Abstract:
There is provided a wiring substrate. The wiring substrate includes: an insulating layer; first electrode pads having first exposed surfaces, the first exposed surfaces being exposed from the insulating layer; and second electrode pads having second exposed surfaces, the second exposed surfaces being exposed from the insulating layer. There is a level difference between the first exposed surfaces and the second exposed surfaces.
Abstract:
A flexible printed circuit includes: a flexible substrate extending from a first end section to a second end section, and having an opening or a notch in proximity to the first end section; a first wiring layer extending from the first end section to the second end section so as to avoid the opening or the notch; a second wiring layer extending from the first end section to the second end section so as to block the opening or the notch; a first conductive member being formed opposed to the flexible substrate in relation to the first wiring layer and at least in proximity to the first end section in a region opposed to the first wiring layer, and being electrically connected to the first wiring layer; and a second conductive member electrically connected to the second wiring layer via the opening or the notch.
Abstract:
A prober unit in which probes are brought into contact with to-be-tested semiconductor chips to establish electrical connection between the semiconductor chips and a test unit via the probes. A probe assembly and a plurality of wiring boards are prepared, the probe assembly being constituted by integrated regularly-arranged multiple probe groups including output terminals connected directly to the probes, and each of the wiring boards including wiring adhering to a surface of a non-conductive film; and an n-th row of an output terminal group of the probe assembly is brought into contact with a land group provided at an end of an n-th wiring board, and a wiring terminal provided at the other end of the n-th wiring board is connected to one of a wiring board of the test unit and a connector to establish electrical connection between the to-be-tested semiconductor chips and the test unit.
Abstract:
An electronic board includes conducting traces having an upper surface at least partially sunken with respect to a gluing surface of the board. A surface mount technology electronic device for mounting to the board includes insulating windows that define gluing sites within one or more pins. An electronic system is formed by one or more of such surface mount technology electronic devices mounted to electronic board. The devices are attached using a wave soldering technique that flows through channels formed by the sunken conductive traces.
Abstract:
A wiring board includes a pad exposed from an opening portion of an outermost insulating layer. The pad includes: a first metal layer a surface of which is exposed from the wiring board; a second metal layer provided on the first metal layer and formed of a material effective in preventing a metal contained in a via inside the board from diffusing into the first metal layer; and a third metal layer provided between the second metal layer and the via, and formed of a material harder to be oxidized than that of the second metal layer. The thickness of the third metal layer is relatively thick, and is preferably selected to be three times or greater than a thickness of the second metal layer. A side surface of the third metal layer and a surface of the third metal layer to which the via is to be connected are roughed.
Abstract:
An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a plurality of bypass pads for testing an electric circuit. The external pads are exposed and at least one of the plurality of bypass pads are not exposed from an outer surface of the PCB. A system using the electronic device and a method of testing an electronic device are also provided.
Abstract:
A plasma display device includes a plasma display panel for displaying an image by a gas discharge. A chassis base is attached to the plasma display panel and supports the plasma display panel. At least one printed circuit board is mounted on the a side of the chassis base at opposite the side supporting the plasma display panel. At least one flexible printed circuit connects electrodes of the plasma display panel and terminals of the printed circuit boards. An anisotropic conductive film is between the terminal of the printed circuit board and a terminal of the flexible printed circuit and connects the terminal of the printed circuit board and the terminal of the flexible printed circuit. The printed circuit board includes at least one dummy groove outside a region of the printed circuit board facing the flexible printed circuit.
Abstract:
A portion of compliant material includes four walls defining a slot. The slot has a relatively large cross-section end in fluid communication with a solder reservoir, and also has a relatively small cross-section end opposed to the relatively large cross-section end. The slot has a generally elongate rectangular shape when viewed in plan, with a length perpendicular to a scan direction, a width, parallel to the scan direction, associated with the relatively large cross section end, and a width, parallel to the scan direction, associated with the relatively small cross section end. The slot is configured in the portion of compliant material such that the relatively small cross-section end of the slot normally remains substantially closed, but locally opens sufficiently to dispense solder from the reservoir when under fluid pressure and locally unsupported by a workpiece. Methods of operation and fabrication are also disclosed.
Abstract:
There is provided a bump structure for a semiconductor device, comprising a metal post formed on and electrically connected to an electrode pad on a substrate, a solder post formed on the top surface of the metal post, said solder post having the same horizontal width as the metal post and the top surface of the solder post being substantially rounded, and an intermetallic compound layer disposed at the interface between the metal post and the solder post. An oxide layer formed on the solder post prevents solder post under reflow from being changed into a spherical shape. An intermetallic compound layer may be formed by an aging process at the interface between the metal post and the solder post. The bump structure can realize fine pitch semiconductor package without a short between neighboring bumps.
Abstract:
A highly reliable LED package mounting structure which can realize improvement in solder fatigue life at low costs is provided. An LED package has a light-emitting surface which is perpendicular to a mounting surface of a circuit board, comprises connection terminal portions on the side face or on the side face and the bottom face of the package, and is joined with the circuit board by soldering via the connection terminal portion. Furthermore, the shape of the solder is optimized by defining the relative position relation between the end of an electrode on the central side of the LED package on the bottom face of an LED package body and the end of a component mounting pad on the circuit board.