Abstract:
The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).
Abstract:
A compact and high-performance spectroscope capable of providing a resolution of 0.1 pm or less as in the case of a large-sized spectroscope with an increased focal length and suitable for measuring the spectral distribution of an excimer laser beam. A collimating optical system collimates light under measurement passing through an entrance slit. The collimated light is incident on a diffraction grating and diffracted at angles differing depending on wavelengths. An imaging optical system focuses a beam of light diffracted by the diffraction grating. An exit slit or a light distribution detector is placed in a focal plane of the imaging optical system. A beam diameter-expanding optical system is placed at least between the collimating optical system and the diffraction grating to expand the diameter of the beam of light collimated by the collimating optical system at least in the direction of dispersion of the diffraction grating.
Abstract:
The reference light is entered into the monochromator 4, and by using the diffraction light of the different order from the diffraction order to measure the measured light, the wavelength of the reference light is measured, and the difference between the measured wavelength and the wavelength corresponding to the diffraction order of the reference light is found, and when there is a deviation in the absorption wavelength, the rotation angle of the diffraction grating 14 is corrected by an angle corresponding to the deviated wavelength, and the wavelength is calibrated.
Abstract:
A field multiplexed dispersive imaging spectrometer (20). The novel system includes foreoptics (22) for receiving incoming electromagnetic energy, a disperser (24) disposed to receive energy from the foreoptics (22), and a focal plane array (28) disposed to receive energy from the disperser (24). The disperser (24) is a computer generated holographic disperser designed to disperse light into several, overlapping diffraction orders. In the preferred embodiment, the disperser (24) is designed with greater energy in the central, undiffracted order than in the other diffracted orders. The system (20) also includes a processor (30) which takes the data detected by the focal plane array (28) and generates a representation of the input image in several color bands using an iterative restoration algorithm (32).
Abstract:
An optical beam having a randomly and unpredictably variable input polarization state propagates through an optical system containing a first optical surface, for example a diffraction grating, a first adjustable mirror, and means for rotating the respective parallel (P) and perpendicular (S) plane polarization components of the optical beam relative to the first optical surface by ninety degrees, thereby generating a polarization rotated optical beam having reversed orientations of the S and P polarization components relative to the input. The optical beam is reflected from the first adjustable mirror, which redirects the optical beam onto an optimized location on the first optical surface, thereby reducing PDL due to propagation through the optical system. In some embodiments the optical beam location on the first adjustable mirror remains substantially constant during adjustment.
Abstract:
An optical spectrum analyzer comprises a refractive grating which extracts a specific wavelength of light which is incident to be measured and outputs as a component light, an optical detector which measures optical intensity of the component light, a container in which the refractive grating and the optical detector are provided, a gas filling port and a gas exhaust port, for performing a replacement of air with a gas, which are provided in the container, are provided. By doing this, the optical spectrum analyzer which can measure level of the light to be measured having a specific wavelength accurately without causing the absorption of the specific wavelength by an OH group.
Abstract:
A transform spectrometer determines the spectrum of light based on the Talbot effect. Light to be analyzed is passed through a spatially periodic object, thereby generating a series of Talbot images. The intensities of these Talbot images at different optical distances from the spatially periodic object are then detected, and Fourier transformed to determine the spectrum of the light. Preferably, the detector comprises a spatial masking pattern such that the intensities detected are maximized at Talbot planes or at the midpoints between Talbot planes. In one embodiment, the optical distance between the spatially periodic object and the detector is changed in order to detect image intensities at different Talbot planes. In another embodiment, the detector and the spatially periodic object are positioned along a common optical axis at relative angle null such that different detector rows detect intensities at different Talbot planes. In yet another embodiment, the spatially periodic object is both a grating and a detector, and the Talbot images generated by the grating are reflected off a mirror back to the detector.
Abstract:
A high resolution etalon-grating monochromator. A preferred embodiment presents an extremely narrow slit function in the ultraviolet range and is very useful for measuring bandwidth of narrow band excimer lasers used for integrated circuit lithography. Light from the laser is focused into a diffuser and the diffused light exiting the diffuser illuminates an etalon. A portion of its light exiting the etalon is collected and directed into a slit positioned at a fringe pattern of the etalon. Light passing through the slit is collimated and the collimated light illuminates a grating positioned in an approximately Littrow configuration which disburses the light according to wavelength. A portion of the dispursed light representing the wavelength corresponding to the selected etalon fringe is passed through a second slit and monitored by a light detector. When the etalon and the grating are tuned to the same precise wavelength a slit function is defined which is extremely narrow such as about 0.034 pm (FWHM) and about 0.091 pm (95 percent integral). The bandwidth of a laser beam can be measured very accurately by a directing portion of the laser beam into the monochromator and scanning the laser wavelength over a range which includes the monochromator slit wavelength.
Abstract:
The optical system of this invention is an unique type of imaging spectrometer, i.e. an instrument that can determine the spectra of all points in a two-dimensional scene. The general type of imaging spectrometer under which this invention falls has been termed a computed-tomography imaging spectrometer (CTIS). CTIS's have the ability to perform spectral imaging of scenes containing rapidly moving objects or evolving features, hereafter referred to as transient scenes. This invention, a reflective CTIS with an unique two-dimensional reflective grating, can operate in any wavelength band from the ultraviolet through long-wave infrared. Although this spectrometer is especially useful for rapidly occurring events it is also useful for investigation of some slow moving phenomena as in the life sciences.
Abstract:
Plane diffraction grating 13 is formed of a material having an appropriate linear expansion coefficient and a variation in the wavelength of the reflected light from concave mirror 14 on account of thermal expansion or shrinkage of members other than plane diffraction grating 13 is cancelled out or reduced by a variation in the wavelength of the reflected light from concave mirror 14 on account of thermal expansion or shrinkage of plane diffraction grating 13. The same principle is used to deal with the effect on the wavelength of the diffracted light that may be caused by changes in the layout of individual members on account of thermal expansion or shrinkage of substrate 10a that fix them.