Multiple discrete analyzer test apparatus and method
    21.
    发明授权
    Multiple discrete analyzer test apparatus and method 失效
    多元离散分析仪测试仪器及方法

    公开(公告)号:US5369484A

    公开(公告)日:1994-11-29

    申请号:US973956

    申请日:1992-11-09

    Abstract: A computer based system for testing an optical monitoring system includes a program having program instruction and optical monitoring system parameters, for implementing a plurality of tests of an optical monitoring system. A computer includes at least one processor for executing the program instructions, storage components for storing program instructions and test data, including the optical system parameters, a user input for inputting commands, and a display for displaying a menu of available test commands, test results and other data. An interface is provided for interfacing the optical monitoring system to tile computer for exchange of control and data signals. A fixture is provided for mounting the optical monitoring system during testing.

    Abstract translation: 用于测试光学监测系统的基于计算机的系统包括具有程序指令和光学监测系统参数的程序,用于实现光学监测系统的多个测试。 计算机包括用于执行程序指令的至少一个处理器,用于存储程序指令和测试数据的存储组件,包括光学系统参数,用于输入命令的用户输入和用于显示可用测试命令的菜单的显示,测试结果 和其他数据。 提供了用于将光学监控系统连接到瓦片计算机以用于交换控制和数据信号的接口。 提供固定装置,用于在测试期间安装光学监测系统。

    TESTING AN ARC DETECTING SYSTEM
    22.
    发明公开

    公开(公告)号:US20240319004A1

    公开(公告)日:2024-09-26

    申请号:US18574100

    申请日:2022-05-13

    Applicant: ABB Schweiz AG

    CPC classification number: G01J1/08 G01J2001/083

    Abstract: A testing arrangement is provided for an arc detecting system that includes at least one optical detector at a piece of electric equipment, where the testing arrangement includes at least one light source and a testing unit, where the testing unit is configured to control the light source to emit a test light to the optical detector with steps of increasing luminance starting from a minimum test level and continuing towards a maximum test level, investigate if the optical detector detects the emitted test light and determine that the arc detecting system is operational if the optical detector is able to detect the test light at any of the used test levels.

    METHOD AND SYSTEM FOR PERFORMING TESTING OF PHOTONIC DEVICES
    25.
    发明申请
    METHOD AND SYSTEM FOR PERFORMING TESTING OF PHOTONIC DEVICES 审中-公开
    执行光电器件测试的方法和系统

    公开(公告)号:US20160161333A1

    公开(公告)日:2016-06-09

    申请号:US14964144

    申请日:2015-12-09

    Abstract: A photonics system includes a transmit photonics module and a receive photonics module. The photonics system also includes a transmit waveguide coupled to the transmit photonics module, a first optical switch integrated with the transmit waveguide, and a diagnostics waveguide optically coupled to the first optical switch. The photonics system further includes a receive waveguide coupled to the receive photonics module and a second optical switch integrated with the receive waveguide and optically coupled to the diagnostics waveguide.

    Abstract translation: 光子系统包括发射光子模块和接收光子模块。 光子系统还包括耦合到发射光子模块的发射波导,与发射波导集成的第一光开关,以及光耦合到第一光开关的诊断波导。 光子系统还包括耦合到接收光子模块的接收波导和与接收波导集成并与光学耦合到诊断波导的第二光开关。

    SEMICONDUCTOR INTEGRATED DEVICE FOR UV-INDEX DETECTION AND RELATED CALIBRATION SYSTEM AND METHOD
    26.
    发明申请
    SEMICONDUCTOR INTEGRATED DEVICE FOR UV-INDEX DETECTION AND RELATED CALIBRATION SYSTEM AND METHOD 有权
    用于UV指示检测的半导体集成器件及相关校准系统及方法

    公开(公告)号:US20150346025A1

    公开(公告)日:2015-12-03

    申请号:US14669593

    申请日:2015-03-26

    Abstract: An integrated device for detection of the UV-index is provided with: a photodetector, which generates a detection quantity as a function of a detected UV radiation; and a processing stage, which is coupled to the photodetector and supplies at output a detected value of the UV-index, on the basis of the detection quantity. The processing stage processes the detection quantity on the basis of an adjustment factor, to supply at output the detected value of the UV-index and is further provided with an adjustment stage, coupled to the processing stage for adjusting the value of the adjustment factor.

    Abstract translation: 提供了一种用于检测UV指数的集成装置:光电检测器,其产生作为检测到的UV辐射的函数的检测量; 以及处理级,其耦合到光电检测器,并且基于检测量在输出时提供UV指数的检测值。 处理阶段基于调整因子处理检测量,在输出时提供UV指标的检测值,并进一步具有调整级,耦合到处理级,用于调整调整因子的值。

    LIGHT SENSING SYSTEM, AND METHOD FOR CALIBRATING A LIGHT SENSING DEVICE
    27.
    发明申请
    LIGHT SENSING SYSTEM, AND METHOD FOR CALIBRATING A LIGHT SENSING DEVICE 有权
    光感测系统和用于校准光感测装置的方法

    公开(公告)号:US20150338271A1

    公开(公告)日:2015-11-26

    申请号:US14648924

    申请日:2013-11-25

    CPC classification number: G01J1/08 G01J1/4204 G01J2001/083

    Abstract: The present invention relates to a light sensing system for sensing ambient light intensity, comprising a light sensing device with at least one light sensor and a calibration device for calibrating the sensor. The calibration device comprises at least one light source that emits light with a standard intensity. The invention is further related to a corresponding method for calibrating a light sensing device, comprising the illumination of the light sensor of the light sensing device with light that has a standard intensity, the comparison of the output intensity signal of the sensor with an expected signal that corresponds to the standard intensity, and the matching of the output intensity signal of the sensor to the expected signal by adjusting a gain parameter of the sensor.

    Abstract translation: 本发明涉及一种用于感测环境光强度的光感测系统,包括具有至少一个光传感器的光感测装置和用于校准传感器的校准装置。 校准装置包括发射具有标准强度的光的至少一个光源。 本发明还涉及用于校准光感测装置的相应方法,包括用具有标准强度的光照射光感测装置的光传感器,将传感器的输出强度信号与预期信号进行比较 对应于标准强度,以及通过调节传感器的增益参数,将传感器的输出强度信号与预期信号进行匹配。

    WAFER LEVEL TESTING OF OPTICAL DEVICES
    28.
    发明申请
    WAFER LEVEL TESTING OF OPTICAL DEVICES 有权
    光学器件的水平测试

    公开(公告)号:US20140111793A1

    公开(公告)日:2014-04-24

    申请号:US13694047

    申请日:2012-10-22

    Abstract: A wafer includes multiple optical devices that each includes one or more optical components. The optical components include light-generating components that each generates a light signal in response to application of electrical energy to the light-generating component from electronics that are external to the wafer. The optical components also include receiver components that each outputs an electrical signal in response to receipt of light. The wafer also includes testing waveguides that each extends from within a boundary of one of the optical devices across the boundary of the optical device and also provides optical communication between a first portion of the optical components and a second portion of the optical components. The first portion of the optical components includes one or more of the light-generating components and the second portion of the optical components include one or more of the receiver components.

    Abstract translation: 晶片包括多个光学器件,每个光学器件包括一个或多个光学部件。 光学部件包括发光部件,每个发光部件响应于从晶片外部的电子器件向发光部件施加电能而产生光信号。 光学部件还包括响应于光的接收而输出电信号的接收器部件。 晶片还包括测试波导,每个波导从光学器件中的一个光学器件的边界内延伸穿过光学器件的边界,并且还提供光学部件的第一部分和光学部件的第二部分之间的光学连通。 光学部件的第一部分包括一个或多个发光部件,并且光学部件的第二部分包括一个或多个接收器部件。

    METHOD AND SYSTEM FOR PERFORMING TESTING OF PHOTONIC DEVICES
    29.
    发明申请
    METHOD AND SYSTEM FOR PERFORMING TESTING OF PHOTONIC DEVICES 有权
    执行光电器件测试的方法和系统

    公开(公告)号:US20140043050A1

    公开(公告)日:2014-02-13

    申请号:US13959166

    申请日:2013-08-05

    Abstract: A photonics system includes a transmit photonics module and a receive photonics module. The photonics system also includes a transmit waveguide coupled to the transmit photonics module, a first optical switch integrated with the transmit waveguide, and a diagnostics waveguide optically coupled to the first optical switch. The photonics system further includes a receive waveguide coupled to the receive photonics module and a second optical switch integrated with the receive waveguide and optically coupled to the diagnostics waveguide.

    Abstract translation: 光子系统包括发射光子模块和接收光子模块。 光子系统还包括耦合到发射光子模块的发射波导,与发射波导集成的第一光开关,以及光耦合到第一光开关的诊断波导。 光子系统还包括耦合到接收光子模块的接收波导和与接收波导集成并与光学耦合到诊断波导的第二光开关。

    Uniform light generating system for testing an image-sensing device and method of using the same
    30.
    发明授权
    Uniform light generating system for testing an image-sensing device and method of using the same 有权
    用于测试图像感测装置的均匀光产生系统及其使用方法

    公开(公告)号:US07898663B2

    公开(公告)日:2011-03-01

    申请号:US12285191

    申请日:2008-09-30

    Abstract: A uniform light generating system for testing an image-sensing device includes a light-generating unit, a light-transmitting unit, a light-diffusing unit, and a lens unit. The light-generating unit has a substrate and a plurality of light-emitting elements electrically disposed on the substrate. The light-transmitting unit has one side communicated with the light-generating unit for receiving and uniformizing light beams projected from the light-emitting elements. The light-diffusing unit has one side disposed on the other side of the light-transmitting unit for receiving and diffusing the light beams that have passed through the light-transmitting unit. The lens unit is disposed on the other side of the light-diffusing unit for transmitting the light beams that have passed through the light-diffusing unit to the image-sensing device.

    Abstract translation: 用于测试图像感测装置的均匀光产生系统包括发光单元,光发射单元,光漫射单元和透镜单元。 光产生单元具有基板和电气设置在基板上的多个发光元件。 光发射单元具有与发光单元连通的用于接收并均匀化从发光元件投射的光束的一侧。 光漫射单元的一侧设置在透光单元的另一侧,用于接收并扩散已经通过光发射单元的光束。 透镜单元设置在光漫射单元的另一侧,用于将已经通过光漫射单元的光束传输到图像感测装置。

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