Photometer with modular light emitter
    191.
    发明授权
    Photometer with modular light emitter 有权
    带模块化发光器的光度计

    公开(公告)号:US07623225B2

    公开(公告)日:2009-11-24

    申请号:US12256786

    申请日:2008-10-23

    Abstract: A photometer is provided with modular lighting units wherein each lighting unit includes one or more light emitters. A user may select a desired lighting unit and install it within a photometer base unit, and thereafter activate one or more of the emitters (which may emit light of different wavelengths) to illuminate a specimen. The light provided by the specimen in response can then be captured at a detector, and analyzed to provide an indication of the specimen's characteristics. Different lighting units may optionally include one or more input light adapters (filters or polarizers which modify the light provided by the emitter(s) to the specimen), and/or one or more output light adapters (filters or polarizers which modify the light provided by the specimen to the detector). Users may therefore select lighting units with emitters and light adapters which are particularly suited for detection/analysis of particular specimens and/or components therein.

    Abstract translation: 光度计设置有模块化照明单元,其中每个照明单元包括一个或多个发光器。 用户可以选择所需的照明单元并将其安装在光度计基座单元内,然后激活一个或多个发射器(其可以发射不同波长的光)以照射样本。 然后可以在检测器处捕获由样品提供的光,并分析以提供样品特征的指示。 不同的照明单元可以可选地包括一个或多个输入光适配器(将由发射器提供的光修改为样本的滤光器或偏振器)和/或一个或多个输出光适配器(改变所提供的光的滤光器或偏振器 通过样品到检测器)。 因此,用户可以选择具有发射器和光适配器的照明单元,其特别适于检测/分析其中的特定样品和/或部件。

    Multiple Wavelength Optical Analyzer Device
    192.
    发明申请
    Multiple Wavelength Optical Analyzer Device 有权
    多波长光分析仪器

    公开(公告)号:US20090091759A1

    公开(公告)日:2009-04-09

    申请号:US11867956

    申请日:2007-10-05

    CPC classification number: G01J9/00 G01J3/02 G01J3/0218 G01J3/0235

    Abstract: A device and method of operation for analyzing signal features over multiple optical wavelengths is presented. A plurality of rotating thin film filters is arranged with respect to a collimated beam of light so that each thin film filter transmits light of a particular wavelength to a detector unit responsive to an angle of incidence of light upon the thin film filter when the thin film filter optically interposes the collimated light beam. Each of the plurality of thin film filters is optically interposed periodically and rotated so that the angle of incidence of light from the first input unit upon the thin film filter varies when the thin film filter is optically interposed to scan the light by wavelength within a selected wavelength band into a detector unit for measurement.

    Abstract translation: 提出了一种用于分析多个光波长的信号特征的装置和操作方法。 相对于准直光束布置多个旋转薄膜滤光器,使得每个薄膜滤光器响应于薄膜滤光片上的光入射角而将特定波长的光透射到检测器单元,当薄膜 滤光片光学地插入准直光束。 多个薄膜滤光器中的每一个周期性地被光学地插入并旋转,使得当薄膜滤光器被光学插入时,来自第一输入单元的薄膜滤光器的入射角度变化,以便在选定的 波长带进入检测器单元进行测量。

    Self-referencing instrument and method thereof for measuring electromagnetic properties
    195.
    发明授权
    Self-referencing instrument and method thereof for measuring electromagnetic properties 有权
    用于测量电磁特性的自参考仪器及其方法

    公开(公告)号:US07321424B2

    公开(公告)日:2008-01-22

    申请号:US11197195

    申请日:2005-08-04

    Abstract: In a self-referencing instrument for measuring electromagnetic radiation, a mounting member to which a sample can be coupled moves the sample such that, in a first position, the electromagnetic radiation impinges on the sample, and, in a second position, the electromagnetic radiation does not impinge on the sample. A detection unit receives the electromagnetic radiation from the sample and generates a sample signal when the sample is in the first position, and the detection unit receives the electromagnetic radiation from the source and generates a reference signal when the sample is in the second position. A processor coupled to the detection unit processes the reference signal and the sample signal. This results in a continuous, accurate reference measurement, and permits the instrument to efficiently compensate for error, while offering accurate measurements.

    Abstract translation: 在用于测量电磁辐射的自参考仪器中,可以耦合样品的安装构件移动样品,使得在第一位置,电磁辐射照射在样品上,并且在第二位置中,电磁辐射 不会影响样品。 检测单元从样本接收电磁辐射,并且当样本处于第一位置时产生采样信号,并且当样本处于第二位置时,检测单元从源接收电磁辐射并产生参考信号。 耦合到检测单元的处理器处理参考信号和采样信号。 这将产生连续,准确的参考测量,并允许仪器有效地补偿误差,同时提供准确的测量。

    Disk-shaped carrier system with a plurality of integrated diffraction structures
    198.
    发明申请
    Disk-shaped carrier system with a plurality of integrated diffraction structures 审中-公开
    具有多个集成衍射结构的盘形载体系统

    公开(公告)号:US20070019295A1

    公开(公告)日:2007-01-25

    申请号:US11485163

    申请日:2006-07-12

    Abstract: The invention concerns a circular disk-shaped carrier system with a plurality of integrated diffraction structures for the spectral analysis of light of the wavelengths 340-800 nm, wherein each diffraction structure includes a layer of a transparent plastic material which has a microstructure suitable for the diffraction of a wavelength within the wavelength spectrum of the light, and the carrier system includes at least two diffraction structures for the diffraction of light of differing wavelength.

    Abstract translation: 本发明涉及具有多个集成的衍射结构的圆盘形载体系统,用于波长为340-800nm的光的光谱分析,其中每个衍射结构包括透明塑料材料层,其具有适合于 在光的波长光谱内的波长的衍射,并且载体系统包括用于不同波长的光的衍射的至少两个衍射结构。

Patent Agency Ranking