Method for rapidly determining sulfur content in a plurality of samples

    公开(公告)号:US10458964B2

    公开(公告)日:2019-10-29

    申请号:US15720669

    申请日:2017-09-29

    Abstract: Methods for measuring the sulfur content in a plurality of individual sulfur-containing fiber or article samples, comprising: a) contacting a plurality of samples with a solution comprising potassium hydroxide to convert the sulfur to potassium sulfate; b) concurrently and individually combusting the plurality of samples from step a) in a furnace at a temperature of greater than 650° C. to remove essentially all organic materials to produce a plurality of residues; c) dissolving each of the pluralities of residue in concentrated nitric acid to form individual residue solutions; and d) analyzing the individual residue solutions with Inductively Coupled Plasma (ICP) Emission Spectrometry to determine the sulfur content of each sample.

    System and method for spectral tuning of broadband light sources

    公开(公告)号:US10422508B2

    公开(公告)日:2019-09-24

    申请号:US15339312

    申请日:2016-10-31

    Abstract: A tunable spectral filter includes a first tunable dispersive element, a first optical element, a spatial filtering element located at the focal plane, a second optical element, and a second dispersive element. The first tunable dispersive element introduces spectral dispersion to an illumination beam with an adjustable dispersion. The first optical element focuses the illumination beam at a focal plane in which a distribution of a spectrum of the spectrally-dispersed illumination beam at the focal plane is controllable by adjusting the dispersion of the first tunable dispersive element. The spatial filtering element filters the spectrum of the illumination beam based on the distribution of the spectrum of the illumination beam at the focal plane. The second optical element collects the spectrally-dispersed illumination beam transmitted from the spatial filtering element. The second tunable dispersive element removes the dispersion introduced by the first tunable dispersive element from the illumination beam.

    Optoelectronic sensor device and method to operate an optoelectronic sensor device

    公开(公告)号:US10302492B2

    公开(公告)日:2019-05-28

    申请号:US15699596

    申请日:2017-09-08

    Inventor: Rolf Weber

    Abstract: An optoelectronic sensor device and a method for operating an optoelectronic sensor device are disclosed. In an embodiment the optoelectronic sensor device includes a radiation-emitting semiconductor chip configured to emit radiation with a peak wavelength which depends on a temperature of the radiation-emitting semiconductor chip. The sensor device further includes a sensor chip configured to detect a part of the radiation reflected back to the sensor chip as well as a spectral filter component having an adjustable spectral transmission range. A wavelength determination unit is configured to determine the peak wavelength and a filter driver is configured to adjust the spectral transmission range to the determined peak wavelength.

    Opticoanalytical devices with capacitance-based nanomaterial detectors

    公开(公告)号:US10260946B2

    公开(公告)日:2019-04-16

    申请号:US15306905

    申请日:2015-11-13

    Abstract: Optical computing devices may include capacitance-based nanomaterial detectors. For example, an optical computing device may include a light source that emits electromagnetic radiation into an optical train extending from the light source to a capacitance-based nanomaterial detector; a material positioned in the optical train to optically interact with the electromagnetic radiation and produce optically interacted light; and the capacitance-based nanomaterial detector comprising one or more nano-sized materials configured to have a resonantly-tuned absorption spectrum and being configured to receive the optically interacted light, apply a vector related to the characteristic of interest to the optically interacted light using the resonantly-tuned absorption spectrum, and generate an output signal indicative of the characteristic of interest.

    Methods for inspecting semiconductor wafers

    公开(公告)号:US10241051B2

    公开(公告)日:2019-03-26

    申请号:US15851993

    申请日:2017-12-22

    Abstract: Methods and systems are presented for analyzing semiconductor materials as they progress along a production line, using photoluminescence images acquired using line-scanning techniques. The photoluminescence images can be analyzed to obtain spatially resolved information on one or more properties of said material, such as lateral charge carrier transport, defects and the presence of cracks. In one preferred embodiment the methods and systems are used to obtain series resistance images of silicon photovoltaic cells without making electrical contact with the sample cell.

    Spectrometer with operator assistance for measurement optimization

    公开(公告)号:US10209130B2

    公开(公告)日:2019-02-19

    申请号:US15986918

    申请日:2018-05-23

    Abstract: The present disclosure relates to assistive mechanisms and methods that aid an operator of a spectrometer to make spectral measurements of a sample, the measurements having a desired quality. The method enables quality spectral measurements quickly and simply, without a prior understanding of a sample's spectrum or of the details as to how the spectrum is measured. Data quality is improved, and the time required to collect the data is reduced. While a specific example of sample optic focus is disclosed in detail, the optimization of numerous other parameters is possible.

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