公开(公告)号：US20140061473A1

公开(公告)日：2014-03-06

申请号：US13945542

申请日：2013-07-18

Applicant: Mohammad J. Khan ,  Sumanth Kaushik ,  Jerry C. Chen

Inventor： Mohammad J. Khan ,  Sumanth Kaushik ,  Jerry C. Chen

IPC: G01J3/42

CPC classification number: G01J3/42 ,  G01N21/3581 ,  G01N2021/1793

Abstract: Disclosed herein are a system and corresponding method for sensing terahertz radiation. The system collects terahertz radiation scattered from a target and upconverts the collected radiation to optical frequencies. A frequency-domain spectrometer senses spectral components of the upconverted signal in parallel to produce a spectroscopic measurement of the entire band of interest in a single shot. Because the sensing system can do single-shot measurements, it can sense moving targets, unlike sensing systems that use serial detection, which can only be used to sense stationary objects. As a result, the sensing systems and methods disclosed herein may be used for real-time imaging, including detection of concealed weapons, medical imaging, and hyperspectral imaging.

Abstract translation: 这里公开了用于感测太赫兹辐射的系统和相应的方法。 该系统收集从目标散射的太赫兹辐射，并将收集的辐射上变频到光频率。 频域光谱仪平行地感测上转换信号的光谱分量，以在单次拍摄中产生整个感兴趣的频带的光谱测量。 因为感测系统可以进行单次测量，所以它可以感测移动目标，不同于使用串行检测的传感系统，只能用于感测静止物体。 结果，本文公开的感测系统和方法可用于实时成像，包括隐藏武器的检测，医学成像和高光谱成像。

公开(公告)号：US20140021353A1

公开(公告)日：2014-01-23

申请号：US14041145

申请日：2013-09-30

Applicant: MURATA MANUFACTURING CO., LTD.

Inventor： Takashi Kondo ,  Seiji Kamba

IPC: G01J3/02 ,  G01J3/42

CPC classification number: G01J3/0267 ,  G01J3/42 ,  G01N21/3586 ,  Y10T29/49

Abstract: A measurement structure including an aperture array structure made of a metal and having a plurality of aperture portions, and a support base supporting the aperture array structure. The measurement structure is used in a measuring method by applying an electromagnetic wave to the measurement structure on which a specimen is held, detecting frequency characteristics of the electromagnetic wave transmitted through the measurement structure or reflected by the measurement structure, and measuring characteristics of the specimen. At least a first part of a surface of the aperture array structure proximal to the support base is joined to the support base, and at least a second part of the surface of the aperture array structure defines at least part of the plurality of aperture portions, the second part of the surface being proximal to the support base and not in contact with the support base.

Abstract translation: 一种测量结构，包括由金属制成并具有多个开口部分的孔径阵列结构以及支撑孔径阵列结构的支撑基座。 测量结构用于测量方法中，通过对被测体的测量结构施加电磁波，检测通过测量结构透射的电磁波的频率特性或由测量结构反射的测量结构，以及测量样本的特性 。 至少靠近支撑基座的孔阵列结构的表面的第一部分接合到支撑基底，并且孔阵列结构的表面的至少第二部分限定多个孔部分的至少一部分， 表面的第二部分靠近支撑基座并且不与支撑基座接触。

公开(公告)号：US20140021344A1

公开(公告)日：2014-01-23

申请号：US14110013

申请日：2012-04-03

Applicant: Junichi Okada ,  Kouichi Kobayashi ,  Fumitaka Kume

Inventor： Junichi Okada ,  Kouichi Kobayashi ,  Fumitaka Kume

IPC: G01J3/42

CPC classification number: G01J3/42 ,  G01N21/274 ,  G01N21/3563

Abstract: The present invention provides a method for making it possible to easily and simply measure approximate concentration of substitutional carbon impurities in a desired position in a polycrystalline silicon rod. A polycrystalline silicon plate is sliced out from a polycrystalline silicon rod and both surfaces of the polycrystalline silicon plate are mirror-polished to reduce the polycrystalline silicon plate to thickness of 2.12±0.01 mm. A calibration curve is created according to an infrared absorption spectroscopy and on the basis of a standard measurement method using a single crystal silicon standard sample having known substitutional carbon concentration and thickness of 2.00±0.01 mm, an infrared absorption spectrum in a frequency domain including an absorption zone peak of substitutional carbon of the polycrystalline silicon plate after the mirror polishing is calculated under conditions same as conditions during the calibration curve creation, and substitutional carbon concentration is calculated without performing thickness correction.

Abstract translation: 本发明提供了一种使得可以容易且简单地测量多晶硅棒中期望位置中的取代碳杂质的近似浓度的方法。 将多晶硅板从多晶硅棒切出，并将多晶硅板的两个表面进行镜面抛光以将多晶硅板的厚度减小到2.12±0.01mm。 根据红外吸收光谱法和基于使用具有已知的取代碳浓度和厚度为2.00±0.01mm的单晶硅标准样品的标准测量方法产生校准曲线，在频域中的红外吸收光谱包括 在与校准曲线生成期间的条件相同的条件下计算镜面抛光后的多晶硅板的取代碳的吸收峰的峰值，并且计算替代碳浓度而不进行厚度校正。

公开(公告)号：US20140009751A1

公开(公告)日：2014-01-09

申请号：US13469995

申请日：2012-05-11

Applicant: Joseph Larry Pezzaniti

Inventor： Joseph Larry Pezzaniti

IPC: G01J3/42

CPC classification number: G01N33/2835 ,  G01J3/28 ,  G01J3/42 ,  G01N21/17 ,  G01N21/314 ,  G01N21/3577

Abstract: An apparatus and method for determining a concentration of an additive in a mixture is provided. The apparatus for determining the concentration of an additive in a mixture comprises a distillation system, a filtration system, a detection system and a fluid transportation system. An alternative apparatus is a portable apparatus comprising a distillation system, a filtration system, a detection system and a fluid transportation system removably coupled to a portable container. A method for determining the concentration of the additive in the mixture includes concentrating the additive in the mixture, removing the additive from a fraction of the mixture and measuring a spectral signature of both the non-additive fraction of the mixture and the mixture. A spectral signature value of the non-additive fraction of the mixture to the mixture is determined and then compared to spectral signatures of a plurality of reference mixtures containing known concentrations of the additive.

Abstract translation: 提供了一种用于确定混合物中添加剂浓度的装置和方法。 用于测定混合物中添加剂浓度的装置包括蒸馏系统，过滤系统，检测系统和流体输送系统。 替代装置是一种便携式装置，其包括蒸馏系统，过滤系统，检测系统和可移除地联接到便携式容器的流体输送系统。 用于确定混合物中添加剂浓度的方法包括将添加剂浓缩在混合物中，从混合物的一部分中除去添加剂并测量混合物的非添加部分和混合物的光谱特征。 确定混合物与混合物的非添加级分的光谱特征值，然后与含有已知浓度的添加剂的多种参考混合物的光谱特征进行比较。

公开(公告)号：US20140008540A1

公开(公告)日：2014-01-09

申请号：US14005849

申请日：2012-02-21

Applicant: Takashi Yasuda ,  Yoichi Kawada ,  Atsushi Nakanishi ,  Kouichiro Akiyama ,  Hironori Takahashi

Inventor： Takashi Yasuda ,  Yoichi Kawada ,  Atsushi Nakanishi ,  Kouichiro Akiyama ,  Hironori Takahashi

IPC: G01J3/42 ,  G01J3/02

CPC classification number: G01J3/42 ,  G01J3/0205 ,  G01N21/3581 ,  G01N21/552

Abstract: By mating a main part with a first prism part or second prism part, a terahertz-wave spectrometer can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism. When the main part mates with the first prism part, the terahertz wave T incident on an entrance surface passes through a depression, so as to be reflected by an arrangement part, whereby reflection spectrometry can be performed. When the main part mates with the second prism part, the terahertz wave T incident on the entrance surface is refracted by the depression, so as to pass through an object to be measured within a groove, whereby transmission spectrometry can be preformed.

Abstract translation: 通过将主要部分与第一棱镜部分或第二棱镜部分配合，太赫兹波谱仪可以容易地在分光棱镜内传播的太赫兹波T的光路之间切换。 当主体与第一棱镜部分配合时，入射表面上的太赫兹波T穿过凹陷，以便被布置部反射，从而可以进行反射光谱测定。 当主要部分与第二棱镜部分配合时，入射表面上的太赫兹波T被凹陷折射，以便在沟槽内通过待测物体，从而可进行透射光谱测定。

公开(公告)号：US20130336646A1

公开(公告)日：2013-12-19

申请号：US13527155

申请日：2012-06-19

Applicant: John Cabaniss

Inventor： John Cabaniss

IPC: H04B10/08

CPC classification number: G01J3/0237 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/027 ,  G01J3/12 ,  G01J3/36 ,  G01J3/42

Abstract: Various embodiments for facilitating optical communications utilizing a apparatus are disclosed. One embodiment, among others, is an apparatus that comprises a dispersion element configured to transmit a beam through a plurality of optical paths in a spectral dispersion element to generate a spectrally dispersed beam. The apparatus further comprises a second-harmonic generation (SHG) element integrated into the dispersion element, the SHG element configured to generate second-harmonic light beam from the dispersed beam by splitting the dispersed beam into a plurality of beams, wherein the plurality of beams traverse a common axis. The apparatus further comprises a collimator configured to collimate the second-harmonic light beam over a predetermined path length and a phase decoder configured to receive the collimated beam and measure characteristics associated with the collimated beam.

Abstract translation: 公开了用于促进利用设备的光通信的各种实施例。 一个实施例是一种装置，其包括色散元件，其被配置为通过光谱色散元件中的多个光路传输光束以产生光谱分散的光束。 该装置还包括集成到色散元件中的二次谐波产生（SHG）元件，SHG元件被配置为通过将分散的光束分成多个光束从分散光束产生二次谐波光束，其中多个光束 横穿公共轴。 该装置还包括准直器，其被配置为在预定路径长度上准直二次谐波光束;以及相位解码器，被配置为接收准直光束并测量与准直光束相关联的特性。

公开(公告)号：US20130334421A1

公开(公告)日：2013-12-19

申请号：US13894065

申请日：2013-05-14

Applicant: CANON KABUSHIKI KAISHA

Inventor： TAKEAKI ITSUJI

IPC: G01J5/02 ,  G01N21/55

CPC classification number: G01J5/0205 ,  G01J3/42 ,  G01N21/3581 ,  G01N21/4795 ,  G01N21/55

Abstract: A measurement apparatus including a convergence unit for converging the electromagnetic wave to the object; a detection unit for detecting electromagnetic waves from the object; and an adjustment unit for adjusting a relative position between the object and the convergence position set by the convergence unit in a detecting region selected by using interval information about an interval between a first electromagnetic wave from the first reflecting surface and a second electromagnetic wave from the second reflecting surface, the first and second electromagnetic waves being acquired by using a detection result of the detection unit, in which the detecting region is a region in which a measurement position of the object at the time of detecting electromagnetic waves from the object is determined based on relative position information selected from and by using a plurality of pieces of information on the relative position corresponding to the interval information.

Abstract translation: 一种测量装置，包括用于将电磁波会聚到物体的会聚单元; 用于检测来自物体的电磁波的检测单元; 以及调整单元，用于通过使用关于来自第一反射表面的第一电磁波和来自第一反射表面的第二电磁波之间的间隔的间隔信息​​选择的检测区域中调整由会聚单元设置的对象与会聚位置之间的相对位置 第二反射面，通过使用检测单元的检测结果获取第一和第二电磁波，其中检测区域是其中检测到来自物体的电磁波的物体的测量位置被确定的区域 基于从与间隔信息相对应的相对位置使用多条信息选择的相对位置信息。

公开(公告)号：US20130320223A1

公开(公告)日：2013-12-05

申请号：US13990711

申请日：2011-11-23

Applicant: Harald Quintel ,  Elmar Christian Feuerbacher ,  Roman Gruler ,  Stuart Ronald Huckins ,  Dominik Zahr ,  Markus Rebholz ,  Robert Schild

Inventor： Harald Quintel ,  Elmar Christian Feuerbacher ,  Roman Gruler ,  Stuart Ronald Huckins ,  Dominik Zahr ,  Markus Rebholz ,  Robert Schild

IPC: G01J3/42

CPC classification number: G01J3/42 ,  G01J3/10 ,  G01J3/36 ,  G01J3/427 ,  G01N21/33

Abstract: A photometric device (18) for quantifying a nucleic acid in a sample (518) in a tube (58), comprises a light emission unit (28), a sample obtaining unit (38) for holding the tube (58) with the nucleic acid sample (518) and a detection unit (48) wherein the sample obtaining unit (38) is arranged in between the light emission unit (28) and the detection unit (48) in particular, the light emission unit (28) and the detection unit (48) are arranged to provide light through the sample obtaining unit (38) such that light of a first wavelength of about 230 nanometers and light of a second wavelength of about 260 nanometers are simultaneously detectable within the detection unit (48). The photometric device (18) allows for efficiently analysing the nucleic acid sample by only considering invisible light. In particular, content of nucleic acid such as particularly a RNA or a DNA and a nucleic acid/salt ratio can simultaneously be determined such that efficiency of quantification of the nucleic acid sample (518) can be increased. Furthermore, since in addition thereto the sample obtaining unit (38) is arranged to hold the tube (58) or cuvette and the light directly passes the sample (518) being arranged in the tube (58) or cuvette, loss of sample, contamination of sample, need of additional sample treatment equipment such as pipettes or additional tubes as well as frequent cleaning of optics of the photometric device can be printed or reduced.

Abstract translation: 用于量化管（58）中的样品（518）中的核酸的光度测量装置（18）包括发光单元（28），用于将核（58）保持在核上的样品获得单元（38） 酸样品（518）和检测单元（48），其中样品获得单元（38）特别地布置在发光单元（28）和检测单元（48）之间，发光单元（28）和 检测单元（48）被布置成通过样品获得单元（38）提供光，使得在检测单元（48）内同时可检测到约230纳米的第一波长的光和约260纳米的第二波长的光。 光度测量装置（18）允许通过仅考虑不可见光来有效地分析核酸样品。 特别地，可以同时确定诸如特别是RNA或DNA的核酸的含量和核酸/盐比，从而可以提高核酸样品（518）的定量效率。 此外，由于样品获取单元（38）除此之外还被配置成保持管（58）或试管，并且光直接通过布置在管（58）或试管中的样品（518），样品损失，污染 的样品，可以印刷或减少需要另外的样品处理设备，例如移液管或附加管，以及经常清洁光度测量装置的光学元件。

公开(公告)号：US20130256535A1

公开(公告)日：2013-10-03

申请号：US13992341

申请日：2011-12-07

Applicant: Afric Simone Meijer ,  Willem Joan Van Der Zande

Inventor： Afric Simone Meijer ,  Willem Joan Van Der Zande

IPC: G01J5/02

CPC classification number: G01J5/02 ,  G01J3/42 ,  G01N21/3563 ,  G01N21/3581 ,  H01J47/024

Abstract: Detector for terahertz radiation with a micro-plasma cell (1) having a cavity (5) including a plasma in operation when applying a DC bias to the micro-plasma cell (1). Furthermore, the detector is provided with read-out electronics (20) connected to the micro-plasma cell (1). The read-out electronics measure changes of an electron density in the plasma in the micro-plasma cell (1) with respect to the DC bias provided electron density. The cavity (5) includes a gas composition near atmospheric pressure or higher, and the gas composition includes a Penning mixture.

Abstract translation: 具有微等离子体电池（1）的太赫兹辐射检测器，当在微等离子体电池（1）上施加DC偏压时，具有包括等离子体的空腔（5）。 此外，检测器设置有连接到微等离子体电池（1）的读出电子器件（20）。 读出的电子元件测量微等离子体电池（1）中的等离子体中的电子密度相对于提供的电子密度的DC偏压的变化。 空腔（5）包括接近大气压或更高的气体组成，气体组成包括Penning混合物。

公开(公告)号：US20130240734A1

公开(公告)日：2013-09-19

申请号：US13812323

申请日：2011-07-28

Applicant: Karl Booksh ,  Nicola Menegazzo ,  Yoon-Chang Kim ,  Laurel Kegel ,  Derrick Allen

Inventor： Karl Booksh ,  Nicola Menegazzo ,  Yoon-Chang Kim ,  Laurel Kegel ,  Derrick Allen

IPC: G01J3/02 ,  G02B5/20 ,  G01J3/42

CPC classification number: G01J3/0205 ,  G01J3/42 ,  G01N21/35 ,  G01N21/553 ,  G02B5/208

Abstract: Methods of measuring a sample characteristic and accessories for infrared (IR) spectrometers are provided. An accessory includes an input port and an output port having an optical path therebetween, a surface plasmon resonance (SPR) structure for contacting a sample, a mirror system, and an optical element for producing collimated light. The SPR structure produces internally reflected light responsive to broadband IR light, modified by a SPR between the SPR structure and the sample. The mirror system directs the broadband IR light from the input port to the SPR structure and directs the internally reflected light from the SPR structure to the output port, producing output light indicative of a characteristic of the sample associated with the SPR. The optical element is disposed along the optical path between the input port and the output port.

Abstract translation: 提供了测量红外（IR）光谱仪的样品特性和附件的方法。 一个附件包括一个输入端口和一个具有光路的输出端口，用于接触样品的表面等离子体共振（SPR）结构，镜子系统和用于产生准直光的光学元件。 SPR结构产生内部反射光，响应宽带IR光，由SPR结构和样品之间的SPR进行修改。 镜系统将宽带IR光从输入端口引导到SPR结构，并将内部反射光从SPR结构引导到输出端口，产生指示与SPR相关联的样本特征的输出光。 光学元件沿着输入端口和输出端口之间的光路布置。