Abstract:
A spectral colorimetric apparatus for detecting a color of an image of a subject, including: an illumination optical system illuminating the subject on a detection surface; a spectral optical system including a spectral element spectrally separating the beam diffused by the subject and a light receiving element array detecting a spectral intensity distribution; and a guiding optical system for guiding a beam diffused by the subject, wherein: the detection surface is parallel to a spectral plane including a principal ray of a beam entering the spectral optical system and a principal ray of a beam spectrally separated; the principal ray of the beam enters the spectral optical system within the spectral plane obliquely to a line joining a center of the light receiving element array with a surface vertex of the spectral element; and a light receiving surface of the light receiving element array is orthogonal to the spectral plane.
Abstract:
A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.
Abstract:
Input light, such as from an optical sensor or stimulus-wavelength converter, includes one or more light or dark sub-bands. The input light is transmitted, such as through a transmissive layer or transmission component, to obtain effects due to transmission with lateral variation. A detector can, for example, obtain spectral information or other photon energy information about the sub-bands due to lateral variation. For each light or dark sub-band, a transmission component can, for example, provide a respective light or dark spot, and spot position can be used to obtain spectral information such as absolute wavelength or wavelength change. A photosensing component can sense or detect transmitted light or output photons, such as with a photosensor array or a position-sensitive detector. Circuitry can use photosensed quantities to obtain, e.g. a differential signal or information about time of wavelength change.
Abstract:
A particle detection and classification system is disclosed. The system determines the size of measured particles by measuring light scattered by the particles. The system simultaneously determines whether measured particles are biological or non-biological by measuring fluorescent light from the particles. The system uses a parabolic reflector, and optionally, a spherical reflector to collect fluorescence light.
Abstract:
Provided is a wavelength distribution measuring apparatus (24), which includes a diffuser plate (52) for dispersing light beams radiated from an object to be measured (11) and a light beam homogenizing optical element (53) for reflecting, by the side surface (53b), at least part of the light beams dispersed by the diffuser plate (52) so that the light beams approximate to the direction of the perpendicular of a light receiving surface and also for guiding the light beams to the light receiving surface, and an optical receiver (56) including a plurality of light receiving elements for detecting the light beams, the light receiving elements being different from one another in spectral sensitivity characteristic. With this configuration, substantially parallel light beams radiated from the object to be measured (11) are homogenized at the light receiving surface including the periphery of the light receiving surface.
Abstract:
The current application is directed to an apparatus and a method for parallel testing and sorting of LED dies on a substrate wafer. The apparatus includes a moving stage and a chuck for the wafer, a wafer prober, collecting and imaging optics, sorting and separating optics, and a linear or rectangular array of light detectors. The method of testing includes moving an LED wafer or a test device on an XY stage, connecting the prober to a line of multiple LED dies or several lines of multiple LED dies, referred to as an “array of devices under test” (“ADUT”), measuring the electrical characteristics of the individual devices under test (“DUT”) in parallel, and collecting light from, and identifying the intensity and wavelength distribution of, the individual DUT in parallel.
Abstract:
A terahertz-wave generating element includes a waveguide including an electro-optic crystal; an optical coupling member that extracts a terahertz wave, which is generated from the electro-optic crystal as a result of light propagating through the waveguide, to a space; and at least two electrodes that cause a first-order electro-optic effect in the electro-optic crystal by applying an electric field to the waveguide so as to change a propagation state of the light propagating through the waveguide. A crystal axis of the electro-optic crystal of the waveguide is set such that the terahertz wave generated by a second-order nonlinear optical process and the light propagating through the waveguide are phase-matched.
Abstract:
A system and method for a hyperspectral illuminator. The hyperspectral illuminator includes an LED array for generating light of a predefined spectra. The hyperspectral illuminator further includes multiple collimators. Each of the multiple collimators is associated with one an LED of the LED array and focus the light into beams. The hyperspectral illuminator further includes multiple dichroic filters. The dichroic filters filter the beams. The hyperspectral illuminator further includes one or more integrator lenses for mixing the filtered beams into a uniform pattern for projection on to a target.
Abstract:
A system for the detection of components in a region of the atmosphere is disclosed, the system comprising a spectrometer assembly having a detector optically coupled to a optical assembly, the optical assembly receiving incident sunlight from the region of the atmosphere, the optical assembly having a field of view extending from the zenith to below the horizon; means for rotating the spectrometer assembly about a vertical axis; and a processor for receiving data from the spectrometer assembly and compiling data relating to the identity and concentration of components in the region of the atmosphere. A method of monitoring pollutants in a region of the atmosphere comprises providing a spectrometer assembly having a detector optically coupled to an optical assembly having a field of view extending from the zenith to below the horizon; exposing the spectrometer assembly to incident sunlight while rotating the spectrometer assembly about a substantially vertical axis; and processing signals received from the spectrometer assembly to analyse components in the atmosphere. The system and method are particularly useful in monitoring atmospheric pollutants arising from the combustion of hydrocarbon fuels, in particular oxides of nitrogen and/or sulphur. A preferred arrangement comprises a plurality of systems disposed at spaced apart locations and having their scanned regions overlapping.