公开(公告)号：US20180306639A1

公开(公告)日：2018-10-25

申请号：US15767971

申请日：2016-10-13

Applicant: ams AG

Inventor： David MEHRL

IPC: G01J1/08 ,  G01J1/42 ,  G09G3/34

CPC classification number: G01J1/08 ,  G01J1/4204 ,  G01J2001/083 ,  G09G3/3406 ,  G09G2320/0693 ,  G09G2360/144

Abstract: An assembly line in-situ calibration arrangement, optical sensor arrangement and a method for calibration of an optical sensor arrangement are presented. A calibration arrangement comprises a calibration head comprising at least one calibrated light source located behind an aperture in a housing and being electrically connected to a power terminal. A power source is connected to the power terminal, the power source comprising a switching unit electrically connected to the at least one light source. An interface unit is connected to the switching unit by means of an interface connection, wherein the interface unit is arranged to control the switching unit. A control unit is connected to the interface unit, wherein the control unit is arranged to drive the interface unit such that the at least one light source is switched to emit a calibration pulse sequence to be received by the optical sensor arrangement to be placed with respect of the aperture. The calibration pulse sequence is arranged to initiate a calibration mode of operation of the optical sensor arrangement.

公开(公告)号：US20170276548A1

公开(公告)日：2017-09-28

申请号：US15081244

申请日：2016-03-25

Applicant: Harris Corporation

Inventor： David Stanley SMITH ,  Paul MAURER

IPC: G01J5/00 ,  G01J5/12 ,  G01J5/62 ,  G01J5/28

CPC classification number: G01J5/62 ,  G01J1/044 ,  G01J1/08 ,  G01J5/0834 ,  G01J5/12 ,  G01J5/522 ,  G01J2001/083 ,  G01J2005/0048

Abstract: A method of estimating non-linearity in a response of an optical detector comprises emitting optical radiation at different intensities. The method includes, at each intensity: amplitude modulating the emitted optical radiation at a modulating frequency to produce amplitude modulated optical radiation; detecting the amplitude modulated optical radiation with the optical detector to produce a detected waveform; and generating a Fourier transform of the detected waveform that includes a fundamental frequency equal to the modulating frequency and harmonics thereof. The method further includes estimating the non-linearity in the response of the optical detector based on a change in an amplitude of a second harmonic of the fundamental frequency relative to an amplitude of the fundamental frequency across the Fourier transforms corresponding to the different intensities.

公开(公告)号：US07061001B2

公开(公告)日：2006-06-13

申请号：US10608965

申请日：2003-06-27

Applicant: Vishal Chaudhary ,  Badi Ebrahimifard

Inventor： Vishal Chaudhary ,  Badi Ebrahimifard

IPC: H04N5/335

CPC classification number: G01J1/08 ,  G01J2001/083 ,  G01N2201/12723

Abstract: A method and apparatus for troubleshooting a plurality of photosensors in a machine, such as a mail sorter and mail inserter. The troubleshooting procedure is carried out by a software program. As each photosensor comprises a photo-detector and an associated light emitter for illuminating the photo-detector, the test is based on the output voltage of the photo-detector in response to a current value on the light emitter. Based on the two or more current values set to the light emitter and the corresponding measured output voltage values, the software program determines whether the photosensor is functional. If the photosensor is not functional, possible causes and suggested remedies are provided to the operator of the machine.

Abstract translation: 一种用于对诸如邮件分类器和邮件插入器的机器中的多个光电传感器进行故障排除的方法和装置。 故障排除步骤由软件程序执行。 由于每个光传感器包括用于照射光检测器的光检测器和相关联的光发射器，所以测试基于响应于光发射器上的电流值的光检测器的输出电压。 基于设置到发光体的两个或多个电流值和相应的测量输出电压值，软件程序确定光电传感器是否功能。 如果光电传感器不起作用，可能会向机器的操作员提供可能的原因和建议的补救措施。

公开(公告)号：US20240247977A1

公开(公告)日：2024-07-25

申请号：US18564177

申请日：2022-03-31

Applicant: ams-OSRAM International GmbH

Inventor： Gerd PLECHINGER

IPC: G01J1/08 ,  G01J1/44

CPC classification number: G01J1/08 ,  G01J1/44 ,  G01J2001/083 ,  G01J2001/446

Abstract: A measurement method for characterization of a photodetector includes illumination of the photodetector with a variable electromagnetic radiation. The variable electromagnetic radiation has a temporally oscillating radiation intensity with fixed period and amplitude. The method also includes illumination of the photodetector with a first electromagnetic radiation having a temporally constant first radiation intensity and measurement of a first output signal at the photodetector. The method further includes illumination of the photodetector with a second electromagnetic radiation having a temporally constant second radiation intensity different from the first radiation intensity and measurement of a second output signal at the photodetector. The method additionally includes determination of a non-linearity of the photodetector by comparing the measurements of the first and second output signals.

公开(公告)号：US20180216994A1

公开(公告)日：2018-08-02

申请号：US15121520

申请日：2014-04-30

Applicant: Zhiyong TAN ,  Juncheng CAO ,  Li GU ,  Yonghao ZHU

Inventor： Zhiyong TAN ,  Juncheng CAO ,  Li GU ,  Yonghao ZHU

IPC: G01J1/42 ,  G01J1/08 ,  G01J3/42

CPC classification number: G01J1/4257 ,  G01J1/08 ,  G01J1/4228 ,  G01J3/42 ,  G01J2001/083

Abstract: A calibration method for an absolute responsivity of a terahertz quantum well detector and a calibration device thereof, in which the device at least comprises: a driving power supply, a single frequency laser source, an optic, a terahertz array detector, a terahertz dynamometer, a current amplifier and an oscilloscope. The calibration method adopts a power detectable single frequency laser source as a calibration photosource, to obtain the absolute responsivity parameters of the detector at the laser frequency; a normalized photocurrent spectrum of the detector is used to further calculate the absolute responsivity parameters of the detector at any detectable frequency. the single frequency laser source with periodically output is adopted as a calibration photosource, the terahertz array detector and the dynamometer are adopted to directly measure and obtain the incident power of the calibrated detector.

公开(公告)号：US09360368B1

公开(公告)日：2016-06-07

申请号：US14306521

申请日：2014-06-17

Applicant: EXELIS, INC.

Inventor： Kenneth K. Ellis

IPC: G01J4/00 ,  G01J4/04

CPC classification number: G01J4/04 ,  G01J1/0429 ,  G01J1/08 ,  G01J3/0224 ,  G01J3/28 ,  G01J2001/083

Abstract: Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.

Abstract translation: 测量光学仪器的偏振响应包括以下步骤：沿光轴发射光; 通过第一和第二偏振器接收光; 以及使用滤波器和检测器检测通过第一和第二偏振器接收的光。 通过测量通过第一和第二偏振器接收的光的强度来获得第一组测量。 通过沿着光轴放置光学仪器来代替滤光器和检测器来获得第二组测量; 并且在去除了第二偏振器之后测量通过第一偏振器接收的光的强度。 使用光学仪器获得第三组测量值，但是具有第二偏振器来代替第一偏振器。 可以使用第一，第二和第三组测量来表征光学仪器。 表征完成，而不必知道偏振器的消光比和透射率参数。

公开(公告)号：US20150355017A1

公开(公告)日：2015-12-10

申请号：US14297348

申请日：2014-06-05

Applicant: SunEdison Inc.

Inventor： Christopher Andrew Clarke ,  Stephen James Voss ,  Alemu Tadesse ,  Anastasios Golnas ,  Joseph Philip ,  Joseph Michael Bryan

IPC: G01J1/42 ,  G01J1/02

CPC classification number: G01J1/42 ,  G01J1/0219 ,  G01J1/0295 ,  G01J2001/083 ,  G01J2001/086 ,  G01J2001/4266 ,  G01J2001/4285

Abstract: A method for calibrating irradiance sensors is performed by an irradiance analysis computing device in communication with a memory. The method includes receiving an irradiance estimate representing an expected amount of irradiance, receiving a first irradiance value associated with at least one irradiance sensor, processing the irradiance estimate and the first irradiance value to generate at least one irradiance metric, and determining a condition of said irradiance sensor based at least in part on the at least one irradiance metric.

Abstract translation: 用于校准辐照传感器的方法由与存储器通信的辐照度分析计算装置执行。 该方法包括接收表示辐射度的预期量的辐照度估计，接收与至少一个辐照传感器相关联的第一辐照度值，处理辐照度估计值和第一辐照度值以产生至少一个辐照度量度，以及确定所述 辐射传感器至少部分地基于至少一个辐照度量度。

公开(公告)号：US08724100B1

公开(公告)日：2014-05-13

申请号：US13694047

申请日：2012-10-22

Applicant: Mehdi Asghari ,  Dazeng Feng

Inventor： Mehdi Asghari ,  Dazeng Feng

IPC: G01N21/00

CPC classification number: G01J1/0425 ,  G01J1/0209 ,  G01J1/08 ,  G01J2001/083 ,  G01J2001/4247 ,  G02B6/12004 ,  G02B6/125 ,  G02B2006/12097

Abstract: A wafer includes multiple optical devices that each includes one or more optical components. The optical components include light-generating components that each generates a light signal in response to application of electrical energy to the light-generating component from electronics that are external to the wafer. The optical components also include receiver components that each outputs an electrical signal in response to receipt of light. The wafer also includes testing waveguides that each extends from within a boundary of one of the optical devices across the boundary of the optical device and also provides optical communication between a first portion of the optical components and a second portion of the optical components. The first portion of the optical components includes one or more of the light-generating components and the second portion of the optical components include one or more of the receiver components.

Abstract translation: 晶片包括多个光学器件，每个光学器件包括一个或多个光学部件。 光学部件包括发光部件，每个发光部件响应于从晶片外部的电子器件向发光部件施加电能而产生光信号。 光学部件还包括响应于光的接收而输出电信号的接收器部件。 晶片还包括测试波导，每个波导从光学器件中的一个光学器件的边界内延伸穿过光学器件的边界，并且还提供光学部件的第一部分和光学部件的第二部分之间的光学连通。 光学部件的第一部分包括一个或多个发光部件，并且光学部件的第二部分包括一个或多个接收器部件。

公开(公告)号：US11754438B2

公开(公告)日：2023-09-12

申请号：US17651308

申请日：2022-02-16

Applicant: Alcon Inc.

Inventor： Christopher Carl Jung

IPC: G01J1/02 ,  A61F9/007 ,  G01J1/08 ,  G01N21/94 ,  G01N21/15

CPC classification number: G01J1/0228 ,  A61F9/00736 ,  G01J2001/083 ,  G01N21/15 ,  G01N21/94 ,  G01N2021/157 ,  G01N2021/945 ,  G01N2201/062

Abstract: Certain embodiments provide a self-checking photoelectric sensor that is configured to determine a characteristic (e.g., an amount of blockage and/or wellness/decay) of an optical pathway (e.g., an electro-optical pathway). An example method generally includes increasing, over a time period that starts at a first time, a current input to a light emitting element (LEE). The method generally includes receiving, by a light detection element, an output of the LEE via the optical pathway during the time period. The method generally includes converting, during the time period, the LEE output to a voltage output. The method generally includes determining a second time in the time period when the voltage output crosses a threshold. The method generally includes determining the characteristic of the optical pathway between the LEE and the light detection element based on a difference between the second time and the first time.

公开(公告)号：US20180058927A1

公开(公告)日：2018-03-01

申请号：US15560493

申请日：2015-03-24

Applicant: Otsuka Electronics Co., Ltd.

Inventor： Hisashi SHIRAIWA ,  Hiroyuki SANO

IPC: G01J1/44 ,  G01J1/08 ,  G01J1/04

CPC classification number: G01J1/44 ,  G01J1/0295 ,  G01J1/0407 ,  G01J1/08 ,  G01J3/02 ,  G01J3/0297 ,  G01J3/10 ,  G01J3/28 ,  G01J2001/0481 ,  G01J2001/083 ,  G01J2001/086 ,  G01J2001/444 ,  G01J2003/2866 ,  G01J2003/2876

Abstract: A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.