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261.
公开(公告)号:US20240068870A1
公开(公告)日:2024-02-29
申请号:US18272256
申请日:2022-01-11
Applicant: Konica Minolta, Inc.
Inventor: Takashi KAWASAKI
CPC classification number: G01J3/2823 , G01J3/18
Abstract: A wavelength of incident light is measured based on signals from a plurality of pixels of a photoelectric conversion element that are arranged in a dispersion direction in which the incident light is dispersed by a spectroscopic section. In correction of a shift in wavelength, a measured amount of shift in wavelength that is a difference between a measured value obtained when an emission line wavelength of incident light from a light source for wavelength shift correction that emits light including an emission line at least one wavelength in a range of wavelengths into which light can be dispersed by the spectroscopic section is measured and an original emission line wavelength is calculated. A reference amount of shift in emission line wavelength is calculated by a polynomial in which a characteristic of a wavelength shift that occurs is represented by a linear or higher polynomial with a variable indicating the wavelength or a parameter relating to the wavelength. Each coefficient of the polynomial is determined based on the calculated measured amount of shift in emission line wavelength and the reference amount of shift in emission line wavelength, and the wavelength of the incident light is corrected based on the determined polynomial.
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262.
公开(公告)号:US20240044710A1
公开(公告)日:2024-02-08
申请号:US18482411
申请日:2023-10-06
Applicant: GIGAPHOTON INC.
Inventor: Natsuhiko KOUNO , Masato MORIYA
Abstract: A deterioration evaluation method of a line sensor includes detecting an interference fringe of pulse laser light using the line sensor; calculating, based on a signal value obtained from each of a plurality of sensor channels included in a sensor channel range being at least a part of the line sensor in accordance with light intensity of the interference fringe, an evaluation value which is an index of deterioration for each of the sensor channels or each group of the sensor channels, and storing the evaluation value in a storage device; and determining a deterioration state of the line sensor based on the evaluation value.
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公开(公告)号:US11874168B2
公开(公告)日:2024-01-16
申请号:US17723815
申请日:2022-04-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sung Hyun Nam , Woo Chang Lee
CPC classification number: G01J3/0275 , G01J3/0202 , G01J3/0229 , G01J3/18
Abstract: A spectrometer includes: a dispersive element configured to split light; a detector comprising a plurality of pixels configured to receive the split light; an optical mask disposed in an optical path of the light between the dispersive element and the detector and comprising a plurality of light transmitting portions and a plurality of light blocking portions which are arranged alternately; and a driver configured to control a position of the optical mask or a position of the detector, and change a light incident area of each of the plurality of pixels to receive the light incident on the plurality of light transmitting portions of the optical mask.
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公开(公告)号:US11867631B2
公开(公告)日:2024-01-09
申请号:US17527828
申请日:2021-11-16
Applicant: OndaVia, Inc.
Inventor: Mark C. Peterman , Merwan Benhabib , Samuel Kleinman
IPC: G01N21/65 , G01N21/47 , G01N21/63 , G01N21/66 , G01N33/18 , G01J3/02 , G01J3/18 , G01J3/44 , B01L3/00 , G01N27/447 , G01N30/60 , G01N21/49 , G01N21/68 , G01N21/27 , G01N30/00 , G01J3/28
CPC classification number: G01N21/65 , B01L3/502715 , B01L3/502761 , G01J3/02 , G01J3/0256 , G01J3/0291 , G01J3/18 , G01J3/44 , G01J3/4412 , G01N21/276 , G01N21/47 , G01N21/4785 , G01N21/49 , G01N21/63 , G01N21/658 , G01N21/66 , G01N21/68 , G01N27/44704 , G01N27/44791 , G01N30/6095 , G01N33/18 , B01L2200/04 , B01L2200/0652 , B01L2200/12 , B01L2300/0627 , B01L2300/0636 , B01L2300/0654 , B01L2300/0681 , B01L2300/087 , B01L2300/0867 , B01L2400/0418 , B01L2400/0421 , G01J2003/2866 , G01J2003/2879 , G01N30/6065 , G01N2021/651 , G01N2021/656 , G01N2030/0095 , G01N2201/0221 , G01N2201/13
Abstract: A hand-held microfluidic testing device is provided that includes a housing having a cartridge receiving port, a cartridge for input to the cartridge receiving port having a sample input and a channel, where the channel includes a mixture of Raman-scattering nanoparticles and a calibration solution, where the calibration solution includes chemical compounds capable of interacting with a sample under test input to the cartridge and the Raman-scattering nanoparticles, and an optical detection system in the housing, where the optical detection system is capable of providing an illuminated electric field, where the illuminating electric field is capable of being used for Raman spectroscopy with the Raman-scattering nanoparticles and the calibration solution to analyze the sample under test input to the cartridge.
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公开(公告)号:US11860122B2
公开(公告)日:2024-01-02
申请号:US18098060
申请日:2023-01-17
Applicant: Life Technologies Corporation
Inventor: Shaohong Wang
IPC: G01J3/44 , G01N27/447 , G01J3/02 , G01J3/18
CPC classification number: G01N27/44721 , G01J3/0208 , G01J3/0218 , G01J3/0289 , G01J3/0294 , G01J3/18 , G01J3/4406 , G01N27/44791
Abstract: A system for separating biological molecules includes a plurality of capillaries, a capillary mount, a plurality of optical fibers, a fiber mount, an optical detector, and a motion stage. The plurality of capillaries are configured to separate biological molecules in a sample. Each capillary comprising a detection portion configured to pass electromagnetic radiation into the capillary. The plurality of capillaries are coupled to the capillary mount such that the detection portions are fixedly located relative to one another. Each optical fiber includes a receiving end to receive emissions. The optical fibers are coupled to the fiber mount such that the receiving ends of the optical fibers are fixedly located relative to one another. The optical detector is configured to produce an alignment signal. The motion stage is configured to align the receiving ends of the optical fibers to the detection portions based on values of the alignment signal.
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公开(公告)号:US11841270B1
公开(公告)日:2023-12-12
申请号:US17824614
申请日:2022-05-25
Applicant: VisEra Technologies Company Ltd.
Inventor: Lai-Hung Lai , Hsin-Yi Hsieh , Chin-Chuan Hsieh
CPC classification number: G01J3/2823 , G01J3/0208 , G01J3/18 , G02B6/42 , G02B6/4215 , G02B27/30 , H01L27/14625 , H10K39/32
Abstract: The spectrometer includes a lightguide substrate, an upper grating layer, a lower grating layer, an image sensor, and a readout circuit. The upper grating layer is disposed on the lightguide substrate and configured to receive a light. The upper grating layer includes a first grating structure, a second grating structure, and a third grating structure, and the first, second, and third grating structures have different grating periods. The lightguide substrate is configured to diffract the light when the light propagates into the lightguide substrate, such that multiple diffraction lights are formed and each of the multiple diffraction lights has different wavelengths and different optical path. The lower grating layer is disposed under the lightguide substrate and configured to emit the multiple diffraction lights. The image sensor is disposed under the lower grating layer. The readout circuit is disposed under the image sensor.
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公开(公告)号:US11796390B2
公开(公告)日:2023-10-24
申请号:US17856660
申请日:2022-07-01
Applicant: KLA Corporation
Inventor: Tianhan Wang , Aaron Rosenberg , Dawei Hu , Alexander Kuznetsov , Manh Dang Nguyen , Stilian Pandev , John Lesoine , Qiang Zhao , Liequan Lee , Houssam Chouaib , Ming Di , Torsten R. Kaack , Andrei V. Shchegrov , Zhengquan Tan
CPC classification number: G01J3/18 , G01J3/28 , G01N21/21 , G01N21/25 , G01N21/55 , G01N21/8422 , G01N21/8851 , G01N21/956 , G01J2003/2836 , G01N2021/8883
Abstract: A spectroscopic metrology system includes a spectroscopic metrology tool and a controller. The controller generates a model of a multilayer grating including two or more layers, the model including geometric parameters indicative of a geometry of a test layer of the multilayer grating and dispersion parameters indicative of a dispersion of the test layer. The controller further receives a spectroscopic signal of a fabricated multilayer grating corresponding to the modeled multilayer grating from the spectroscopic metrology tool. The controller further determines values of the one or more parameters of the modeled multilayer grating providing a simulated spectroscopic signal corresponding to the measured spectroscopic signal within a selected tolerance. The controller further predicts a bandgap of the test layer of the fabricated multilayer grating based on the determined values of the one or more parameters of the test layer of the fabricated structure.
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公开(公告)号:US20230324303A1
公开(公告)日:2023-10-12
申请号:US17715862
申请日:2022-04-07
Applicant: Onto Innovation Inc.
Inventor: George Andrew ANTONELLI
CPC classification number: G01N21/65 , G01J3/4412 , G01J3/0208 , G01J3/10 , G02B27/141 , G01J3/0224 , G01J3/18
Abstract: An optical metrology device performs multi-wavelength polarized confocal Raman spectroscopy. The optical metrology device uses a first light source to produce a first light beam with a first wavelength and a second light source to produce a second light beam with a second wavelength. A dichroic beam splitter partially reflects the first light beam and transmits the second light beam to combine the light beams along a same optical axis that is incident on a sample. The dichroic beam splitter directs the Raman response emitted from the sample in response to the first light beam and the second light beam together towards at least one spectrometer and directs the first light beam away from the at least one spectrometer. A chopper may be used to isolate the Raman response to the first and second light beams that is received and spectrally measured by the at least one spectrometer.
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公开(公告)号:US11781909B2
公开(公告)日:2023-10-10
申请号:US17684603
申请日:2022-03-02
Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Inventor: Matthew Meyer , Francis Deck
CPC classification number: G01J3/0202 , G01J3/021 , G01J3/0208 , G01J3/0237 , G01J3/18
Abstract: An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.
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270.
公开(公告)号:US20230314795A1
公开(公告)日:2023-10-05
申请号:US17760583
申请日:2020-12-19
Applicant: SOOCHOW UNIVERSITY
Inventor: Jian BAO , Qiuyang SHEN , Xinhua CHEN , Weimin SHEN
CPC classification number: G02B27/0012 , G01J3/14 , G01J3/18 , G01J3/2823 , G01J2003/1208
Abstract: The invention discloses a design method of a wavenumber linearity dispersion optical system and an imaging spectrometer, including: building an optical system including a grating, a prism and an objective lens that are sequentially arranged, the grating adjoins the prism; defining a linearity evaluation coefficient RMS; assigning a minimum value to the linearity evaluation coefficient RMS through adjustment to the vertex angle of the prism, when the linearity evaluation coefficient RMS is at minimum, the vertex angle of the prism being α1; acquiring compensations for distortion and longitudinal chromatic aberration of the objective lens based on the interval between equal-difference wavenumbers on the image plane when the vertex angle of the prism is α1; and optimizing the objective lens based on the compensations for distortion and longitudinal chromatic aberration of the objective lens to obtain an optimized optical system. Higher wavenumber linearity can be achieved through objective-lens-aberration compensated wavenumber linearity.
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