NON-CONTACT METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT AN INSPECTION STATION HAVING A MEASUREMENT AXIS
    221.
    发明申请
    NON-CONTACT METHOD AND SYSTEM FOR INSPECTING A MANUFACTURED PART AT AN INSPECTION STATION HAVING A MEASUREMENT AXIS 有权
    在具有测量轴的检查站检查制造部件的非接触方法和系统

    公开(公告)号:US20150204798A1

    公开(公告)日:2015-07-23

    申请号:US14629527

    申请日:2015-02-24

    Abstract: A method and system for inspecting a manufactured part at an inspection station are provided. A supported part is rotated about a measurement axis so that the part moves at predetermined angular increments during at least one rotational scan. A backside beam of collimated radiation is directed at and is occluded by the supported part at each of a first plurality of consecutive increments of movement to create a stream of unobstructed portions of the backside beam in rapid succession passing by and not blocked by the supported part. A frontside beam of radiation is directed at and is reflected by the supported part at each of a second plurality of consecutive increments of movement to create a stream of reflected portions of the frontside beam in rapid succession. The streams of reflected and unobstructed portions are detected at the inspection station to obtain electrical signals which are processed.

    Abstract translation: 提供了一种在检查站检查制造部件的方法和系统。 支撑部件围绕测量轴线旋转,使得部件在至少一次旋转扫描期间以预定的角度增量移动。 准直辐射的后侧光束被引导并被第一多个连续运动增量中的每一个被被支撑部分遮挡,以产生快速连续地通过并未被被支撑部分阻挡的背侧光束的无障碍部分的流 。 在第二多个连续运动增量中的每一个上,前方束的辐射被引导并被所支撑的部分反射,从而快速连续地产生前侧梁的反射部分的流。 在检查站检测反射和无障碍部分的流,以获得被处理的电信号。

    RAMAN DETECTING SYSTEM
    222.
    发明申请
    RAMAN DETECTING SYSTEM 有权
    拉曼检测系统

    公开(公告)号:US20150204791A1

    公开(公告)日:2015-07-23

    申请号:US14251838

    申请日:2014-04-14

    CPC classification number: G01N21/658 G01N21/01 G01N2201/02

    Abstract: A Raman detecting system includes a bowl shaped metal nanostructure array configured to load a sample, a projecting module configured to project a beam of light to the bowl shaped metal nanostructure array, and a receiving module configured to collect the light scattered by the bowl shaped metal nanostructure array. The bowl shaped metal nanostructure array includes a substrate having a surface and a number of particle-in-bowl structures located on the surface of the substrate. Each particle-in-bowl structure includes a bowl shaped concave structure and a protruding member protruding from the bowl shaped concave structure. The protruding member is integrated with the bowl shaped concave structure.

    Abstract translation: 一种拉曼检测系统,包括:构造成装载样品的碗形金属纳米结构阵列;配置成将光束投射到碗形金属纳米结构阵列的投影模块;以及接收模块,其被配置为收集由碗状金属 纳米结构阵列。 碗形金属纳米结构阵列包括具有位于基底表面上的表面和多个颗粒在碗结构的基底。 每个碗内碗形结构包括碗形凹形结构和从碗状凹形结构突出的突出构件。 突出部件与碗形凹形结构集成。

    AGGREGATE BOARD, LIGHT EMITTING DEVICE, AND METHOD FOR TESTING LIGHT EMITTING ELEMENT
    224.
    发明申请
    AGGREGATE BOARD, LIGHT EMITTING DEVICE, AND METHOD FOR TESTING LIGHT EMITTING ELEMENT 有权
    聚光板,发光装置和测试发光元件的方法

    公开(公告)号:US20150185137A1

    公开(公告)日:2015-07-02

    申请号:US14579085

    申请日:2014-12-22

    Inventor: Koichi AMARI

    Abstract: An aggregate board, comprising: an insulator having a front face and a rear face; a pair of a first front face wiring pattern and a second front face wiring pattern, a plurality of which are arranged on the front face of the insulator; a pair of a first rear face wiring pattern and a second rear face wiring pattern, a plurality of which are arranged on the rear face of the insulator; at least one first inner layer wiring pattern that is separated from the second front face wiring pattern and the second rear face wiring pattern, that is connected to the first front face wiring pattern and the first rear face wiring pattern, and that extends in a first direction in an interior of the insulator; at least one second inner layer wiring pattern that is separated from the first front face wiring pattern and the first rear face wiring pattern, that is connected to the second front face wiring pattern and the second rear face wiring pattern, and that has a part that extends in a second direction which is different from the first direction, in the interior of the insulator; and the first inner layer wiring pattern and the second inner layer wiring pattern being positioned in the same layer.

    Abstract translation: 一种聚集板,包括:具有前表面和后表面的绝缘体; 一对第一前面布线图案和第二前面布线图案,其多个布置在绝缘体的正面上; 一对第一背面布线图案和第二背面布线图案,多个布置在绝缘体的背面上; 至少一个第一内层布线图案,其与第二正面布线图案和第二背面布线图案分离,该第一内层布线图案与第一正面布线图案和第一背面布线图案相连, 绝缘体内部的方向; 与第一前面布线图案和第一背面布线图案分离的至少一个第二内层布线图案,其连接到第二正面布线图案和第二后面布线图案,并且具有 在绝缘体的内部沿与第一方向不同的第二方向延伸; 并且第一内层布线图案和第二内层布线图案位于同一层中。

    METHOD AND APPARATUS FOR DETECTING POSITION OF LIQUID SURFACE, LIQUID SUPPLY APPARATUS, AND ANALYZING SYSTEM
    227.
    发明申请
    METHOD AND APPARATUS FOR DETECTING POSITION OF LIQUID SURFACE, LIQUID SUPPLY APPARATUS, AND ANALYZING SYSTEM 审中-公开
    用于检测液面位置,液体供应装置和分析系统的方法和装置

    公开(公告)号:US20150160252A1

    公开(公告)日:2015-06-11

    申请号:US14559647

    申请日:2014-12-03

    Inventor: Yoichi Murakami

    Abstract: A method of measuring a position of a liquid surface in a light transmissive container, includes: irradiating a liquid surface with light obliquely so the light is transmitted through an inner wall that comes into contact with liquid and is totally reflected from an inner wall that comes into contact with air in the state in which a light-receiving surface is present on a bottom portion of the container; and detecting a position of a boundary between a dark portion and a bright portion generated by the total reflection on the light-receiving surface.

    Abstract translation: 一种测量透光容器中的液面的位置的方法,包括:使光倾斜地照射液面,使得光透过与液体接触的内壁,并从内壁全反射 在容器的底部存在受光面的状态下与空气接触; 以及检测由受光面上的全反射产生的暗部与亮部之间的边界的位置。

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