Abstract:
A method is disclosed for forming an array of focusing elements for use in a lithography system. In accordance with an embodiment, the method includes the steps of providing a master element that includes at least one diffractive pattern at a first location with respect to a target surface, illuminating the master element to produce a first diffractive pattern on the target surface at the first location, moving the master element with respect to the target surface to a second location with respect to the target surface, and illuminating the master element to produce a second diffractive pattern on the target surface at the second location.
Abstract:
A maskless lithography system is disclosed that includes a spatial light modulator, first and second imaging areas, and first folding optics. The spatial light modulator receives illumination from an illumination source and provides a modulated illumination beam having a first cross-sectional line length in a length-wise direction and a first cross-sectional width in a width-wise direction that is substantially smaller than said first cross-sectional length. The first imaging area receives a first portion of the modulated illumination beam. The first folding optics provides a second portion of the modulated illumination beam that is adjacent the first portion of the modulated illumination beam in the length-wise direction at a second imaging area that is not adjacent the first imaging area in the length-wise direction.
Abstract:
A maskless lithography system is disclosed that includes an array of blazed diffractive zone plates, each of which focuses an energy beam into an array of images in order to create a permanent pattern on an adjacent substrate in certain embodiments. In further embodiments, an array of apodized diffractive elements may also be used.
Abstract:
A system and method are disclosed for providing error correction in an imaging system. The system includes an error determination unit for determining an amount of error associated with a spot at (x,y) in a binary pattern to be imaged, a determination unit for determining the location of a nearest exposed spot at (xi, yi) for each spot at (x,y), and a dose modification unit for modifying an exposure dose at the nearest exposed spot at (xi, yi) for each spot at (x,y).
Abstract:
An optical manipulation system is disclosed that includes an array of focusing elements, which focuses the energy beamlets from an array of beamlet sources into an array of focal spots in order to individually manipulate a plurality of samples on an adjacent substrate.
Abstract:
An apparatus to display virtual reality scenes is provided. The apparatus may include a display to emit visible light. A flat lens may be optically coupled to the display, where a focal length of the flat lens for at least a portion of the visible light is not more than 20 millimeters.
Abstract:
Methods and apparatus for combining or separating spectral components by means of a polychromat. A polychromat is employed to combine a plurality of beams, each derived from a separate source, into a single output beam, thereby providing for definition of one or more of the intensity, color, color uniformity, divergence angle, degree of collimation, polarization, focus, or beam waist of the output beam. The combination of sources and polychromat may serve as an enhanced-privacy display and to multiplex signals of multiple spectral components. In other embodiments of the invention, a polychromat serves to disperse spectral components for spectroscopic or de-multiplexing applications.
Abstract:
An imaging system is provided. The imaging system includes a point spread function (PSF) module producing a diffraction-limited image of a sample. A convolution module performs convolution of the diffraction-limited image with a first image of a focal spot having a first wavelength to produce a first simulated image. The convolution also performs convolution of the diffraction-limited image with a second image of a focal ring having a second wavelength to produce a second simulated image. A difference module subtracts said first simulated image and said second simulated image to produce said high resolution composite image.
Abstract:
A method to enhance resolution in optical lithography via absorbance-modulation involves exposing an opaque absorbance modulation layer (AML) to a first waveform having wavelength, 81, with the first exposure forming a first set of transparent regions in the opaque AML and forming a first pattern made of a set of exposed regions in a photoresist layer. Next, the AML is restored to its original opaque state. Next, the restored AML is re-exposed to the first waveform having wavelength, 81, with the exposure forming a second set of transparent regions in the opaque AML and forming a second pattern having a set of exposed regions in a photoresist layer. The first and second patterns in the photoresist layer form a final pattern with enhanced resolution and decreased spatial period than the first pattern. In another scenario, instead of exposing the AML to a first waveform, two waveforms are used (the second being complimentary to the first) to ensure that the transmitted image has sharper edges compared to the original image.
Abstract:
A lithography system is disclosed that includes an array of focusing elements for directing focused illumination toward a recording medium, and a reversible contrast-enhancement material disposed between the recording medium and the array of focusing elements.