IN-SITU ON-LINE DETECTION DEVICE AND METHOD FOR LONG-DISTANCE METALLURGICAL LIQUID METAL COMPONENT
    31.
    发明申请
    IN-SITU ON-LINE DETECTION DEVICE AND METHOD FOR LONG-DISTANCE METALLURGICAL LIQUID METAL COMPONENT 有权
    用于长距离冶金液体金属部件的现场在线检测装置和方法

    公开(公告)号:US20160131581A1

    公开(公告)日:2016-05-12

    申请号:US14898600

    申请日:2013-11-28

    Abstract: An in-situ on-line detection device and detection method for a long-distance metallurgical liquid metal component. The detection device comprises a front-end high-temperature resistant probe (18), a middle-end optical sensing device (19) and a back-end control platform (24), wherein the head of the front-end high-temperature resistant probe (18) is placed in a liquid metal (22), the tail thereof is coaxially connected to the middle-end optical sensing device (19), and an optical window (15) is arranged in the connection position; and the middle-end optical sensing device (19) is connected to the hack-end control platform (24) through a signal line (25). The detection device and detection method can provide a timely and valid message for quality control and a melting end, so that the detection time is greatly shortened, the detection distance can he adjusted extensively, the measurement result is accurate, and it can he achieved to measure components that are difficult to measure such as C, S, P, etc.

    Abstract translation: 一种用于长距离冶金液体金属部件的原位在线检测装置和检测方法。 检测装置包括前端耐高温探头(18),中端光学传感装置(19)和后端控制平台(24),其中前端耐高温头 探针(18)被放置在液态金属(22)中,其尾部同轴地连接到中端光学感测装置(19),并且光学窗口(15)被布置在连接位置; 并且中端光学感测装置(19)通过信号线(25)连接到黑客端控制平台(24)。 检测装置和检测方法可以为质量控制和熔化结束提供及时有效的信息,使检测时间大大缩短,检测距离可以广泛调整,测量结果准确,可以达到 测量难以测量的组件,如C,S,P等

    Defect inspection device and defect inspection method
    32.
    发明授权
    Defect inspection device and defect inspection method 有权
    缺陷检查装置和缺陷检查方法

    公开(公告)号:US09329136B2

    公开(公告)日:2016-05-03

    申请号:US14396908

    申请日:2013-04-24

    Abstract: To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

    Abstract translation: 为了检测无限小的缺陷,高度精确地测量检测器的尺寸,检测检查装置被配置为包括:照射单元,其照射样品表面上的线性区域中的光; 检测单元,其检测来自所述线性区域的光; 以及处理通过检测光而获得的信号并检测缺陷的信号处理单元。 检测单元包括:光学组件,其在一个方向上扩散来自样品的光并在与该一个方向正交的方向上形成图像; 以及检测组件,其具有阵列传感器,其中检测像素被二维地定位,其检测沿与所述一个方向正交的方向成像的沿所述一个方向漫射的光,并将每个所述检测像素的输出信号相加, 光漫射的方向,并输出。

    FLUORESCENCE REMOVAL FROM RAMAN SPECTRA BY POLARIZATION SUBTRACTION
    34.
    发明申请
    FLUORESCENCE REMOVAL FROM RAMAN SPECTRA BY POLARIZATION SUBTRACTION 审中-公开
    通过极化分离从拉曼光谱中去除荧光

    公开(公告)号:US20160103073A1

    公开(公告)日:2016-04-14

    申请号:US14883269

    申请日:2015-10-14

    Abstract: A method for utilizing polarization as a scheme for fluorescence removal from UV Raman spectra collected in a standoff detection scheme has been invented. In this scheme, a linearly polarized ultraviolet (UV) laser interacts with a material on a surface or in a container. The material generates Raman scattering with polarization contributions relative to that of the laser. The material possibly fluoresces as well, but the fluorescence is generally unpolarized. By subtracting a scaled version of the perpendicular component from the parallel component of the returned signal both relative to the laser source polarization—it is possible to generate a spectrum that is fluorescence free and contains the strongest features of the Raman scattered light.

    Abstract translation: 已经发明了利用偏振作为在间隔检测方案中收集的UV拉曼光谱进行荧光去除的方案的方法。 在该方案中,线偏振紫外(UV)激光与表面或容器中的材料相互作用。 该材料产生相对于激光的偏振贡献的拉曼散射。 该材料也可能发荧光,但荧光通常是非极化的。 通过从相对于激光源极化的返回信号的并行分量中减去垂直分量的缩放版本,可以产生无荧光的光谱,并且包含拉曼散射光的最强特征。

    METALLIC GRATINGS AND MEASUREMENT METHODS THEREOF
    35.
    发明申请
    METALLIC GRATINGS AND MEASUREMENT METHODS THEREOF 审中-公开
    金属镀层及其测量方法

    公开(公告)号:US20160069792A1

    公开(公告)日:2016-03-10

    申请号:US14847624

    申请日:2015-09-08

    Abstract: There is set forth herein in one embodiment, a structure including a metallic grating having a grating pattern, the metallic grating including a critical dimension. The metallic grating can output a spectral profile when exposed to electromagnetic radiation, the spectral profile having a feature. The grating pattern can be configured so that a change of the critical dimension produces a shift in a value of the feature of the spectral profile. A method can include propagating input electromagnetic radiation onto a metallic grating having a two dimensional periodic grating pattern and measuring a critical dimension of the metallic grating using output electromagnetic radiation from the metallic grating.

    Abstract translation: 这里在一个实施例中阐述了包括具有光栅图案的金属光栅的结构,金属光栅包括临界尺寸。 当暴露于电磁辐射时,金属光栅可以输出光谱轮廓,光谱轮廓具有特征。 光栅图案可以被配置成使得临界尺寸的变化产生光谱轮廓的特征值的偏移。 一种方法可以包括将输入电磁辐射传播到具有二维周期性光栅图案的金属光栅上,并使用来自金属光栅的输出电磁辐射来测量金属光栅的临界尺寸。

    Optical Measuring System for Measuring Optical Polarization Properties of a Sample
    37.
    发明申请
    Optical Measuring System for Measuring Optical Polarization Properties of a Sample 有权
    用于测量样品的光学偏振特性的光学测量系统

    公开(公告)号:US20150276581A1

    公开(公告)日:2015-10-01

    申请号:US14668880

    申请日:2015-03-25

    Abstract: An optical measuring system measures polarization optical properties of a sample. The system includes (a) a light source that emits measuring light along an optical axis of an analysis beam path, (b) a polarization state generator, arranged downstream with respect to the light source in the analysis beam path which provides light with a defined polarization state, (c) a sample holder, arranged downstream with respect to the polarization state generator in the analysis beam path which accommodates the sample, (d) a polarization state analyzer, arranged downstream with respect to the sample holder in the analysis beam path which measures the polarization state of the measuring light after passing through the sample, and (e) a mechanical support structure, at which at least the polarization state generator, the sample holder and the polarization state analyzer are directly attached. Also described is a method for producing such an optical measuring system.

    Abstract translation: 光学测量系统测量样品的偏振光学性质。 该系统包括(a)沿着分析光束路径的光轴发射测量光的光源,(b)偏振状态发生器,其相对于分析光束路径中的光源布置在下游,其提供具有限定的光 极化状态,(c)在容纳样品的分析光束路径中相对于偏振状态发生器布置在下游的样本保持器,(d)偏振状态分析器,其布置在分析光束路径中相对于样品保持器的下游 其测量通过样品之后的测量光的偏振状态,以及(e)机械支撑结构,其中至少极化状态发生器,样品保持器和偏振状态分析器直接附接。 还描述了一种用于制造这种光学测量系统的方法。

    Simple sugar concentration sensor and method
    38.
    发明授权
    Simple sugar concentration sensor and method 有权
    简单的糖浓度传感器和方法

    公开(公告)号:US09101308B2

    公开(公告)日:2015-08-11

    申请号:US14293356

    申请日:2014-06-02

    Inventor: Valentin Korman

    Abstract: A glucose sensor comprising an optical energy source having an emitter with an emission pattern; a first polarizer intersecting the emission pattern; a second polarizer spaced a distance from the first polarizer and intersecting the emission pattern, the second polarizer rotated relative to the first polarizer by a first rotational amount Θ; a first optical detector intersecting the emission pattern; a second optical detector positioned proximal to the second polarizer, the first polarizer and the second polarizer being positioned between the optical energy source and the second optical detector, the second optical detector intersecting the emission pattern; a compensating circuit coupled to the second optical detector; and a subtractor circuit coupled to the compensating circuit and the first optical detector.

    Abstract translation: 一种葡萄糖传感器,包括具有发射器的光能源,其具有发射图案; 与发射图案相交的第一偏振片; 与第一偏振器间隔开一定距离并与发射图案相交的第二偏振器,第二偏振器相对于第一偏振器相对于第一偏转器旋转第一旋转量Θ; 与发射图案相交的第一光学检测器; 位于第二偏振器附近的第二光学检测器,第一偏振器和第二偏振器位于光能源和第二光学检测器之间,第二光学检测器与发射图案相交; 耦合到所述第二光学检测器的补偿电路; 以及耦合到所述补偿电路和所述第一光学检测器的减法器电路。

    Method and apparatus for determining concentration using polarized light
    39.
    发明授权
    Method and apparatus for determining concentration using polarized light 有权
    使用偏振光确定浓度的方法和装置

    公开(公告)号:US08902424B2

    公开(公告)日:2014-12-02

    申请号:US13758535

    申请日:2013-02-04

    CPC classification number: G01N21/21 G01N2201/0683

    Abstract: An apparatus and method for determining the concentration of chiral molecules in a fluid includes a first polarizer configure to polarize light in substantially a first plane to provide initially polarized light. A second polarizer is capable of polarizing the initially polarized light in a plurality of planes, at least one of the plurality of planes being different from the first plane, to provide subsequently polarized light. One or more receivers are included for measuring an intensity of the subsequently polarized light in one or more of the plurality of planes.

    Abstract translation: 用于确定流体中手性分子的浓度的装置和方法包括:第一偏振器,其构造成使基本上第一平面中的光偏振,以提供初始偏振光。 第二偏振器能够偏振多个平面中的初始偏振光,多个平面中的至少一个不同于第一平面,以提供随后的偏振光。 包括一个或多个接收器用于测量多个平面中的一个或多个中的后续偏振光的强度。

    ULTRA DARK FIELD MICROSCOPE
    40.
    发明申请
    ULTRA DARK FIELD MICROSCOPE 审中-公开
    超级暗场显微镜

    公开(公告)号:US20140158912A1

    公开(公告)日:2014-06-12

    申请号:US13918705

    申请日:2013-06-14

    Applicant: CHROMx, LLC.

    Abstract: A fluorescence microscope includes a nearly monochromatic light source, a Brewster angle wedge, and an optical system for irradiating a sample with a light beam from the light source and directing fluorescence light from said sample onto the Brewster angle wedge. Collection optics are provided for focusing a hyper-spectral, wide angle and dark field image of the sample from the Brewster angle wedge onto recording optics.

    Abstract translation: 荧光显微镜包括近似单色的光源,布鲁斯特角楔和用于从光源照射样品的光束并将来自所述样品的荧光引导到布鲁斯特角楔上的光学系统。 提供收集光学器件用于将来自布鲁斯特角楔的样品的超光谱,广角和暗场图像聚焦到记录光学器件上。

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