公开(公告)号：US20100061508A1

公开(公告)日：2010-03-11

申请号：US12585283

申请日：2009-09-10

Applicant: Kenji Takahashi

Inventor： Kenji Takahashi

IPC: G01T1/36

CPC classification number: A61B6/4014 ,  A61B6/00 ,  A61B6/032 ,  A61B6/4233 ,  A61B6/466 ,  A61B6/484 ,  G03B42/026 ,  G21K1/06 ,  G21K2201/06 ,  G21K2201/064 ,  G21K2201/067 ,  G21K2207/005

Abstract: A radiation phase image radiographing apparatus, including a radiation emission unit having multiple radiation sources for emitting radiation onto a subject, the radiation sources being distributed such that radiation emitted from each of the radiation sources and transmitted through the subject forms a part of a projected image of the subject, a first diffraction grating configured to be exposed to the radiation emitted from the multiple radiation sources of the radiation emission unit and to produce a Talbot effect by the exposure, a second diffraction grating for diffracting the radiation diffracted by the first diffraction grating, and a radiation image detector for detecting the radiation diffracted by the second diffraction grating.

Abstract translation: 一种辐射相位图像摄影装置，包括具有用于向对象发射辐射的多个辐射源的辐射发射单元，辐射源被分布成使得从每个辐射源发射并透射通过对象的辐射形成投影图像的一部分 被配置为暴露于从辐射发射单元的多个辐射源发射的辐射并且通过曝光产生Talbot效应的第一衍射光栅，用于衍射由第一衍射光栅衍射的辐射的第二衍射光栅 以及用于检测由第二衍射光栅衍射的辐射的放射线图像检测器。

公开(公告)号：US20090161829A1

公开(公告)日：2009-06-25

申请号：US12063334

申请日：2006-07-26

Applicant: Zewu Chen ,  Ning Gao ,  Walter Gibson

Inventor： Zewu Chen ,  Ning Gao ,  Walter Gibson

IPC: G21K1/06

CPC classification number: G01N23/223 ,  B82Y10/00 ,  G01N2223/076 ,  G21K1/06 ,  G21K2201/061 ,  G21K2201/062 ,  G21K2201/064

Abstract: An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.

Abstract translation: 一种用于在x射线分析下激发样本的X射线系统或方法，使用弯曲单色光学器件将来自x射线源的单色x射线束引导到第一焦点区域。 第二光学器件位于单色X射线束内并且接收单色X射线束，并将聚焦的X射线束引导到样品上的第二焦点区域。 检测器位于样品附近以由于聚焦的X射线束而从样品收集辐射。 弯曲单色光学器件在第一焦点区域处产生大于由第二焦点区域处的第二光学器件产生的光束尺寸的光束尺寸，因此，使用第二光学元件，样品上的光束尺寸因此减小。 公开了双折射单色光学器件和多毛细管光学器件作为光学器件的可能实现。

公开(公告)号：US07366374B1

公开(公告)日：2008-04-29

申请号：US11751844

申请日：2007-05-22

Applicant: Susanne Madeline Lee ,  Forrest Frank Hopkins ,  Peter Michael Edic ,  Joseph John Manak ,  William Eugene Powell, III

Inventor： Susanne Madeline Lee ,  Forrest Frank Hopkins ,  Peter Michael Edic ,  Joseph John Manak ,  William Eugene Powell, III

IPC: G02B6/42

CPC classification number: G21K1/06 ,  G21K2201/064 ,  G21K2201/067

Abstract: An optic device, system and method for imaging are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a second photon transmission property, the solid phase layers being situated between an output face and a non-flat input face. The first and second layers are conformal to each other. The imaging system includes a source of electrons and a target, with an array of the optic devices coupled thereto to form limited cone beams of X-ray radiation.

Abstract translation: 描述了用于成像的光学装置，系统和方法。 光学器件包括具有第一光子传输特性的第一折射率的第一固相层和具有第二光子透射特性的第二折射率的第二固相层，固相层位于输出面 和非平面输入面。 第一层和第二层彼此共形。 成像系统包括电子源和靶，其中耦合到其上的光学器件的阵列形成有限的X射线辐射的锥形束。

公开(公告)号：US07280634B2

公开(公告)日：2007-10-09

申请号：US11449208

申请日：2006-06-08

Applicant: Boris Verman ,  Jimpei Harada

Inventor： Boris Verman ,  Jimpei Harada

IPC: G21K1/06

CPC classification number: B82Y10/00 ,  G21K1/062 ,  G21K2201/061 ,  G21K2201/062 ,  G21K2201/064

Abstract: An x-ray beam conditioning system with a first diffractive element and a second diffractive element. The two diffractive elements are arranged in a sequential configuration, and one of the diffractive elements is a crystal. The other diffractive element may be a multilayer optic.

Abstract translation: 一种具有第一衍射元件和第二衍射元件的X射线束调节系统。 两个衍射元件按顺序配置，其中一个衍射元件是晶体。 另一个衍射元件可以是多层光学元件。

公开(公告)号：US07206375B2

公开(公告)日：2007-04-17

申请号：US11291349

申请日：2005-12-01

Applicant: Zewu Chen ,  Walter Gibson

Inventor： Zewu Chen ,  Walter Gibson

IPC: G01F23/06

CPC classification number: G01N23/02 ,  G01N23/06 ,  G21K2201/062 ,  G21K2201/064

Abstract: Compact, low-power-consuming systems and methods for exposing samples to high-energy radiation, for example, for exposing samples to x-rays for implementing x-ray absorption near edge analysis (XANES). The systems and methods include a low-power-consuming radiation source, such as an x-ray tube; one or more tunable crystal optics for directing and varying the energy of the radiation onto a sample under analysis; and a radiation detecting device, such as an x-ray detector, for detecting radiation emitted by the sample. The one or more tunable crystal optics may be doubly-curved crystal optics. The components of the system may be arranged in a collinear fashion. The disclosed systems and methods are particularly applicable to XANES analysis, for example, XANES analysis of the chemical state of chromium or another transition metal in biological processes.

Abstract translation: 用于将样品暴露于高能辐射的紧凑，低功耗系统和方法，例如将样品暴露于X射线以实现近边缘分析（XANES）的X射线吸收。 该系统和方法包括低功耗辐射源，例如x射线管; 一个或多个可调晶体光学器件，用于将辐射的能量引导和分析到分析的样品上; 以及用于检测样品发射的辐射的诸如x射线检测器的放射线检测装置。 一个或多个可调晶体光学器件可以是双曲面晶体光学器件。 系统的组件可以以共线的方式布置。 所公开的系统和方法特别适用于XANES分析，例如，XANES分析生物过程中铬或其他过渡金属的化学状态。

公开(公告)号：US07084412B2

公开(公告)日：2006-08-01

申请号：US10952412

申请日：2004-09-28

Applicant: Markus Weiss

Inventor： Markus Weiss

IPC: H01J21/425

CPC classification number: B82Y10/00 ,  G03F7/70166 ,  G21K1/06 ,  G21K2201/064

Abstract: There is provided a collector unit for illumination systems with a wavelength of ≦193 nm, preferably ≦126 nm, and especially preferably in the region of EUV wavelengths. Rays of a beam bundle impinge on the collector unit, and the beam bundle emerges from an object in an object plane. The collector unit includes at least one mirror shell that receives the rays of the beam bundle emerging from the object and shows an optical effect, and a periodic structure with at least one grating period applied to at least a part of the mirror shell. An illumination system and an EUV projection exposure system are also provided.

Abstract translation: 为波长<= 193nm，优选<= 126nm，特别优选在EUV波长区域的照明系统提供收集器单元。 束束的射线照射在收集器单元上，并且束束从物平面中的物体出射。 收集器单元包括至少一个镜壳，其接收从物体出射的束束的光线并且显示光学效应，以及具有施加到镜壳的至少一部分的至少一个光栅周期的周期性结构。 还提供照明系统和EUV投影曝光系统。

公开(公告)号：US20060120508A1

公开(公告)日：2006-06-08

申请号：US11291349

申请日：2005-12-01

Applicant: Zewu Chen ,  Walter Gibson

Inventor： Zewu Chen ,  Walter Gibson

IPC: G21K1/06

CPC classification number: G01N23/02 ,  G01N23/06 ,  G21K2201/062 ,  G21K2201/064

Abstract: Compact, low-power-consuming systems and methods for exposing samples to high-energy radiation, for example, for exposing samples to x-rays for implementing x-ray absorption near edge analysis (XANES). The systems and methods include a low-power-consuming radiation source, such as an x-ray tube; one or more tunable crystal optics for directing and varying the energy of the radiation onto a sample under analysis; and a radiation detecting device, such as an x-ray detector, for detecting radiation emitted by the sample. The one or more tunable crystal optics may be doubly-curved crystal optics. The components of the system may be arranged in a collinear fashion. The disclosed systems and methods are particularly applicable to XANES analysis, for example, XANES analysis of the chemical state of chromium or another transition metal in biological processes.

Abstract translation: 用于将样品暴露于高能辐射的紧凑，低功耗系统和方法，例如将样品暴露于X射线以实现近边缘分析（XANES）的X射线吸收。 该系统和方法包括低功耗辐射源，例如x射线管; 一个或多个可调晶体光学器件，用于将辐射的能量引导和分析到分析的样品上; 以及用于检测样品发射的辐射的诸如x射线检测器的放射线检测装置。 一个或多个可调晶体光学器件可以是双曲面晶体光学器件。 系统的组件可以以共线的方式布置。 所公开的系统和方法特别适用于XANES分析，例如，XANES分析生物过程中铬或其他过渡金属的化学状态。

公开(公告)号：US20050117705A1

公开(公告)日：2005-06-02

申请号：US10957878

申请日：2004-10-04

Applicant: Timothy Morrison ,  Ivan Nesch ,  Gocha Khelashvili

Inventor： Timothy Morrison ,  Ivan Nesch ,  Gocha Khelashvili

IPC: G21K1/06 ,  H01J35/06 ,  H01J35/08

CPC classification number: H01J35/06 ,  G21K1/06 ,  G21K2201/062 ,  G21K2201/064 ,  H01J35/08 ,  H01J2235/086

Abstract: An x-ray source for producing a uniformly intense area x-ray beam. The x-ray source includes a vacuum chamber. An area electron emitter is disposed at a first end of the vacuum chamber. A target material is disposed at a second end of the vacuum chamber and spaced apart from the area electron emitter. The area electron emitter and the target material are correspondingly shaped and/or correspondingly curved. The x-ray source also includes at least one high voltage power source. The area electron emitter is electrically connected to a negative pole of one of the at least one high voltage power source and the target electrically connected to a positive pole of one of the at least one high voltage power source.

Abstract translation: 用于产生均匀强烈区域X射线束的x射线源。 x射线源包括真空室。 区域电子发射体设置在真空室的第一端。 目标材料设置在真空室的第二端并与区域电子发射体间隔开。 区域电子发射器和靶材料相应地成形和/或相应地弯曲。 x射线源还包括至少一个高压电源。 区域电子发射体电连接到至少一个高电压电源中的一个的负极和电连接到至少一个高压电源之一的正极的目标。

公开(公告)号：US20040131146A1

公开(公告)日：2004-07-08

申请号：US10742414

申请日：2003-12-19

Applicant: X-Ray Optical Systems, Inc.

Inventor： Zewu Chen ,  David M. Gibson

IPC: G21K004/00

CPC classification number: G21K1/062 ,  B82Y10/00 ,  G01N23/223 ,  G01N2223/076 ,  G21K1/06 ,  G21K2201/064

Abstract: X-ray fluorescence (XRF) spectroscopy systems and methods are provided. One system includes a source of x-ray radiation and an excitation optic disposed between the x-ray radiation source and the sample for collecting x-ray radiation from the source and focusing the x-ray radiation to a focal point on the sample to incite at least one analyte in the sample to fluoresce. The system further includes an x-ray fluorescence detector and a collection optic comprising a doubly curved diffracting optic disposed between the sample and the x-ray fluorescence detector for collecting x-ray fluorescence from the focal point on the sample and focusing the fluorescent x-rays towards the x-ray fluorescence detector.

Abstract translation: 提供X射线荧光（XRF）光谱系统和方法。 一个系统包括x射线辐射源和设置在x射线辐射源和样本之间的激发光学器件，用于收集来自源的x射线辐射并将x射线辐射聚焦到样品上的焦点以煽动 样品中至少有一种分析物发出荧光。 该系统还包括x射线荧光检测器和收集光学器件，其包括设置在样品和x射线荧光检测器之间的双曲面衍射光学器件，用于从样品上的焦点收集X射线荧光，并将荧光x- 射线朝向X射线荧光检测器。

公开(公告)号：US20040107731A1

公开(公告)日：2004-06-10

申请号：US10636717

申请日：2003-08-07

Inventor： Thorsten Doehring ,  Ralf Jedamzik ,  Hauke Esemann ,  Eva Hoelzel

IPC: C03B023/035 ,  C03C010/12

CPC classification number: C03B23/0357 ,  C03B19/02 ,  C03B23/025 ,  C03B23/0252 ,  C03B32/02 ,  C03B40/00 ,  C03C10/0027 ,  G21K1/067 ,  G21K2201/064 ,  G21K2201/067

Abstract: A process for forming glass or glass ceramics is disclosed, wherein a glass ceramics form (12) is made from a starting glass by molding, which is transformed by a heat treatment into a keatite glass ceramic comprising predominantly keatite mixed crystals. With such a keatite glass ceramics form (12) formed bodies can be prepared from blank parts by sagging under gravity force at a temperature above the glass transition temperature of the blank part (14).

Abstract translation: 公开了一种用于形成玻璃或玻璃陶瓷的方法，其中玻璃陶瓷形式（12）由起始玻璃通过模塑制成，其通过热处理转变成主要包含酮钛矿混晶的酮铁玻璃陶瓷。 通过这样的酮铁玻璃陶瓷形式（12），可以通过在高于坯料部分（14）的玻璃化转变温度的温度下在重力作用下垂而由坯件制备成形体。