中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

241 records (took 0.023 seconds)

    Defect inspection device and defect inspection method
    13.
    发明授权
    Defect inspection device and defect inspection method 有权
    缺陷检查装置和缺陷检查方法

    公开(公告)号：US09568439B2

    公开(公告)日：2017-02-14

    申请号：US15088673

    申请日：2016-04-01

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Toshifumi Honda ,  Yuta Urano ,  Takahiro Jingu ,  Akira Hamamatsu

    IPC: G01N21/00 ,  G01N21/95 ,  G01N21/956 ,  G01J1/04

    CPC classification number: G01N21/8806 ,  G01J1/0474 ,  G01J1/44 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/12

    Abstract: To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

    Abstract translation: 为了检测无限小的缺陷，高度精确地测量检测器的尺寸，检测检查装置被配置为包括：照射单元，其照射样品表面上的线性区域中的光; 检测单元，其检测来自所述线性区域的光; 以及处理通过检测光而获得的信号并检测缺陷的信号处理单元。 检测单元包括：光学组件，其在一个方向上扩散来自样品的光并在与该一个方向正交的方向上形成图像; 以及检测组件，其具有阵列传感器，其中检测像素被二维地定位，其检测沿与所述一个方向正交的方向成像的沿所述一个方向扩散的光，并将每个所述检测像素的输出信号相加 光漫射的方向，并输出。

    LIGHT SOURCE APPARATUS AND ENDOSCOPE APPARATUS WITH THE LIGHT SOURCE APPARATUS
    14.
    发明申请
    LIGHT SOURCE APPARATUS AND ENDOSCOPE APPARATUS WITH THE LIGHT SOURCE APPARATUS 审中-公开
    光源装置和光源装置的光源装置

    公开(公告)号：US20170038514A1

    公开(公告)日：2017-02-09

    申请号：US15332237

    申请日：2016-10-24

    Applicant: OLYMPUS CORPORATION

    Inventor： Masahiro NISHIO ,  Takeshi ITO ,  Motoki TABATA

    IPC: F21V8/00 ,  G02B23/24 ,  F21V33/00 ,  G01J1/04 ,  F21V9/16 ,  F21V7/00

    CPC classification number: G02B6/0008 ,  F21V7/00 ,  F21V33/0068 ,  F21W2131/20 ,  G01J1/0414 ,  G01J1/0425 ,  G01J1/0474 ,  G01J1/08 ,  G01J1/42 ,  G01J1/4228 ,  G01J3/10 ,  G02B6/4286 ,  G02B23/2469

    Abstract: A light source apparatus includes an optical fiber that guides light source light emitted from a light source, and a light detection section that detects a quantity of the light source light guided by the optical fiber. The light detection section includes a light detector that outputs a signal indicating a quantity of incoming light, a light extraction section that is provided at a part of the optical fiber and extracts a part of light source light guided by the optical fiber as detected light, and a detected light optimization section that changes the detected light extracted from the optical fiber by the light extraction section into light having a light characteristic appropriate for detection of a quantity of light by the light detector.

    Abstract translation: 光源装置包括引导从光源发射的光源的光纤，以及检测由光纤引导的光源光量的光检测部。 光检测部分包括输出指示入射光量的信号的光检测器，设置在光纤的一部分并且提取由光纤引导的光源光的一部分作为检测光的光提取部， 以及检测光优化部，其将通过光提取部从光纤提取的检测光变为具有适合于通过光检测器检测光量的光特性的光。

    System and method for calibrating imaging measurements taken from aerial vehicles
    15.
    发明授权
    System and method for calibrating imaging measurements taken from aerial vehicles 有权
    用于校准从飞行器获取的成像测量的系统和方法

    公开(公告)号：US09470579B2

    公开(公告)日：2016-10-18

    申请号：US14480565

    申请日：2014-09-08

    Applicant: SlantRange, Inc.

    Inventor： Michael Ritter ,  Michael Milton

    IPC: G01J3/46 ,  G01J3/02 ,  G01J3/28

    CPC classification number: G01J3/0297 ,  G01J1/0433 ,  G01J1/0474 ,  G01J1/4204 ,  G01J1/44 ,  G01J3/2823 ,  G01J2003/2826

    Abstract: Systems and methods are provided for calibrating spectral measurements taken of one or more targets from an aerial vehicle. Multiple photo sensors may be configured to obtain spectral measurements of one or more ambient light sources. The obtained spectral measurements of the one or more ambient light sources may be used to calibrate the obtained spectral measurements of the target.

    Abstract translation: 提供了用于校准来自空中飞行器的一个或多个目标的光谱测量的系统和方法。 多个光电传感器可被配置为获得一个或多个环境光源的光谱测量。 所获得的一个或多个环境光源的光谱测量可用于校准所获得的目标光谱测量值。

    Light source device for calibrating image sensor
    16.
    发明申请
    Light source device for calibrating image sensor 审中-公开
    用于校准图像传感器的光源装置

    公开(公告)号：US20160178163A1

    公开(公告)日：2016-06-23

    申请号：US14757726

    申请日：2015-12-23

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Sung-Young Kwak ,  Yong-Gu Lee

    IPC: F21V9/10 ,  F21V23/02 ,  G01J1/44 ,  F21V13/14 ,  F21V14/06 ,  F21V29/67 ,  F21V3/00 ,  F21V13/02

    CPC classification number: G01J1/44 ,  G01J1/0418 ,  G01J1/0474 ,  G01J1/0488 ,  G01J1/08

    Abstract: A light source device for calibrating an image sensor is provided. The light source device includes a light source unit for outputting light, a transform filter unit for controlling a color temperature according to a wavelength of the light received from the light source unit, and a plurality of diffusion plates for controlling a ratio of long-wavelength light to short-wavelength light, the long-wavelength light and the short-wavelength light being output from the light source unit.

    Abstract translation: 提供了一种用于校准图像传感器的光源装置。 光源装置包括用于输出光的光源单元，用于根据从光源单元接收的光的波长来控制色温的变换滤波器单元，以及用于控制长波长的比率的多个扩散板 光到短波长光，长波长光和短波长光从光源单元输出。

    Defect inspection device and defect inspection method
    17.
    发明授权
    Defect inspection device and defect inspection method 有权
    缺陷检查装置和缺陷检查方法

    公开(公告)号：US09329136B2

    公开(公告)日：2016-05-03

    申请号：US14396908

    申请日：2013-04-24

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Toshifumi Honda ,  Yuta Urano ,  Takahiro Jingu ,  Akira Hamamatsu

    IPC: G01N21/00 ,  G01N21/95 ,  G01N21/956 ,  G01J1/04

    CPC classification number: G01N21/8806 ,  G01J1/0474 ,  G01J1/44 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/12

    Abstract: To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

    Abstract translation: 为了检测无限小的缺陷，高度精确地测量检测器的尺寸，检测检查装置被配置为包括：照射单元，其照射样品表面上的线性区域中的光; 检测单元，其检测来自所述线性区域的光; 以及处理通过检测光而获得的信号并检测缺陷的信号处理单元。 检测单元包括：光学组件，其在一个方向上扩散来自样品的光并在与该一个方向正交的方向上形成图像; 以及检测组件，其具有阵列传感器，其中检测像素被二维地定位，其检测沿与所述一个方向正交的方向成像的沿所述一个方向漫射的光，并将每个所述检测像素的输出信号相加， 光漫射的方向，并输出。

    HIGH ENERGY LASER TARGET BOARD APPARATUS
    18.
    发明申请
    HIGH ENERGY LASER TARGET BOARD APPARATUS 有权
    高能激光目标板装置

    公开(公告)号：US20160054176A1

    公开(公告)日：2016-02-25

    申请号：US14463436

    申请日：2014-08-19

    Applicant: Teledyne Scientific & Imaging, LLC

    Inventor： Dong-Feng Gu ,  Bruce Winker ,  Ya-Chi Chen ,  Milind Mahajan

    IPC: G01J1/42 ,  G01J1/04

    CPC classification number: G01J1/4257 ,  G01J1/0418 ,  G01J1/0425 ,  G01J1/0437 ,  G01J1/0474 ,  G02B6/00

    Abstract: A laser target board apparatus is provided for detecting spatial and temporal intensity distribution of high energy laser beams. The laser target board apparatus may include a panel having a plurality of openings and a plurality of optical rods placed therein. The laser target board apparatus may further have an optic fiber array positioned substantially parallel to and behind the panel and separated from the panel by a predetermined distance. At least one lens is configured to receive photons emitted from a second end of each optic fiber unit of the optic fiber array, and at least one camera is configured to detect the photons. A processor is configured to analyze temporal and spatial distribution of intensity of the received high energy laser beam based on data generated by the at least one camera.

    Abstract translation: 提供了一种用于检测高能激光束的空间和时间强度分布的激光目标板装置。 激光目标板装置可以包括具有多个开口的面板和放置在其中的多个光学棒。 激光目标板装置还可以具有基本上平行于面板并且在面板后面定位并且与面板隔开预定距离的光纤阵列。 至少一个透镜被配置为接收从光纤阵列的每个光纤单元的第二端发射的光子，并且至少一个相机被配置为检测光子。 处理器被配置为基于由所述至少一个照相机生成的数据来分析所接收的高能激光束的强度的时间和空间分布。

    Light Sensor Windows For Electronic Devices
    19.
    发明申请
    Light Sensor Windows For Electronic Devices 有权
    光传感器Windows用于电子设备

    公开(公告)号：US20160054175A1

    公开(公告)日：2016-02-25

    申请号：US14468177

    申请日：2014-08-25

    Applicant: Apple Inc.

    Inventor： Zhang Jia ,  Christopher S. Erickson ,  James J. Dudley ,  Kenichi Nakajima ,  Chunji Li

    IPC: G01J1/42 ,  G01J1/04

    CPC classification number: G01J1/0474 ,  G01J1/0233 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/0418 ,  G01J1/4204 ,  G06F3/041 ,  G09G5/003 ,  G09G5/10 ,  G09G2360/144

    Abstract: An electronic device may be provided with light sensors. The electronic device may have an electronic device housing in which a display is mounted. The display may have a transparent layer such as a transparent display cover layer, a thin-film transistor layer, or a color filter layer. An opaque masking layer such as a layer of black ink may be used to cover an inner surface of the transparent layer in an inactive area of the display. Sensor window openings may be formed in the black ink layer. A layer of ink may be formed in each sensor window opening. Each layer of ink may have a diffuse reflectivity that is matched to that of the black ink. A diffuser layer such as a polymer coating layer with light-scattering particles may be coated on the inner surface of the layer of ink in a sensor window opening.

    Abstract translation: 电子设备可以设置有光传感器。 电子设备可以具有安装显示器的电子设备外壳。 显示器可以具有透明层，例如透明显示覆盖层，薄膜晶体管层或滤色器层。 可以使用诸如黑色墨水层的不透明掩模层来覆盖显示器的无效区域中的透明层的内表面。 传感器窗口可以形成在黑色油墨层中。 可以在每个传感器窗口中形成一层墨水。 每层墨水可具有与黑色墨水相匹配的漫反射率。 诸如具有光散射颗粒的聚合物涂层之类的扩散层可以在传感器窗口中的油墨层的内表面上涂覆。

Patent Agency Ranking