Abstract:
The invention relates to an optoelectronic sensor element (20) having at least one reception element (22, 22a, 22b, 22c, 22d) in front of which a polarizing structure (24, 24a, 24b, 24c, 24d) is arranged which is manufactured from an electrically conductive material, with the polarizing structure (24, 24a, 24b, 24c, 24d) having a contact connection (26) for the application of a defined tension and with the polarizing structure (24, 24a, 24b, 24c, 24d) being configured as a screen of the sensor element (20).
Abstract:
Four separately polarized beams are simultaneously measured upon diffraction from a substrate (W) to determine properties of the substrate. Linearly, circularly or elliptically polarized radiation is transmitted through a first beam splitter (N-PBS) and split into two polarized beams. These two beams are further split into two further beams using two further beam splitters, the further beam splitters (32,34) being rotated by 45° with respect to each other. The plurality of polarizing beam splitters enables the measurement of the intensity of all four beams and thus the measurement of the phase modulation and amplitude of the combined beams to give the features of the substrate. Algorithms are used to compare the four intensities of each of the polarized angles to give rise to the phase difference between the polarization directions and the ratio between the two main polarization direction amplitudes of the original polarized beam.
Abstract:
Representative implementations of devices and techniques provide selectivity for imaging devices and systems. Polarization may be applied to emitted light radiation and/or received light radiation to select a desired imaging result. Using polarization, an imaging device or system can pass desired light radiation having desired information and reject unwanted or stray light radiation.
Abstract:
A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP1); a rotating polarizer that includes a wire grid (RWGP); a stage (STG) for supporting a sample (S); a rotating retarder (RRET) comprising first (RP), second (RM1), third (RM2) and fourth (RM3) elements; a second rotatable polarizer that includes a wire grid (WGP2); and a Golay cell detector (DET).
Abstract:
The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz, including: a source such as a backward wave oscillator; a Smith-Purcell cell; a free electron laser, or an FTIR source and a solid state device; and a detector such as a Golay cell; a bolometer or a solid state detector; and preferably including a polarization state generator comprising: an odd bounce image rotating system and a polarizer, or two polarizers; and optionally including least one compensator and/or modulator, in addition to an analyzer.
Abstract:
The invention relates to a method and to a device for determining a piece of polarisation information on a measurement point of a target sample, the device comprising: —a light source capable of emitting a rectilinearly polarised light beam in a predefined direction, the light beam being intended to be reflected by the measurement point of the target sample; —a unit for computing the piece of polarisation information on the measurement point using the beam reflected by the target sample; -a waveguide for guiding the incident beam towards the target sample and the reflected beam towards the computing means; and —a unit for rotating the polarisation, capable of rotating two orthogonal polarimetric components of the incident beam exiting the waveguide and two orthogonal polarimetric components of the reflected beam before passing through the waveguide.
Abstract:
This invention relates to a near real time optical compensation verification system for verifying a fiber or fiber component through internal or external compensation to achieve equivalently free space propagation of a broadband light when coupled into fiber. Preferably, no component is added to the fiber or fiber component, and the compensation method is realized through real time fiber bending, twisting or other means at either or both ends of a fiber or fiber component. The output optical characteristics of the compensated fiber or fiber component are measured by a polarimeter through changing the input light properties. The required multi-variable compensation to achieve Unitary Matrix free space condition is computed in near real time, and as the feedback to formulate the required compensation. The disclosed invention not only enhances yield in the fiber and fiber component, but also accelerates the optimization of optical fiber sensors employed free space fiber coil.
Abstract:
Techniques for identifying images of a scene including illuminating the scene with a beam of 3 or more wavelengths, polarized according to a determined direction; simultaneously acquiring for each wavelength an image X//(λi) polarized according to said direction and an image X⊥(λi) polarized according to a direction perpendicular to said direction, X⊥(λi) being spatially distinct from X//(λi); calculating for each wavelength an intensity image which is a linear combination of X//(λi) and X⊥(λi), providing an intensity spectrum for each pixel; calculating for each wavelength a polarization contrast image on the basis of an intensity ratio calculated as a function of X//(λi) and of X⊥(λi), providing a polarization contrast spectrum for each pixel; and calculating a spectro-polarimetric contrast image of the scene, each pixel of this spectro-polarimetric contrast image calculated based on the intensity spectrum and the contrast spectrum of the pixel considered.
Abstract:
Pixel-level monolithic optical element configurations for uncooled infrared detectors and focal plane arrays in which a monolithically integrated or fabricated optical element may be suspended over a microbolometer pixel membrane structure of an uncooled infrared detector element A monolithic optical element may be, for example, a polarizing or spectral filter element, an optically active filter element, or a microlens element that is structurally attached by an insulating interconnect to the existing metal interconnects such that the installation of the optical element substantially does not impact the thermal mass or thermal time constant of the microbolometer pixel structure, and such that it requires little if any additional device real estate area beyond the area originally consumed by the microbolometer pixel structure interconnects.
Abstract:
A method for imaging a sample, the method includes, during a single acquisition event, receiving a first polarization-encoded EM field for a first point and a second polarization-encoded EM field for a second point. The method further includes re-directing the first polarization-encoded EM field along a first pre-determined direction to a first location on a dispersing re-imager and the second polarization-encoded EM field along a second pre-determined direction to a second location on the dispersing re-imager. The method further includes spectrally dispersing the first polarization-encoded EM field to obtain a first spectrum, re-imaging the first spectrum onto a first location on a detector, spectrally dispersing the second polarization-encoded EM field to obtain a second spectrum, re-imaging the second spectrum onto a second location on the detector, and detecting the first re-imaged spectrum and the second re-imaged spectrum.