Surface mounting chip carrier module
    24.
    发明授权
    Surface mounting chip carrier module 有权
    表面安装芯片载体模块

    公开(公告)号:US08159830B2

    公开(公告)日:2012-04-17

    申请号:US12426106

    申请日:2009-04-17

    Abstract: A device includes a carrier and an integrated circuit chip having a first side supported by the carrier and a second side having contacts. The carrier has multiple carrier contacts supported by the carrier and separated from the integrated circuit chip. Multiple leads are coupled between the contacts on the integrated circuit chip and the multiple carrier contacts. A resin encapsulates the integrated circuit chip leaving the multiple carrier contacts at least partially uncovered for attaching to a card or board.

    Abstract translation: 一种器件包括载体和集成电路芯片,其具有由载体支撑的第一侧和具有触点的第二侧。 载体具有由载体支撑并且与集成电路芯片分离的多个载体接触。 多个引线耦合在集成电路芯片上的触点和多个载体触点之间。 树脂将集成电路芯片封装起来,使得多个载体接触件至少部分地不被覆盖以附接到卡或板上。

    THIN WAFER DETECTORS WITH IMPROVED RADIATION DAMAGE AND CROSSTALK CHARACTERISTICS
    29.
    发明申请
    THIN WAFER DETECTORS WITH IMPROVED RADIATION DAMAGE AND CROSSTALK CHARACTERISTICS 审中-公开
    具有改进的辐射损伤和波纹管特性的薄膜检测器

    公开(公告)号:US20110169121A1

    公开(公告)日:2011-07-14

    申请号:US12952173

    申请日:2010-11-22

    Abstract: The present invention is directed toward a detector structure, detector arrays, and a method of detecting incident radiation. The present invention comprises several embodiments that provide for reduced radiation damage susceptibility, decreased affects of crosstalk, reduced dark current (current leakage) and increased flexibility in application. In one embodiment, a photodiode array comprises a substrate having at least a front side and a back side, a plurality of diode elements integrally formed in the substrate forming the array, wherein each diode element has a p+ fishbone pattern on the front side, and wherein the p+ fishbone pattern substantially reduces capacitance and crosstalk between adjacent photodiodes, a plurality of front surface cathode and anode contacts, and wire interconnects between diode elements made through a plurality of back surface contacts.

    Abstract translation: 本发明涉及检测器结构,检测器阵列和检测入射辐射的方法。 本发明包括几个实施例,其提供减少的辐射损伤敏感性,降低的串扰影响,降低的暗电流(电流泄漏)和增加的应用灵活性。 在一个实施例中,光电二极管阵列包括至少具有前侧和背面的基板,在形成阵列的基板中一体形成的多个二极管元件,其中每个二极管元件在前侧具有p +鱼骨图案,以及 其中所述p +鱼骨图案基本上减小了相邻光电二极管之间的电容和串扰,多个前表面阴极和阳极触点以及通过多个后表面触点制成的二极管元件之间的导线互连。

Patent Agency Ranking