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公开(公告)号:US20160216731A1
公开(公告)日:2016-07-28
申请号:US14604531
申请日:2015-01-23
Applicant: Intel Corporation
Inventor: Eng Huat Goh , Khai Ern See , Damien Weng Kong Chong , Min Suet Lim , Ping Ping Ooi , Chu Aun Lim , Jimmy Huat Since Huang , Poh Tat Oh , Teong Keat Beh , Jackson Chung Peng Kong , Fern Nee Tan , Jenn Chuan Cheng
CPC classification number: G06F1/163 , G06F1/16 , G06F1/1656 , G06F1/187 , G06F13/38 , H01L2224/16225 , H01L2224/48091 , H01L2224/73204 , H01L2924/181 , H01L2924/00014 , H01L2924/00012
Abstract: Embodiments are generally directed to an apparatus utilizing computer on package construction. An embodiment of a computer includes a substrate; one or more semiconductor devices, the one or more semiconductor devices being direct chip attached to the substrate, the one or more semiconductor devices including a central processing unit (CPU); and one or more additional components installed on the substrate, wherein the computer excludes I/O components.
Abstract translation: 实施例一般涉及利用计算机在包装结构上的装置。 计算机的一个实施例包括基板; 一个或多个半导体器件,所述一个或多个半导体器件是直接芯片附着到所述衬底,所述一个或多个半导体器件包括中央处理单元(CPU); 以及安装在基板上的一个或多个附加部件,其中计算机不包括I / O部件。
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公开(公告)号:US12002793B2
公开(公告)日:2024-06-04
申请号:US17392189
申请日:2021-08-02
Applicant: Intel Corporation
Inventor: Eng Huat Goh , Wee Hoe , Khang Choong Yong , Ping Ping Ooi
IPC: H05K1/02 , G06F1/16 , G06F1/20 , H01L23/31 , H01L23/48 , H01L23/538 , H01L25/00 , H01L25/065 , H01L25/16 , H01L25/18 , H05K1/14 , H05K1/18 , H05K3/00 , H05K3/02 , H05K3/30 , H05K7/06 , H05K7/20
CPC classification number: H01L25/16 , H01L23/48 , H01L23/5386 , H01L25/065 , H01L25/18 , H01L25/50 , H05K1/144 , H05K1/147 , H05K1/181 , H05K3/303 , H01L2924/1432 , H01L2924/15311 , H01L2924/15313 , H01L2924/19042 , H01L2924/19106 , H05K2201/048 , H05K2201/055 , H05K2201/1003 , H05K2201/10098 , H05K2201/10151 , H05K2201/10159 , H05K2201/10356 , H05K2201/10522 , H05K2201/10545 , H05K2201/10704 , H05K2201/10719 , H05K2201/10734
Abstract: Methods and apparatus relating to integrating System in Package (SiP) with Input/Output (IO) board for platform miniaturization are described. In an embodiment, a SiP board includes a plurality of logic components. An IO board is coupled to the SiP board via a grid array. The plurality of logic components is provided on both sides of the SiP board and one or more of the plurality of logic components are to positioned in an opening in the IO board. Other embodiments are also disclosed and claimed.
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公开(公告)号:US20230048835A1
公开(公告)日:2023-02-16
申请号:US17975223
申请日:2022-10-27
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Jackson Chung Peng Kong , Jenny Shio Yin Ong , Ping Ping Ooi , Seok Ling Lim
IPC: H01L23/538 , H01L21/56 , H01L23/31 , H01L23/00 , H01L25/065 , H01L25/00
Abstract: Disclosed embodiments include composite-bridge die-to-die interconnects that are on a die side of an integrated-circuit package substrate and that contacts two IC dice and a passive device that is in a molding material, where the molding material also contacts the two IC dice.
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公开(公告)号:US11521932B2
公开(公告)日:2022-12-06
申请号:US17025990
申请日:2020-09-18
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Jackson Chung Peng Kong , Jenny Shio Yin Ong , Ping Ping Ooi , Seok Ling Lim
IPC: H01L23/538 , H01L21/56 , H01L23/31 , H01L23/00 , H01L25/065 , H01L25/00
Abstract: Disclosed embodiments include composite-bridge die-to-die interconnects that are on a die side of an integrated-circuit package substrate and that contacts two IC dice and a passive device that is in a molding material, where the molding material also contacts the two IC dice.
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公开(公告)号:US11355458B2
公开(公告)日:2022-06-07
申请号:US16469073
申请日:2017-11-27
Applicant: Intel Corporation
Inventor: Jackson Chung Peng Kong , Bok Eng Cheah , Ping Ping Ooi , Kooi Chi Ooi
IPC: H01L23/64 , H01L21/48 , H01L23/498 , H01L23/00
Abstract: A device and method of utilizing conductive thread interconnect cores. Substrates using conductive thread interconnect cores are shown. Methods of creating a conductive thread interconnect core are shown.
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公开(公告)号:US20210183776A1
公开(公告)日:2021-06-17
申请号:US17025990
申请日:2020-09-18
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Jackson Chung Peng Kong , Jenny Shio Yin Ong , Ping Ping Ooi , Seok Ling Lim
IPC: H01L23/538 , H01L23/31 , H01L23/00 , H01L25/065 , H01L25/00 , H01L21/56
Abstract: Disclosed embodiments include composite-bridge die-to-die interconnects that are on a die side of an integrated-circuit package substrate and that contacts two IC dice and a passive device that is in a molding material, where the molding material also contacts the two IC dice.
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公开(公告)号:US10916524B2
公开(公告)日:2021-02-09
申请号:US16473570
申请日:2017-11-29
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Jackson Chung Peng Kong , Kooi Chi Ooi , Ping Ping Ooi
IPC: H01L25/065 , H01L23/00 , H01L23/48 , H01L27/06 , H01L27/08
Abstract: Discussed generally herein are devices that can include multiple stacked dice electrically coupled to dice electrically coupled to a peripheral sidewall of the stacked dice and/or a dice stack electrically coupled to a passive die. In one or more embodiments a device can include a dice stack comprising at least two dice including a first die and a second die, the first die electrically connected to and on a second die, a first side pad on, or at least partially in, a first sidewall of the dice stack, a third die electrically connected to the first die at a first surface of the third die and through the first side pad, and a fourth die electrically connected to the third die at a second surface of the first die, the second side opposite the first side.
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公开(公告)号:US20200027813A1
公开(公告)日:2020-01-23
申请号:US16453605
申请日:2019-06-26
Applicant: Intel Corporation
Inventor: Bok Eng Cheah , Jackson Chung Peng Kong , Kooi Chi Ooi , Ping Ping Ooi
IPC: H01L23/367 , H01L23/373 , H01L23/552
Abstract: Described herein are microelectronics packages and methods for manufacturing the same. The microelectronics package may include a base package, an ancillary package, and an electrically isolated metal layer. The base package may include a base die. The ancillary package may include an ancillary component. The ancillary package may be located on top of the base package. The electrically isolated metal layer may be located at least partially within a layer of the base package such that a portion of the electrically isolated metal layer contacts at least one surface of the base die and is located in between the base die and the ancillary component.
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公开(公告)号:US10541200B2
公开(公告)日:2020-01-21
申请号:US15982912
申请日:2018-05-17
Applicant: Intel Corporation
Inventor: Ping Ping Ooi , Bok Eng Cheah , Jackson Chung Peng Kong , Mooi Ling Chang , Wen Wei Lum
IPC: H01L23/522 , H01L23/528 , H01L23/538 , H01L23/367 , H01L23/50
Abstract: Over-molded IC package assemblies including an embedded voltage reference plane and/or heat spreader. In some embodiments, an over-molded package assembly includes a IC chip or die coupled to one or more metal distribution layer or package substrate. A molding compound encapsulates at least the IC chip and one or more conductive layers are embedded within the molding compound. The conductive layers may include an interior portion located over the IC chip and a peripheral portion located over the redistribution layers or package substrate. The interior portion may comprise one or more heat conductive features, which may physically contact a surface of the IC chip. In some further embodiments, the peripheral portion comprises one or more electrically conductive features, which may physically contact a surface of the package redistribution layers or package substrate to convey a reference voltage. One or more conductive traces may connect the conductive features in the interior with conductive features in the periphery.
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公开(公告)号:US20190355681A1
公开(公告)日:2019-11-21
申请号:US16473962
申请日:2017-12-19
Applicant: Intel Corporation
Inventor: Jackson Chung Peng Kong , Bok Eng Cheah , Ping Ping Ooi , Kooi Chi Ooi
IPC: H01L23/66 , H01L23/498 , H01L21/48
Abstract: An electronic circuit including a substrate having a first dielectric characteristic. The substrate can include a first side and a second side. An intermediary material can be disposed within the substrate. For instance, the intermediary material can be located between the first side and the second side. The intermediary material can include a second dielectric characteristic, where the second dielectric characteristic is different than the first dielectric characteristic. A first conductive layer can be disposed on the first side, and a second conductive layer can be disposed on the second side. A conductive path can be electrically coupled between the first conductive layer and the second conductive layer. The conductive path can be in contact with at least a portion of the intermediary material.
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