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    MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE
    1.
    发明公开
    MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE 审中-公开

    公开(公告)号：US20240339314A1

    公开(公告)日：2024-10-10

    申请号：US18578838

    申请日：2022-07-08

    Applicant: Micromass UK Limited

    Inventor： Jason Lee Wildgoose

    IPC: H01J49/40 ,  H01J49/00 ,  H01J49/06

    CPC classification number: H01J49/406 ,  H01J49/0031 ,  H01J49/061

    Abstract: A multi-reflecting time of flight mass spectrometer (8) comprising: a mass filter or mass separator (6); an ion accelerator (14) for pulsing packets of ions; ion mirrors (10) arranged to receive the ions from the ion accelerator (14) and reflect them in a first dimension (x-dimension) between the ion mirrors (10) as the ions travel in a second dimension (z-dimension); first (20) and second (22) ion reflectors arranged such that when they are both activated they reflect the ions back and forth in the second dimension; an ion detector (16) arranged to receive the ions, when a first of the ion reflectors (20,22) is deactivated; and control circuitry configured to: control the ion accelerator (14) to perform a first pulse sequence that pulses a first plurality of packets of ions into the ion mirrors (10); control the reflectors (20,22) such that ions in said plurality of packets are reflected back and forth in the second dimension by the reflectors (20,22) at the same time; and control the range of mass to charge ratios that is able to be transmitted by the mass filter or mass separator (6) to the ion accelerator (14), and the timings at which the first reflector (20) is activated and deactivated, such that substantially all of the ions from said plurality of packets of ions undergo the same number of reflections in the second dimension before being received at the detector (16).

    HIGH PRESSURE ION OPTICAL DEVICES
    2.
    发明公开
    HIGH PRESSURE ION OPTICAL DEVICES 审中-公开

    公开(公告)号：US20240186132A1

    公开(公告)日：2024-06-06

    申请号：US18546931

    申请日：2022-02-18

    Applicant: Philip MARRIOTT

    Inventor： Philip MARRIOTT

    IPC: H01J49/06 ,  G01N27/622 ,  H01J49/04

    CPC classification number: H01J49/061 ,  G01N27/622 ,  H01J49/0422

    Abstract: A multipole ion optical device comprises a first plurality of electrodes distributed along a first axis; and a second plurality of electrodes distributed along a second axis, generally parallel to the first axis, to define an ion channel between the first and second pluralities of electrodes. Each of the first plurality of electrodes and the second plurality of electrodes is configured to receive a respective RF voltage having an asymmetric waveform and such that adjacent electrodes of the first and second pluralities of electrodes receive RF voltages having different phases. The first and second plurality of electrodes and the plurality of RF voltages are configured such that a strength of an electric field in the ion channel is sufficient for ions to experience mobility variation.

    SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN ELECTROSTATIC ION TRAP
    4.
    发明公开
    SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN ELECTROSTATIC ION TRAP 审中-公开

    公开(公告)号：US20230402272A1

    公开(公告)日：2023-12-14

    申请号：US18032251

    申请日：2021-09-14

    Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.

    Inventor： Eric Thomas Dziekonski

    IPC: H01J49/00 ,  H01J49/06 ,  H01J49/42 ,  H01J49/40

    CPC classification number: H01J49/009 ,  H01J49/061 ,  H01J49/063 ,  H01J49/4245 ,  H01J49/405 ,  H01J49/408

    Abstract: Systems and methods are disclosed for ion injection into an electrostatic trap. Various aspects of this disclosure provide a mass spectrometer system including a primary ion path including a plurality of quadrupoles; and a secondary ion path coupled to the primary ion path utilizing turning elements. The secondary ion path may include an electrostatic linear ion trap (ELIT), the ELIT being operable to analyze ions diverted from the primary ion path and return them to the primary ion path. The primary ion path may include a time-of-flight mass analyzer. The secondary ion path may be bi-directional. Ions may travel in a first direction when coupled into the secondary ion path using a first turning element in the primary ion path and may travel in a second direction when coupled into the secondary ion path utilizing a second turning element in the primary ion path. The secondary ion path may include a collision quadrupole.

    MASS ANALYSER HAVING EXTENDED FLIGHT PATH
    7.
    发明申请
    MASS ANALYSER HAVING EXTENDED FLIGHT PATH 审中-公开

    公开(公告)号：US20190206669A1

    公开(公告)日：2019-07-04

    申请号：US16325965

    申请日：2017-08-11

    Applicant: Micromass UK Limited ,  LECO CORPORATION

    Inventor： Anatoly Verenchikov ,  Mikhail Yavor

    IPC: H01J49/40 ,  H01J49/00 ,  H01J49/42 ,  H01J49/06

    CPC classification number: H01J49/408 ,  H01J49/0031 ,  H01J49/061 ,  H01J49/4245

    Abstract: A time-of-flight or electrostatic trap mass analyzer is disclosed comprising: an ion flight region comprising a plurality of ion-optical elements (30-35) for guiding ions through the flight region in a deflection (x-y) plane. The ion-optical elements are arranged so as to define a plurality of identical ion-optical cells, wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location. Each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane. The ion-optical elements in each cell are configured to generate electric fields that either (i) have mirror symmetry in the deflection plane about a line in the deflection plane that is perpendicular to a mean ion path through the cell at a point half way along the mean ion path through the cell, or (ii) have point symmetry in the deflection plane about a point in the deflection plane that is half way along the mean ion path through the cell. The ion-optical elements are arranged and configured such that, in the frame of reference of the ions, the ions are guided through the deflection plane in the ion-optical cells along mean flight paths that are of the same shape and length in each ion-optical cell.

    Method of Transmitting Ions Through an Aperture
    9.
    发明申请
    Method of Transmitting Ions Through an Aperture 审中-公开

    公开(公告)号：US20180308677A1

    公开(公告)日：2018-10-25

    申请号：US15953913

    申请日：2018-04-16

    Applicant: MICROMASS UK LIMITED

    Inventor： Jeffery Mark Brown ,  Paul Murray

    IPC: H01J49/06 ,  H01J49/40 ,  H01J49/16 ,  H01J49/00 ,  H01J49/04

    CPC classification number: H01J49/061 ,  H01J49/0027 ,  H01J49/0495 ,  H01J49/06 ,  H01J49/164 ,  H01J49/40

    Abstract: A mass spectrometer includes: an ion source; an aperture; a flight region arranged between the ion source and aperture for separating ions according to their mass to charge ratio; and ion optics arranged and configured for causing ions to be reflected or deflected whilst they separate according to mass to charge ratio in the flight region and such that the ions are focussed to a geometrical focal point at the aperture so that the ions are transmitted through the aperture. The multi-reflecting or multi-deflecting ion optics provides a relatively long flight path for the ions, whilst naturally converging the ion beam to a focus. As this focus is arranged at the aperture, it enables the aperture to be made relatively small whilst still maintaining high ion transmission efficiency.

    Electrodynamic Mass Analysis
    10.
    发明申请
    Electrodynamic Mass Analysis 审中-公开

    公开(公告)号：US20180286653A1

    公开(公告)日：2018-10-04

    申请号：US15471507

    申请日：2017-03-28

    Applicant: Varian Semiconductor Equipment Associates, Inc.

    Inventor： Frank Sinclair ,  Joseph C. Olson ,  Costel Biloiu ,  Alexandre Likhanskii ,  Peter F. Kurunczi

    IPC: H01J49/06 ,  H01J49/40 ,  H01J49/10

    CPC classification number: H01J49/061 ,  H01J37/05 ,  H01J37/3171 ,  H01J49/10 ,  H01J49/22

    Abstract: An electrodynamic mass analysis system which has the capability of filtering unwanted species from an extracted ion beam without the use of a mass analyzer magnet is disclosed. The electrodynamic mass analysis system includes an ion source and an electrode disposed outside the ion source. The ion source and the electrode are biased relative to one another so as to emit pulses of ions. Each of these pulses enters a tube where each ion travels at a speed related to its mass. Thus, ions of the same mass travel in clusters through the tube. Ions reach the distal end of the tube separated temporally and spatially from one another based on their mass. The ions then enter a deflector, which is energized so as to allow the cluster of ions having the desired mass to pass through a resolving aperture disposed at the exit of the deflector.

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