APPARATUS AND METHOD OF TESTING A STICK
    11.
    发明申请
    APPARATUS AND METHOD OF TESTING A STICK 有权
    装置和测试方法

    公开(公告)号:US20160084634A1

    公开(公告)日:2016-03-24

    申请号:US14608672

    申请日:2015-01-29

    CPC classification number: G01N21/94 G01B9/04 G01B11/06

    Abstract: An apparatus of testing a stick includes a tension unit that applies tension to a stick having openings formed therein and fixes the stick in place, a first testing unit that is spaced apart from the stick and tests a surface of the stick, a light dispersion unit that reflects light emitted from the first testing unit, a distance measurement unit that measures a third distance from a bottom surface of the stick to the light dispersion unit, and a control unit that calculates a second distance from a starting point of a protrusion of the stick tested by the first testing unit to the light dispersion unit, calculates a difference between the second distance and the third distance so as to calculate a height of the protrusion and determines whether the stick is defective or not, based on the height of the protrusion.

    Abstract translation: 测试棒的装置包括张力单元,其向具有形成在其中的开口的棒施加张力,并将棒固定在适当位置;第一测试单元,与棒间隔开并测试棒的表面;光分散单元 其反射从第一测试单元发射的光;距离测量单元,其测量从所述棒的底表面到所述光分散单元的第三距离;以及控制单元,其计算从所述第一测试单元的突起的起始点开始的第二距离 通过第一测试单元测试到光散射单元的棒,计算第二距离和第三距离之间的差,以便计算突起的高度,并且基于突起的高度来确定棒是否有缺陷 。

    DISPLAY DEVICE AND METHOD OF MANUFACTURING DISPLAY DEVICE

    公开(公告)号:US20220293705A1

    公开(公告)日:2022-09-15

    申请号:US17804748

    申请日:2022-05-31

    Abstract: A display device includes: a substrate; a first insulating layer disposed on the substrate and that includes an inorganic insulating material; an oxide semiconductor layer disposed on the first insulating layer; a second insulating layer disposed on the oxide semiconductor layer and that includes an inorganic insulating material; and a third insulating layer disposed on a gate electrode disposed on the second insulating layer and that includes an inorganic insulating material. The oxide semiconductor layer includes a first conductive region, a second conductive region, and a channel region located between the first conductive region and the second conductive region, and a value in the channel region of the oxide semiconductor layer of HC according to equation (1) is less than 30%.

    Display device and method of manufacturing display device

    公开(公告)号:US11387302B2

    公开(公告)日:2022-07-12

    申请号:US16837652

    申请日:2020-04-01

    Abstract: A display device includes: a substrate; a first insulating layer disposed on the substrate and that includes an inorganic insulating material; an oxide semiconductor layer disposed on the first insulating layer; a second insulating layer disposed on the oxide semiconductor layer and that includes an inorganic insulating material; and a third insulating layer disposed on a gate electrode disposed on the second insulating layer and that includes an inorganic insulating material. The oxide semiconductor layer includes a first conductive region, a second conductive region, and a channel region located between the first conductive region and the second conductive region, and a value in the channel region of the oxide semiconductor layer of HC according to equation (1) is less than 30%.

    Apparatus and method of testing a stick

    公开(公告)号:US09612208B2

    公开(公告)日:2017-04-04

    申请号:US14608672

    申请日:2015-01-29

    CPC classification number: G01N21/94 G01B9/04 G01B11/06

    Abstract: An apparatus of testing a stick includes a tension unit that applies tension to a stick having openings formed therein and fixes the stick in place, a first testing unit that is spaced apart from the stick and tests a surface of the stick, a light dispersion unit that reflects light emitted from the first testing unit, a distance measurement unit that measures a third distance from a bottom surface of the stick to the light dispersion unit, and a control unit that calculates a second distance from a starting point of a protrusion of the stick tested by the first testing unit to the light dispersion unit, calculates a difference between the second distance and the third distance so as to calculate a height of the protrusion and determines whether the stick is defective or not, based on the height of the protrusion.

Patent Agency Ranking