the handle selectably activates the light emission source. A detector receives fluorescent light emissions directed toward the columnar portion from at least one of the compounds and antibodies and convert the fluorescent light emissions to a corresponding emission electrical signal. A controller within the housing receives the emission electrical signal from the detector and converts the emission electrical signal to a corresponding data signal. Finally, a data port within the housing receives the data signal from the controller, converts the data signal to a corresponding output signal, and transmits the output signal.

    Abstract translation: 用于手术中检测荧光标记化合物的手持探针包括壳体,其包括手柄和柱状部分,以及壳体内的动力源。 靠近壳体的柱状部分的发光源被配置为使预定化合物和预定抗体中的至少一种发荧光。 靠近手柄的激励开关可选择地激活发光源。 检测器从至少一种化合物和抗体接收朝向柱状部分的荧光发射,并将荧光发射转换成相应的发射电信号。 壳体内的控制器接收来自检测器的发射电信号,并将发射电信号转换成相应的数据信号。 最后,外壳内的数据端口接收来自控制器的数据信号,将数据信号转换为相应的输出信号,并发送输出信号。

    INTEGRATED OPTICAL DEVICE INCLUDING SUBSTRATES STACKED ALONG AN OPTICAL AXIS THEREOF
    182.
    发明申请
    INTEGRATED OPTICAL DEVICE INCLUDING SUBSTRATES STACKED ALONG AN OPTICAL AXIS THEREOF 审中-公开
    一体化光学器件,包括堆叠在其光轴上的衬底

    公开(公告)号:US20120155798A1

    公开(公告)日:2012-06-21

    申请号:US13285706

    申请日:2011-10-31

    Abstract: An optical device includes a first substrate having a first top surface and a first bottom surface, a second substrate having a second top surface and a second bottom surface, and a spacer substrate between substantially planar portions of the second top surface and the first bottom surface. The spacer, first, and second substrates seal an interior space between the second top surface of the second substrate and the first bottom surface of the first substrate. At least two of the first, second, and spacer substrates are aligned and secured on a wafer level. An optoelectronic element is within the interior space. An optical axis of the optical device extends through one of the first top and bottom surfaces and the second top and bottom surfaces. An electrical interconnection extends from the optoelectronic element to outside the interior space.

    Abstract translation: 光学装置包括具有第一顶表面和第一底表面的第一基底,具有第二顶表面和第二底表面的第二基底,以及在第二顶表面和第一底表面的基本平坦部分之间的间隔基底 。 间隔件,第一和第二基板密封第二基板的第二顶表面和第一基板的第一底表面之间的内部空间。 第一,第二和间隔基板中的至少两个对准并固定在晶片级上。 光电元件位于内部空间内。 光学装置的光轴延伸穿过第一顶表面和底表面中的一个以及第二顶表面和底表面。 电互连从光电元件延伸到内部空间的外部。

    Ultraviolet intensity detecting method, fabricating display apparatus method and display apparatus using the same
    183.
    发明授权
    Ultraviolet intensity detecting method, fabricating display apparatus method and display apparatus using the same 有权
    紫外线强度检测方法,制造显示装置方法和使用该方法的显示装置

    公开(公告)号:US08188441B2

    公开(公告)日:2012-05-29

    申请号:US12395717

    申请日:2009-03-02

    Abstract: A display apparatus is provided. The display apparatus is used for detecting an ultraviolet (UV) intensity. The display apparatus includes a lower-substrate, an upper-substrate and a processing unit. The lower-substrate includes a first, a second and a third photo sensors for detecting an intensity of the light in a first, a second and a third bands and converting the intensity of the light in the first, the second and the third bands into a first, a second and a third currents respectively, wherein the ranges of the second and the third bands are comprised within the range of the first band. The upper-substrate is disposed opposite to the lower-substrate. The processing unit is coupled to the first, the second and the third photo sensors, for receiving and processing the first, the second and the third currents so as to obtain the UV intensity.

    Abstract translation: 提供一种显示装置。 显示装置用于检测紫外线(UV)强度。 显示装置包括下基板,上基板和处理单元。 下基板包括用于检测第一,第二和第三带中的光的强度的第一,第二和第三光传感器,并将第一,第二和第三带中的光的强度转换成 分别为第一,第二和第三电流,其中第二和第三频带的范围包括在第一频带的范围内。 上基板设置成与下基板相对。 处理单元耦合到第一,第二和第三光传感器,用于接收和处理第一,第二和第三电流,以获得UV强度。

    System and/or method for reading, measuring and/or controlling intensity of light emitted from an LED
    185.
    发明授权
    System and/or method for reading, measuring and/or controlling intensity of light emitted from an LED 有权
    用于读取,测量和/或控制从LED发射的光的强度的系统和/或方法

    公开(公告)号:US08115185B2

    公开(公告)日:2012-02-14

    申请号:US13065483

    申请日:2011-03-22

    Abstract: A system and/or a method reads, measures and/or controls intensity of light emitted from a light-emitting diode (LED). The system and/or the method have a light intensity detector adjacent to the LED for reading and/or measuring the intensity of light emitted from the LED. The system and/or the method have a control circuit that may be electrically connected to both the detector and/or the LED for measuring and/or for controlling an intensity of light emitted from the LED. A housing surrounds the light detector and/or the LED. The housing has a pathway that allows only light emitted from the LED to reach the light detector. The LED has a finish and/or a coating that eliminates and/or retards absorption of light by internal components of the LED. The finish and/or the coating eliminates and/or retards reflection of the light by the LED.

    Abstract translation: 系统和/或方法读取,测量和/或控制从发光二极管(LED)发射的光的强度。 系统和/或方法具有与LED相邻的光强度检测器,用于读取和/或测量从LED发射的光的强度。 系统和/或方法具有可以电连接到检测器和/或LED的控制电路,用于测量和/或控制从LED发射的光的强度。 壳体围绕光检测器和/或LED。 壳体具有仅允许从LED发射的光到达光检测器的路径。 LED具有消除和/或延迟LED内部组件吸收光的光洁度和/或涂层。 光洁度和/或涂层消除和/或延迟LED的反射。

    Machine and method for measuring a characteristic of an optical signal
    186.
    发明授权
    Machine and method for measuring a characteristic of an optical signal 有权
    用于测量光信号特性的机器和方法

    公开(公告)号:US08072587B2

    公开(公告)日:2011-12-06

    申请号:US11621036

    申请日:2007-01-08

    Abstract: A machine and methods measure a characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the characteristic based on a relationship between the output signal and the computationally determined response. Another method observes an output signal from an optical detector detecting one or more optical signals, accesses a characteristic curve of detector response, compares the observed output signal to the characteristic curve, and calculates at least one characteristic of one or more optical signals based on a relationship of the observed output signal and the characteristic curve.

    Abstract translation: 机器和方法测量入射在特征为一个或多个动态响应参数的检测器上的光信号的特性。 一种方法从检测器接收输出信号,并将该输出信号和检测器的计算确定响应与入射到检测器上的已知光信号进行比较。 所述响应基于所述一个或多个动态参数。 该方法基于输出信号和计算确定的响应之间的关系确定特性。 另一种方法观察来自检测一个或多个光信号的光检测器的输出信号,访问检测器响应的特性曲线,将观察到的输出信号与特性曲线进行比较,并且基于一个或多个光信号来计算至少一个特性 观测输出信号与特性曲线的关系。

    Motion detection system and method
    188.
    发明授权
    Motion detection system and method 有权
    运动检测系统及方法

    公开(公告)号:US08039799B2

    公开(公告)日:2011-10-18

    申请号:US12118261

    申请日:2008-05-09

    Abstract: A system and method for detecting the presence of a moving object within a detection zone is provided. The system includes a first sensor responsive to light in a first range of wavelengths in the detection zone, a second sensor responsive to light in a second range of wavelengths in the detection zone, wherein the second range of wavelengths is different from the first range of wavelengths, and a processing component for generating a variable threshold value for the first sensor based upon at least maximum and minimum output signals from the second sensor within a predetermined period of time, and for comparing the first output signal with the variable threshold value. The processing component generates an activating signal if the first output signal exceeds the threshold value.

    Abstract translation: 提供了一种用于检测检测区域内的移动物体的存在的系统和方法。 该系统包括响应于检测区域中的第一波长范围内的光的第一传感器,响应于检测区域中的第二波长范围内的光的第二传感器,其中第二波长范围不同于第一范围 以及用于在预定时间段内基于来自第二传感器的至少最大和最小输出信号产生用于第一传感器的可变阈值的处理部件,以及用于将第一输出信号与可变阈值进行比较。 如果第一输出信号超过阈值,则处理部件产生激活信号。

    Controlling angle of incidence of multiple-beam optical metrology tools
    189.
    发明授权
    Controlling angle of incidence of multiple-beam optical metrology tools 有权
    控制多光束光学测量工具的入射角

    公开(公告)号:US08030632B2

    公开(公告)日:2011-10-04

    申请号:US12414637

    申请日:2009-03-30

    Abstract: Provided is a method of controlling multiple beams directed to a structure in a workpiece, the method comprising generating a first illumination beam with a first light source and a second illumination beam with a second light source, projecting the first and second illumination beams onto a separate illumination secondary mirror, reflecting the first and second illumination beams onto an illumination primary mirror, the reflected first and second illumination beams projected onto the structure at a first and second angle of incidence respectively, the reflected first and second illumination beams generating a first and second detection beams respectively. The separate illumination secondary mirror is positioned relative to the illumination primary mirror so as make the first angle of incidence substantially the same or close to a calculated optimum first angle of incidence and make the second angle of incidence substantially the same or close to a calculated optimum second angle of incidence. The first and second detection beams are diffracted off the structure at the corresponding angle of incidence to a detection primary mirror, reflected onto a separate secondary detection mirror and other optical components on the detection path, and onto spectroscopic detectors.

    Abstract translation: 提供了一种控制指向工件中的结构的多个光束的方法,该方法包括利用第一光源生成具有第一光源的第一照明光束和具有第二光源的第二照明光束,将第一和第二照明光束投射到单独的 分别将第一和第二照明光束反射到照明主反射镜上,反射的第一和第二照明光束分别以第一和第二入射角投射到结构上,反射的第一和第二照明光束产生第一和第二照明光束 检测光束。 分离的照明次级反射镜相对于照明主反射镜定位,使得第一入射角基本上相同或接近于计算出的最佳第一入射角,并使第二入射角基本上相同或接近于计算的最佳 第二个入射角。 第一和第二检测光束以与检测主反射镜相对应的入射角度从结构衍射,反射到检测路径上的单独的次级检测镜和其它光学部件上,并被分布在光谱检测器上。

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