GEMSTONE SPARKLE ANALYSIS
    41.
    发明申请
    GEMSTONE SPARKLE ANALYSIS 有权
    GEMSTONE SPARKLE分析

    公开(公告)号:US20130016210A1

    公开(公告)日:2013-01-17

    申请号:US13575067

    申请日:2011-01-26

    Abstract: A system is described for obtaining images of a gemstone, and performing quantitative analysis on the images to obtain measures of properties of the gemstone. The system comprises a support structure for supporting the gemstone at an observation position. An illumination structure is arranged to illuminate the gemstone. The illumination structure comprises a plurality of radially dispersed directional light sources directed towards the observation position, the support structure and illumination system being rotatable relative to one another around a rotation axis so that the gemstone can be illuminated by one or more of the directional light sources at each of a plurality of rotational positions, the axis of rotation being normal to a selected facet of the gemstone. An imaging device is directed towards the gemstone for obtaining images of the gemstone at each of the rotational positions, the imaging device having an imaging axis parallel to or coincident with the axis of rotation. An image processor is provided for identifying sparkle regions in the images corresponding to reflections from individual light sources by individual facets and providing a quantitative measure of the gemstone on the basis of porperties of the sparkle regions.

    Abstract translation: 描述了一种用于获得宝石图像的系统,并对图像进行定量分析以获得宝石特性的度量。 该系统包括用于在观察位置支撑宝石的支撑结构。 布置照明结构来照亮宝石。 照明结构包括指向观察位置的多个径向分散的定向光源,支撑结构和照明系统可围绕旋转轴线相对于彼此旋转,使得宝石能够被一个或多个定向光源 在多个旋转位置中的每一个处,所述旋转轴线垂直于所述宝石的选定小面。 成像装置被引向宝石,以在每个旋转位置获得宝石的图像,成像装置具有与旋转轴线平行或重合的成像轴。 提供图像处理器,用于识别对应于各个光源的各个光源的反射的图像中的闪耀区域,并且基于闪光区域的特征提供宝石的定量测量。

    Diffusing Measurement Window for Near and Mid IR Multichannel Sensor
    42.
    发明申请
    Diffusing Measurement Window for Near and Mid IR Multichannel Sensor 有权
    近红外多通道传感器扩散测量窗口

    公开(公告)号:US20120305775A1

    公开(公告)日:2012-12-06

    申请号:US13153783

    申请日:2011-06-06

    Abstract: A diffuse reflector of radiation in the near and mid infrared regions includes (i) an assembly that has a reflecting element and a diffusing element that is made of one or more layers of calcium fluoride, sapphire, or alumina; or (ii) a diffusively reflective surface configured as a metallic layer with a rough surface. The diffuse reflector can be incorporated into systems for measuring properties of sheet materials and particularly into optical sensors that include a measurement window configured with one or more of the diffuse reflectors that cause incident radiation from a sensor light source to be diffused and reflected a plurality of times within a layer of material before being detected by the sensor receiver.

    Abstract translation: 近红外区域和中红外区域的辐射漫反射器包括:(i)具有由一层或多层氟化钙,蓝宝石或氧化铝制成的反射元件和漫射元件的组件; 或(ii)被配置为具有粗糙表面的金属层的漫反射表面。 扩散反射器可以结合到用于测量片材材料的特性的系统中,特别是结合到光学传感器中,该光学传感器包括配置有一个或多个漫反射器的测量窗口,该扩散反射器使得来自传感器光源的入射辐射被扩散并被反射 在传感器接收器检测到之前,材料层内的时间。

    Illumination device for visual inspection and visual inspection apparatus
    43.
    发明授权
    Illumination device for visual inspection and visual inspection apparatus 失效
    目视检查仪器的照明装置

    公开(公告)号:US08192050B2

    公开(公告)日:2012-06-05

    申请号:US12729452

    申请日:2010-03-23

    Abstract: An illumination device for visual inspection includes: a transmissive reflector plate that is formed of a light transmitting material, has an opening in a center, assumes a dome shape, a radius of which is gradually expanded downward with a center axis of the opening set as a center, and has a lower surface formed of a reflecting surface on which fine unevenness for diffusing and reflecting light from below is formed and an upper surface located on an opposite side of the lower surface; first, second, and third light source units that irradiate light on an inspection object, the first, second, and third light source units being provided on the upper surface of the transmissive reflector plate and arranged in a place below the opening and passing the center axis; and a fourth light source unit that irradiates light on the inspection object and being provided below the transmissive reflector plate.

    Abstract translation: 一种用于目视检查的照明装置包括:透光反射板,其由透光材料形成,具有中心的开口,呈圆顶形,半径逐渐向下延伸,开口的中心轴为 中心,并且具有由反射面形成的下表面,在该反射面上形成用于从下方扩散和反射光的微细凹凸和位于下表面的相对侧上的上表面; 第一,第二和第三光源单元,其在检查对象物上照射光,第一,第二和第三光源单元设置在透射反射板的上表面上,并布置在开口下方并通过中心 轴; 以及第四光源单元,其在检查对象上照射光并设置在透射反射板下方。

    Illumination means and inspection means having an illumination means
    44.
    发明授权
    Illumination means and inspection means having an illumination means 有权
    具有照明装置的照明装置和检查装置

    公开(公告)号:US08087799B2

    公开(公告)日:2012-01-03

    申请号:US12286253

    申请日:2008-09-29

    Abstract: An illumination mean for the inspection of flat substrates is disclosed. The flat substrate includes an upper edge area, a lower edge area and a front area. The illumination means is formed as an annular segment and comprises an opening into which at least the edge area of the flat substrate extends. A plurality of light sources are arranged on an annular segment in a housing. Inside the housing, a reflective element is provided so that the light from the light sources does not impinge perpendicularly on the upper edge area, the lower edge area and the front area of the flat substrate.

    Abstract translation: 公开了用于检查平板基板的照明平均值。 平面基板包括上边缘区域,下边缘区域和前部区域。 照明装置形成为环形部分,并且包括至少平坦基板的边缘区域延伸到的开口。 多个光源布置在壳体中的环形部分上。 在壳体内部,设置反射元件,使得来自光源的光线不会垂直地照射在平坦基板的上边缘区域,下边缘区域和前部区域上。

    ILLUMINATION DEVICE FOR VISUAL INSPECTION AND VISUAL INSPECTION APPARATUS
    45.
    发明申请
    ILLUMINATION DEVICE FOR VISUAL INSPECTION AND VISUAL INSPECTION APPARATUS 失效
    视觉检测和视觉检测设备的照明设备

    公开(公告)号:US20100246174A1

    公开(公告)日:2010-09-30

    申请号:US12729452

    申请日:2010-03-23

    Abstract: An illumination device for visual inspection includes: a transmissive reflector plate that is formed of a light transmitting material, has an opening in a center, assumes a dome shape, a radius of which is gradually expanded downward with a center axis of the opening set as a center, and has a lower surface formed of a reflecting surface on which fine unevenness for diffusing and reflecting light from below is formed and an upper surface located on an opposite side of the lower surface; first, second, and third light source units that irradiate light on an inspection object, the first, second, and third light source units being provided on the upper surface of the transmissive reflector plate and arranged in a place below the opening and passing the center axis; and a fourth light source unit that irradiates light on the inspection object and being provided below the transmissive reflector plate.

    Abstract translation: 一种用于目视检查的照明装置包括:透光反射板,其由透光材料形成,具有中心的开口,呈圆顶形,半径逐渐向下延伸,开口的中心轴为 中心,并且具有由反射面形成的下表面,在该反射面上形成用于从下方扩散和反射光的微细凹凸和位于下表面的相对侧上的上表面; 第一,第二和第三光源单元,其在检查对象物上照射光,第一,第二和第三光源单元设置在透射反射板的上表面上,并布置在开口下方并通过中心 轴; 以及第四光源单元,其在检查对象上照射光并设置在透射反射板下方。

    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected
    50.
    发明申请
    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected 失效
    半导体基板的制造方法以及检查被检查体的图案的缺陷的方法和装置

    公开(公告)号:US20070070336A1

    公开(公告)日:2007-03-29

    申请号:US11605242

    申请日:2006-11-29

    Abstract: A method of inspecting a specimen, including: emitting a light from a lamp of a light source; illuminating a specimen on which plural patterns are formed with the light emitted from the light source and, passed through an objective lens; forming an optical image of the specimen by collecting light reflected from the specimen by the illuminating and passed through the objective lens and a image forming lens; detecting the optical image with a TDI image sensor; and processing a signal outputted from the TDI image sensor and detecting a defect of a pattern among the plural patterns formed on the specimen, wherein the image detected by the TDI image sensor is formed with light having a wavelength selected from the wavelengths of the light emitted from the light source.

    Abstract translation: 一种检查样本的方法,包括:从光源的灯发射光; 用从光源发射的光照射形成有多个图案的样本,并通过物镜; 通过照射通过收集从样本反射的光并通过物镜和成像透镜来形成样本的光学图像; 用TDI图像传感器检测光学图像; 并处理从TDI图像传感器输出的信号,并且检测在样本上形成的多个图案之间的图案的缺陷,其中由TDI图像传感器检测到的图像由具有选自发射的光的波长的波长的光形成 从光源。

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