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    Measurement of sample reflectance
    271.
    发明申请
    Measurement of sample reflectance 有权
    样品反射率的测量

    公开(公告)号：US20050185185A1

    公开(公告)日：2005-08-25

    申请号：US11040535

    申请日：2005-01-21

    Applicant: Robert Hoult ,  Paul Evetts

    Inventor： Robert Hoult ,  Paul Evetts

    IPC: G01J3/42 ,  G01N21/55 ,  G01J3/28

    CPC classification number: G01N21/55 ,  G01J3/0202 ,  G01J3/021 ,  G01J3/0237 ,  G01J3/0291 ,  G01J3/42

    Abstract: An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate.

    Abstract translation: 用于进行样品镜面反射率测量的光谱仪附件。 附件被设计成使得所有部件可以位于壳体中，并且样品可以水平地定位在壳体的顶板上，并且部件设置在该板的平面之下。

    Process measuring point
    274.
    发明申请
    Process measuring point 有权
    过程测量点

    公开(公告)号：US20050046838A1

    公开(公告)日：2005-03-03

    申请号：US10481402

    申请日：2002-06-25

    Applicant: Detlev Wittmer ,  Wolfgang Babel

    Inventor： Detlev Wittmer ,  Wolfgang Babel

    IPC: G01J3/18 ,  G01J3/02 ,  G01N21/27 ,  G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0291

    Abstract: A process for measuring a point comprising at least one spectrometer and a measuring transducer connected thereto for picking up, processing and forwarding measuring signals from the spectrometer, the spectrometer being arranged in an armature for introduction into a process or a process fluid and the data produced by the spectrometer is used to control a process. The armature comprises a housing for receiving the spectrometer and for securing the armature to a process container containing process fluid and a sensor holder with an inbuilt sensor, interacting with the spectrometer and which is guided in an axially displaceable manner in the armature, whereby the sensor holder protrudes into the process fluid in an extended state.

    Abstract translation: 一种用于测量包括至少一个光谱仪和连接到其上的测量传感器的点的过程，用于从光谱仪拾取，处理和转发测量信号，光谱仪布置在衔铁中以引入过程或过程流体，并且产生的数据 由光谱仪用来控制一个过程。 电枢包括用于接收光谱仪并用于将电枢固定到容纳处理流体的处理容器和具有内置传感器的传感器保持器的壳体，其与光谱仪相互作用并且以可轴向移动的方式被引导到电枢中，由此传感器 支架以伸展状态突出到工艺流体中。

    Method and apparatus for detecting embedded rebar within an interaction region of a structure irradiated with laser
    276.
    发明申请
    Method and apparatus for detecting embedded rebar within an interaction region of a structure irradiated with laser 失效
    在用激光照射的结构的相互作用区域内检测嵌入钢筋的方法和装置

    公开(公告)号：US20040182999A1

    公开(公告)日：2004-09-23

    申请号：US10803267

    申请日：2004-03-18

    Inventor： Paul E. Denney ,  Jay R. Eastman ,  Ta-Chieh Huang

    IPC: G01J003/28 ,  G11B011/00

    CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/034 ,  B23K26/043 ,  B23K26/12 ,  B23K26/123 ,  B23K26/128 ,  B23K26/142 ,  B23K26/16 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0291 ,  G01J3/28

    Abstract: A detection system is used during irradiation of an interaction region of a structure including embedded material with laser light. The detection system includes a collimating lens positioned to receive light emitted from the interaction region. The detection system further includes an optical fiber optically coupled to the collimating lens and a spectrometer optically coupled to the optical fiber. The spectrometer is adapted for analysis of the light for indications of the embedded material within the interaction region. The spectrometer includes an input slit adapted to receive light from the optical fiber. The input slit has a width selected to provide sufficient light transmittance and sufficient resolution. The spectrometer further includes an optical grating adapted to receive light from the input slit and to separate the light into a spectrum of wavelengths. The spectrometer further includes a collection lens adapted to receive a selected range of wavelengths of the separated light from the optical grating. The spectrometer further includes a light sensor adapted to receive the selected range of wavelengths and to generate a signal corresponding to an intensity of the received light.

    Abstract translation: 在包括具有激光的嵌入材料的结构的相互作用区域的照射期间使用检测系统。 检测系统包括准直透镜，定位成接收从相互作用区域发出的光。 检测系统还包括光学耦合到准直透镜的光纤和光学耦合到光纤的光谱仪。 光谱仪适用于分析相互作用区域内的嵌入材料的光的光。 光谱仪包括适于接收来自光纤的光的输入狭缝。 输入狭缝具有选择的宽度以提供足够的透光率和足够的分辨率。 光谱仪还包括适于接收来自输入狭缝的光并将光分离成波长范围的光栅。 光谱仪还包括适于接收来自光栅的分离光的选定波长范围的收集透镜。 光谱仪还包括适于接收所选择的波长范围并且产生对应于所接收的光的强度的信号的光传感器。

    Colorimeter
    277.
    发明授权
    Colorimeter 有权
    色度计

    公开(公告)号：US06784995B2

    公开(公告)日：2004-08-31

    申请号：US10251426

    申请日：2002-09-20

    Applicant: Cormic K. Merle ,  Leonardo C. Gonzales, II

    Inventor： Cormic K. Merle ,  Leonardo C. Gonzales, II

    IPC: G01J346

    CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0291 ,  G01J3/46

    Abstract: A colorimeter for measuring a color of light includes a color sensing device, a hanging means, and a means for reducing color distortion. The hanging means hangs the color sensing device in an operative relationship relative to a color producing device. The means for reducing color distortion reduces color distortion on the color producing device while the color sensing device is in the operative relationship relative to the color producing device.

    Abstract translation: 用于测量光的颜色的比色计包括颜色感测装置，悬挂装置和用于减少颜色失真的装置。 悬挂装置将颜色感测装置悬挂在与生色装置相关的操作关系中。 用于减少颜色失真的方法减少了彩色感应装置相对于彩色产生装置处于操作关系的颜色产生装置上的色彩失真。

    Handy internal quality inspection instrument
    278.
    发明申请
    Handy internal quality inspection instrument 审中-公开
    方便内部质量检测仪器

    公开(公告)号：US20040130720A1

    公开(公告)日：2004-07-08

    申请号：US10475472

    申请日：2003-10-21

    Inventor： Hiromu Maeda ,  Toshihiro Mizuno

    IPC: G01J003/28 ,  G01N021/25

    CPC classification number: G01N21/3563 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0221 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/26 ,  G01J3/2803 ,  G01N33/025 ,  G01N2021/317 ,  G01N2021/8466 ,  G01N2201/0221 ,  G01N2201/08 ,  G01N2201/0826 ,  G01N2201/084

    Abstract: A compact handy type inspection instrument is provided for conducting readily nondestructive inspection of an inspection object in any working site. The inspection instrument comprises a spectroscope assembly containing an optical fiber-arranging member for arranging and holding a light-outputting end of an optical fiber bundle to be flat in a uniform layer thickness, a packaged compact spectroscope which is enclosed in a package having a slit-shaped light inlet window on a side confronting the rectilinear light-outputting end of the optical fiber-arranging member and is constituted of linear type continuous variable interference filter, a microlens array, and a linear type silicon array sensor assembled in the named order from the side of the light inlet window toward the opposite side, and a positioning device for positioning the rectilinear light-outputting end of the optical fiber bundle to fit to the light input window; and a detection head; incorporated together into a main body casing.

    Abstract translation: 提供了一种紧凑便携式检测仪器，用于在任何工作现场进行检查对象的非破坏性检查。 该检查仪器包括一个分光计组件，该分光镜组件包含用于将光纤束的光输出端布置并保持为均匀层厚度的平坦的光纤排列构件，封装在具有狭缝的封装中的封装的小型分光镜 形状的光入口窗在与光纤排列构件的直线光输出端相对的一侧上，由线性型连续可变干涉滤光器，微透镜阵列和线性硅阵列传感器构成，该传感器以命名顺序从 光入口窗侧朝向相反侧;以及定位装置，用于将光纤束的直线光输出端定位成适合于光输入窗; 和检测头; 并入到主体外壳中。

    Spectral instrument using multiple non-interfering optical beam paths and elements for use therewith
    280.
    发明授权
    Spectral instrument using multiple non-interfering optical beam paths and elements for use therewith 失效

    公开(公告)号：US06714298B2

    公开(公告)日：2004-03-30

    申请号：US09728247

    申请日：2000-11-30

    Applicant: Damond V. Ryer

    Inventor： Damond V. Ryer

    IPC: G01J318

    CPC classification number: G01J3/28 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0291 ,  G01J3/06 ,  G01J3/12 ,  G01J3/18 ,  G01J2003/1828

    Abstract: A spectrometer, or a spectral instrument using multiple non-interfering optical beam paths and special optical elements. The special optical elements for use with the instrument are used for directing the optical beam and/or altering the form of the beam. The instrument has the potential, depending upon the totality of the optical components incorporated into the instrument, to be a monochromator, a spectroradiometer, a spectrophotometer and a spectral source. The spectral instrument may further be a part of the spectral system. The system may include the spectral instrument, a power module and means for remote control of the instrument. Such remote control may be by use of a personal computer or a control system dedicated to the control, measurement and analysis of the collected information. The multiple non-interfering beam paths are created using specially designed optical elements such as a diffraction grating, a splitter box, a zero back-lash drive system for movement of the grating element. The orientation of and a physical/spatial relationship between the field lenses, slits, return mirror, reflecting prism, turning lenses all define the multiple, preferably two paths. Particularly, there is a double pass through the grating to increase dispersion, reduce scatter while maintaining a perfect temperature independent spectral match for the second pass. Using the same grating twice reduces scatter by about a factor of 1000, increases the dispersion by a factor of two, and eliminates any temperature-related mechanical spectral drift which often is present with two separate monochromators. Because of the specially designed grating structure, the grating can cause the concurrent diffraction of a plurality of incident optical beams, each of which beams have different angles of incidence and different angles of reflection. The path of the incident and the reflected beam to and from the grating is “off-axis”. That is, the beams going to and from the grating do not use the optical axis of the grating structure.

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