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Patent Agency Ranking
公开(公告)号：US20180340822A1
公开(公告)日：2018-11-29
申请号：US15986918
申请日：2018-05-23
Applicant: Kaiser Optical Systems Inc.
Inventor： Darren Schipper , Joseph B. Slater , James M. Tedesco
CPC classification number: G01J3/027 , G01J3/0264 , G01J3/28 , G01J3/42 , G01J2003/283
Abstract: The present disclosure relates to assistive mechanisms and methods that aid an operator of a spectrometer to make spectral measurements of a sample, the measurements having a desired quality. The method enables quality spectral measurements quickly and simply, without a prior understanding of a sample's spectrum or of the details as to how the spectrum is measured. Data quality is improved, and the time required to collect the data is reduced. While a specific example of sample optic focus is disclosed in detail, the optimization of numerous other parameters is possible.
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公开(公告)号：US10209130B2
公开(公告)日：2019-02-19
申请号：US15986918
申请日：2018-05-23
Applicant: Kaiser Optical Systems Inc.
Inventor： Darren Schipper , Joseph B. Slater , James M. Tedesco
Abstract: The present disclosure relates to assistive mechanisms and methods that aid an operator of a spectrometer to make spectral measurements of a sample, the measurements having a desired quality. The method enables quality spectral measurements quickly and simply, without a prior understanding of a sample's spectrum or of the details as to how the spectrum is measured. Data quality is improved, and the time required to collect the data is reduced. While a specific example of sample optic focus is disclosed in detail, the optimization of numerous other parameters is possible.
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3.发明申请公开(公告)号：US20160356647A1
公开(公告)日：2016-12-08
申请号：US14950598
申请日：2015-11-24
Applicant: Kaiser Optical Systems Inc.
Inventor： Patrick Wiegand , James M. Tedesco , Joseph B. Slater , Francis Esmonde-White , Darren Schipper
CPC classification number: G01J3/0297 , G01J3/027 , G01J3/28 , G01J3/44 , G01N21/65
Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.
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4.发明申请公开(公告)号：US20180328785A1
公开(公告)日：2018-11-15
申请号：US16043652
申请日：2018-07-24
Applicant: Kaiser Optical Systems Inc.
Inventor： Patrick Wiegand , James M. Tedesco , Joseph B. Slater , Francis Esmonde-White , Darren Schipper
CPC classification number: G01J3/0297 , G01J3/027 , G01J3/28 , G01J3/44 , G01N21/65
Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the present disclosure may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the present disclosure, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.
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5.发明授权公开(公告)号：US10048128B2
公开(公告)日：2018-08-14
申请号：US14950598
申请日：2015-11-24
Applicant: Kaiser Optical Systems Inc.
Inventor： Patrick Wiegand , James M. Tedesco , Joseph B. Slater , Francis Esmonde-White , Darren Schipper
Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.
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