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    MINIATURE TIME-OF-FLIGHT MASS SPECTROMETER
    42.
    发明申请
    MINIATURE TIME-OF-FLIGHT MASS SPECTROMETER 有权
    微型飞行时间质谱仪

    公开(公告)号：US20150155154A1

    公开(公告)日：2015-06-04

    申请号：US14407531

    申请日：2013-06-12

    Applicant: C&E RESEARCH, INC.

    Inventor： Timothy Cornish ,  Scott Ecelberger

    IPC: H01J49/40 ,  H01J49/02 ,  H01J49/00

    CPC classification number: H01J49/405 ,  H01J49/0013 ,  H01J49/025

    Abstract: A miniature time-of-flight mass spectrometer (TOF-MS) was developed for a NASA/ASTID program beginning 2008. The primary targeted application for this technology is the detection of non-volatile (refractory) and biological materials on landed planetary missions. Both atmospheric and airless bodies are potential candidate destinations for the purpose of characterizing mineralogy, and searching for evidence of existing or extant biological activity.

    Abstract translation: 从2008年开始，为NASA / ASTID计划开发了一种微型飞行时间质谱仪（TOF-MS）。该技术的主要目标应用是检测着陆行星任务中的非挥发性（难熔）和生物材料。 大气和无气体都是潜在的候选目的地，用于表征矿物学，并寻找现有或现存生物活性的证据。

    REFLECTRONS AND METHODS OF PRODUCING AND USING THEM
    43.
    发明申请
    REFLECTRONS AND METHODS OF PRODUCING AND USING THEM 审中-公开
    电子生产与使用方法

    公开(公告)号：US20150028202A1

    公开(公告)日：2015-01-29

    申请号：US14289822

    申请日：2014-05-29

    Applicant: Anthony Chiappetta ,  Urs Steiner ,  Keith Ferrara

    Inventor： Anthony Chiappetta ,  Urs Steiner ,  Keith Ferrara

    IPC: H01J49/06 ,  H01J49/40

    CPC classification number: H01J49/067 ,  H01J49/405

    Abstract: Certain embodiments described herein are directed to reflectron assemblies and methods of producing them. In some configurations, a reflectron comprising a plurality of lenses each comprising a planar body and comprising a plurality of separate and individual conductors spanning a central aperture from a first side to a second side of a first surface of the planar body is described. In some instances, the plurality of conductors are each substantially parallel to each other and are positioned in the same plane.

    Abstract translation: 本文描述的某些实施例涉及反射器组件及其制造方法。 在一些配置中，描述了包括多个透镜的反射器，每个透镜都包括平面主体，并且包括多个分离的和单独的导体，跨越从平面主体的第一表面的第一侧到第二侧的中心孔。 在一些情况下，多个导体各自基本上彼此平行并且位于同一平面中。

    TIME OF FLIGHT TUBES AND METHODS OF USING THEM
    44.
    发明申请
    TIME OF FLIGHT TUBES AND METHODS OF USING THEM 审中-公开
    飞行时间及其使用方法

    公开(公告)号：US20150014524A1

    公开(公告)日：2015-01-15

    申请号：US14291417

    申请日：2014-05-30

    Applicant: Anthony Chiappetta ,  Urs Steiner ,  Keith Ferrara

    Inventor： Anthony Chiappetta ,  Urs Steiner ,  Keith Ferrara

    IPC: H01J49/02 ,  H01J49/24 ,  H01J49/40

    CPC classification number: H01J49/405 ,  H01J49/02 ,  H01J49/24 ,  H01J49/40

    Abstract: Certain embodiments described herein are directed to time of flight tubes comprising a cylindrical tube comprising an inner surface and an outer surface, the cylindrical tube comprising an effective thickness and sized and arranged to couple to and support a reflectron assembly inside the cylindrical tube. In some configurations, the cylindrical tube further comprises a conductive material disposed on the inner surface of the cylindrical tube, the conductive material present in an effective amount to provide a field free region for ions when the conductive material is charged.

    Abstract translation: 本文描述的某些实施例涉及包括包括内表面和外表面的圆柱形管的飞行管的时间，圆柱形管包括有效厚度，并且其尺寸和布置成联接到圆柱形管内部并支撑反射器组件。 在一些构造中，圆柱形管还包括设置在圆柱形管的内表面上的导电材料，导电材料以有效的量存在，以便在导电材料充电时为离子提供无场区域。

    Method of mass-spectrometry and a device for its realization
    46.
    发明授权
    Method of mass-spectrometry and a device for its realization 有权
    质谱法及其实现装置

    公开(公告)号：US08598516B2

    公开(公告)日：2013-12-03

    申请号：US13737018

    申请日：2013-01-09

    Applicant: Yerbol Aldanovich Sapargaliyev ,  Aldan Asanovich Sapargaliyev

    Inventor： Yerbol Aldanovich Sapargaliyev ,  Aldan Asanovich Sapargaliyev

    IPC: B01D59/44

    CPC classification number: H01J49/405 ,  G01N30/72 ,  H01J49/406 ,  H01J49/408

    Abstract: The present invention relates to the analytical electronics used to identify compositions and structures of substances, in particular, to the analyzers comprising at least one mass-spectrometer (MS) and may be applied in such fields as medicine, biology, gas and oil industry, metallurgy, energy, geochemistry, hydrology, ecology.Technical result provides the increase in MS resolution, gain in sensitivity, precision and measurement rates of substances compositions and structures concurrently with enhancement of analyzer functional capabilities, downsizing and mass reduction.In claimed invention the ion flux generation and its guiding are performed in off-axis single-flow mode; parallel multi-stage mode; through use of three-dimensional field with mean meridian surface including without limitation three-dimensional reflecting and dual-zoned reflecting modes or by method of multi-reflection arrays.Devices to implement the claimed method are embodied.Proposed schematic ion optical diagrams allow developing different MS types notable for their minimized material intensity and geometrical dimensions.

    Abstract translation: 本发明涉及用于识别物质的组成和结构的分析电子装置，特别是包括至少一种质谱仪（MS）的分析仪，并且可以应用于医药，生物学，燃气和石油工业等领域， 冶金，能源，地球化学，水文学，生态学。 技术结果同时提高了分析仪的功能能力，缩小尺寸和减少质量，同时提高了MS分辨率，灵敏度增益，精度和测量速度。 在要求保护的发明中，离子通量产生及其引导在离轴单流模式下进行; 并行多级模式; 通过使用具有平均子午线表面的三维场，包括但不限于三维反射和双分区反射模式，或通过多反射阵列的方法。 具体实现所要求保护的方法的装置。 提出的示意​​图光学图表允许开发不同于其最小化材料强度和几何尺寸的不同MS类型。

    Mass analysis device with wide angular acceptance including a reflectron
    47.
    发明授权
    Mass analysis device with wide angular acceptance including a reflectron 有权
    具有广角角接受的质量分析装置包括反射镜

    公开(公告)号：US08502139B2

    公开(公告)日：2013-08-06

    申请号：US13201323

    申请日：2010-02-12

    Applicant: Mikhail Yavor

    Inventor： Mikhail Yavor

    IPC: H01J49/40 ,  H01J49/26 ,  B01D59/44

    CPC classification number: H01J49/405 ,  H01J49/0004

    Abstract: A mass analysis device with wide angular acceptance, notably of the mass spectrometer or atom probe microscope type, includes means for receiving a sample, means for extracting ions from the surface of the sample, and a reflectron producing a torroidal electrostatic field whose equipotential lines are defined by a first curvature in a first direction and a first center of curvature, and a second curvature in a second direction perpendicular to the first direction and a second center of curvature, the sample being positioned close to the first center of curvature.

    Abstract translation: 具有广角角接受度的质量分析装置，特别是质谱仪或原子探针显微镜类型的质量分析装置包括用于接收样品的装置，用于从样品表面提取离子的装置，以及产生其等势线的环形静电场的反射器 由第一方向和第一曲率中心的第一曲率和与第一方向垂直的第二方向和第二曲率中心的第二曲率限定，该样本定位成接近第一曲率中心。

    Reflector for a time-of-flight mass spectrometer
    48.
    发明授权
    Reflector for a time-of-flight mass spectrometer 有权
    飞行时间质谱仪的反射器

    公开(公告)号：US08314381B2

    公开(公告)日：2012-11-20

    申请号：US13011038

    申请日：2011-01-21

    Applicant: Peter Bisling

    Inventor： Peter Bisling

    IPC: H01J49/40 ,  H01J49/22

    CPC classification number: H01J49/405

    Abstract: A reflector for a time-of-flight mass spectrometer for reflecting ionized atoms and/or molecules, with an entry opening and with an arrangement of successively arranged ring electrodes extending away from the entry opening along a longitudinal axis of the reflector is illustrated and described, as is a time-of-flight mass spectrometer. The object of providing a reflector for a time-of-flight mass spectrometer or providing such a mass spectrometer, with improved mass resolution at a high detection probability, is achieved by virtue of the fact that the ring electrode closest to the entry opening serves as a correction electrode and is at an opposite electric potential compared to the other ring electrodes, that a screening electrode is provided on the side of the entry opening facing away from the ring electrodes and that the screening electrode lies at a potential that differs from that of the ring electrodes, more preferably at earth potential.

    Abstract translation: 示出并描述了用于反射离子化原子和/或分子的飞行时间质谱仪的反射器，具有入口和具有沿着反射器的纵向轴线远离入口的连续布置的环形电极的布置 ，飞行时间质谱仪也是如此。 通过以下事实可以实现提供用于飞行时间质谱仪的反射器或提供这种质谱分析仪的质量分辨率高的检测概率，这是因为最接近入口孔的环形电极用作 校正电极并且与其它环形电极相比具有相反的电位，所述屏蔽电极设置在所述入口的背离所述环形电极的一侧，并且所述屏蔽电极位于与 环电极，更优选地电位。

    DEVICE, SYSTEM, AND METHOD FOR REFLECTING IONS
    49.
    发明申请
    DEVICE, SYSTEM, AND METHOD FOR REFLECTING IONS 有权
    用于反射离子的装置，系统和方法

    公开(公告)号：US20120280121A1

    公开(公告)日：2012-11-08

    申请号：US13101008

    申请日：2011-05-04

    Applicant: Gangqiang Li

    Inventor： Gangqiang Li

    IPC: H01J49/40 ,  H01J3/18

    CPC classification number: H01J49/405 ,  H01J3/16

    Abstract: Devices and systems for reflecting ions are provided. In general, the devices and systems include a plurality of curved lens plates adapted for connection to at least one voltage source and having a passage therein to allow the ions to pass therethrough. The plurality of curved lens plates generates electric fields having elliptic equipotential surfaces that reflect and focus the ions as they pass through the passage. Reflectron time-of-flight (RE-TOF) spectrometers are also provided that include an ion source, ion detector, and such a reflectron as described above. Mass spectrometer systems are provided that comprise an ion source that generates ions and a reflectron TOF spectrometer such as described above.

    Abstract translation: 提供了用于反射离子的装置和系统。 通常，装置和系统包括适于连接至少一个电压源的多个弯曲透镜板，并且其中具有允许离子通过的通道。 多个弯曲透镜板产生具有椭圆等电位面的电场，它们在通过通道时反射和聚焦离子。 还提供了反射器飞行时间（RE-TOF）光谱仪，其包括如上所述的离子源，离子检测器和反射器。 提供包括产生离子的离子源和如上所述的反射体TOF光谱仪的质谱仪系统。

    Multireflection Time-Of-Flight Mass Spectrometer
    50.
    发明申请
    Multireflection Time-Of-Flight Mass Spectrometer 有权
    多反射飞行时间质谱仪

    公开(公告)号：US20110017907A1

    公开(公告)日：2011-01-27

    申请号：US12809867

    申请日：2008-12-22

    Applicant: Alexander A. Makarov ,  Dmitry E. Grinfield ,  Mikhail A. Monastyrskiy

    Inventor： Alexander A. Makarov ,  Dmitry E. Grinfield ,  Mikhail A. Monastyrskiy

    IPC: H01J49/40

    CPC classification number: H01J49/406 ,  H01J49/061 ,  H01J49/405

    Abstract: The present invention provides a method of reflecting ions in a multireflection time of flight mass spectrometer comprising providing an ion mirror having a plurality of electrodes, the ion mirror having a cross section with a first, minor axis (Y) and a second, major axis (X) each perpendicular to a longitudinal axis (Z) of the ion mirror which lies generally in the direction of time of flight separation of the ions in the mirror; guiding ions towards the ion mirror; applying a voltage to the electrodes so as to create an electric field which: (a) causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror which contains the longitudinal (Z) and major axes (X) of the mirror; (b) causes the ions to reflect in the ion mirror; and (c) causes the ions to exit the ion mirror in a direction such that the mean trajectory of ions passing through the ion mirror has a component of movement in a direction (Y) perpendicular to and diverging from the said plane of symmetry thereof.

    Abstract translation: 本发明提供一种在多反射飞行时间质谱仪中反射离子的方法，包括提供具有多个电极的离子反射镜，所述离子反射镜具有具有第一短轴（Y）和第二长轴（Y）的横截面 （X），每个垂直于离子镜的纵向轴线（Z），其通常位于反射镜中的离子的飞行时间分离方向上; 引导离子到离子镜; 向电极施加电压以产生电场：（a）使离子的平均轨迹与包含纵向（Z）和长轴（X）的离子镜的对称平面相交， 镜子; （b）使离子在离子反射镜中反射; 和（c）使得离子离开离子反射镜的方向，使得通过离子镜的离子的平均轨迹具有与所述对称平面垂直的方向（Y）和与其对称的发散方向的运动分量。

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