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    Atomic absorption photometer
    1.
    发明申请
    Atomic absorption photometer 有权
    原子吸收光度计

    公开(公告)号：US20020080351A1

    公开(公告)日：2002-06-27

    申请号：US10000097

    申请日：2001-12-04

    Applicant: SHIMADZU CORPORATION

    Inventor： Masumi Sakai

    IPC: G01J003/36 ,  G01J003/30

    CPC classification number: G01J3/30 ,  G01J1/18 ,  G01J3/32 ,  G01J3/42 ,  G01N21/3103

    Abstract: In an atomic absorption photometer, depending on a fact whether a background correction is carried out or not, a pattern of a pulse lighting of light sources and a timing of sampling a light receiving signal are changed. Namely, at the time of a background correction measurement, one cycle is divided into three periods, that is, a period of lighting HCL, a period of lighting D2L, and an off period, and at the time of a measurement without a background correction, one cycle is divided into the period of lighting HCL and the off period. Accordingly, at the time of the measurement without the background correction, the period of lighting HCL and the off period become longer, and signal-to-noise ratio of the light receiving signal is improved. Accordingly, an absorbance with high accuracy can be calculated.

    Abstract translation: 在原子吸收光度计中，根据是否执行背景校正的事实，改变光源的脉冲发光的模式和对光接收信号进行采样的定时。 也就是说，在背景校正测量时，将一个周期分为三个周期，即点亮时间HCL，点亮时间D2L和关闭周期，以及在没有背景校正的测量时 ，一个周期分为照明期间HCL和关闭期间。 因此，在没有背景校正的测量时，点亮HCL和关闭周期变长，并且提高了光接收信号的信噪比。 因此，可以计算出高精度的吸光度。

    Atomic absorption spectrophotometer
    2.
    发明申请
    Atomic absorption spectrophotometer 有权
    原子吸收分光光度计

    公开(公告)号：US20040223153A1

    公开(公告)日：2004-11-11

    申请号：US10827685

    申请日：2004-04-19

    Applicant: SHIMADZU CORPORATION

    Inventor： Masumi Sakai ,  Tsutomu Watanabe ,  Koki Yamamoto

    IPC: G01J003/36

    CPC classification number: G01J3/443 ,  G01N21/74

    Abstract: At the time of measurement of a sample, before a sample is introduced into a graphite tube, signal voltages which would be detected by a photomultiplier in connection with all programmable combinations of atomizing temperatures of a graphite tube, widths of entrance and exit slits provided in a spectrometer, and wavelengths into which the light is to be decomposed by the diffraction grating are stored in memory beforehand. At the time of measurement of a sample, an amplification factor of the photomultiplier is controlled by a negative high-voltage controller according to measurement requirements, or measurement is performed after an optimum detector signal voltage is set by controlling the amplification factor of the detector signal output from an amplifier.

    Abstract translation: 在样品测量时，在将样品引入石墨管之前，将通过光电倍增管检测到的与石墨管的雾化温度的所有可编程组合相关联的信号电压，其中提供的入口和出口狭缝的宽度 光谱仪和光被衍射光栅分解的波长预先存储在存储器中。 在测量样品时，根据测量要求由负高压控制器控制光电倍增管的放大系数，或者通过控制检测器信号的放大系数来设置最佳检测器信号电压之后进行测量 从放大器输出。

    Noise figure-measuring device and noise figure-measuring method
    3.
    发明申请
    Noise figure-measuring device and noise figure-measuring method 有权
    噪声系数测量装置和噪声系数测量方法

    公开(公告)号：US20020089665A1

    公开(公告)日：2002-07-11

    申请号：US09996509

    申请日：2001-11-28

    Inventor： Gentaro Ishihara ,  Tohru Mori

    IPC: G01J003/36

    CPC classification number: H04B10/0731

    Abstract: Output light spectrum P2(null) data from an optical amplifier and input light spectrum P1(null) data of signal light are prepared, the difference between the P2(null) and a value obtained by multiplying the P1(null) by a provisional gain GT is determined (Steps S232), for the obtained spectrum data, a noise removing process such as a moving average process and the like is performed and then, a spline interpolation process is also performed, whereby ASE light spectrum P3(null) data is prepared and an ASE light level P ASE is determined (Steps S233 through S235). In addition, a noise figure-measuring device 10 calculates the number of channels of WDM light and signal light wavelengths of the respective channels based on the P1(null) or P2(null), and performs analysis to calculate a noise figure NF and the like of an appointed wavelength range around the center of each wavelength thus calculated.

    Abstract translation: 准备来自光放大器的输出光谱P2（lambd）数据和信号光的输入光谱P1（lambd）数据，P2（lambd）与通过将P1（lambd）乘以临时增益而获得的值之间的差 确定GT（步骤S232），对于所获得的频谱数据，执行诸如移动平均处理等的噪声去除处理，然后也执行样条插值处理，由此ASE光谱P3（lambd）数据是 并且确定ASE光级P ASE（步骤S233至S235）。 此外，噪声系数测量装置10基于P1（羔羊）或P2（羔羊）来计算各个信道的WDM光和信号光波长的信道数，并进行分析以计算噪声系数NF，并且 像这样计算的每个波长的中心周围指定的波长范围。

    Atomic absorption spectrophotometer with a background correcting function
    4.
    发明申请
    Atomic absorption spectrophotometer with a background correcting function 有权
    原子吸收分光光度计具有背景校正功能

    公开(公告)号：US20040223154A1

    公开(公告)日：2004-11-11

    申请号：US10837781

    申请日：2004-05-04

    Applicant: SHIMADZU CORPORATION

    Inventor： Masumi Sakai ,  Kazuo Nagasawa

    IPC: G01J003/36

    CPC classification number: G01J3/42 ,  G01J3/28

    Abstract: An atomic absorption spectrophotometer including a self reverse type hollow cathode lamp and a photomultiplier tube further includes a preliminary tester for measuring a strength of a signal L when a smaller current is supplied to the hollow cathode lamp and a strength of a signal H when a larger current is supplied while a voltage V applied between a cathode and an anode of the photomultiplier is changed. It also includes an optimal voltage detector for detecting a value V0 of the voltage V at which a super ratio U (which is defined as a ratio of a first ratio L0/H0 to a second ratio L1/H1) is closest to unity under a condition that two values V1 and V0 of the voltage V are arbitrarily chosen so that a ratio H1/H0 or a ratio L1/L0 is a predetermined value. The value V0 is used in the following proper measurement of a sample analysis to apply voltage V to the photomultiplier tube of the photometric detector, where a larger current and a smaller current are alternately supplied to the hollow cathode lamp to perform the background correction. This automatically improves the accuracy of the background correction.

    Abstract translation: 包括自反向型中空阴极灯和光电倍增管的原子吸收分光光度计还包括用于当向空心阴极灯供应较小电流时测量信号L的强度的预测试仪和当较大的电流时的信号H的强度 当施加在光电倍增管的阴极和阳极之间的电压V改变时，电流被提供。 它还包括一个最佳电压检测器，用于检测电压V的值V0，其中超级比率U（其被定义为第一比率L0 / H0与第二比率L1 / H1的比率）最接近于单位 条件是任意地选择电压V的两个值V1和V0，使得比率H1 / H0或比率L1 / L0是预定值。 值V0用于样本分析的以下适当测量，以将电压V施加到光度检测器的光电倍增管，其中较大的电流和较小的电流交替地供应到空心阴极灯以执行背景校正。 这自动提高了背景校正的准确性。

    Spectroscope for measuring spectral distribution
    5.
    发明申请
    Spectroscope for measuring spectral distribution 审中-公开
    用于测量光谱分布的光谱仪

    公开(公告)号：US20010052980A1

    公开(公告)日：2001-12-20

    申请号：US09812473

    申请日：2001-03-19

    Inventor： Akifumi Tada

    IPC: G01J003/18 ,  G01J003/36

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/18 ,  G01J3/22

    Abstract: A compact and high-performance spectroscope capable of providing a resolution of 0.1 pm or less as in the case of a large-sized spectroscope with an increased focal length and suitable for measuring the spectral distribution of an excimer laser beam. A collimating optical system collimates light under measurement passing through an entrance slit. The collimated light is incident on a diffraction grating and diffracted at angles differing depending on wavelengths. An imaging optical system focuses a beam of light diffracted by the diffraction grating. An exit slit or a light distribution detector is placed in a focal plane of the imaging optical system. A beam diameter-expanding optical system is placed at least between the collimating optical system and the diffraction grating to expand the diameter of the beam of light collimated by the collimating optical system at least in the direction of dispersion of the diffraction grating.

    Abstract translation: 能够提供0.1μm或更小分辨率的小型和高性能的分光器，如在具有增加的焦距的大尺寸分光器的情况下，并且适合于测量准分子激光束的光谱分布。 准直光学系统通过入口狭缝准直测量的光。 准直光入射在衍射光栅上，并以取决于波长的不同角度进行衍射。 成像光学系统聚焦由衍射光栅衍射的光束。 出射狭缝或光分布检测器被放置在成像光学系统的焦平面中。 光束直径扩展光学系统至少放置在准直光学系统和衍射光栅之间，以至少在衍射光栅的分散方向上扩展由准直光学系统准直的光束的直径。

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