Abstract:
In an optical spectrum analyzer, the respective wavelength bandwidths of the optical spectrum analyzer are determined at the wavelengths of the reference lines and used as calibration data for determining measurement tolerances by means of reference lines of known wavelength and known wavelength bandwidths from the known wavelength bandwidths of the reference lines and from the wavelength bandwidths of the reference lines measured with the optical spectrum analyzer
Abstract:
A spectrometer has a source of illumination radiation having a plurality of spectral wavelengths, a bandpass filter, a dispersive beamsplitter disposed in an optical path of said source of illumination radiation, an illumination radiation rejection filter, and a spectrograph disposed in a path of radiation from a sample illuminated by illumination radiation from said source of illumination radiation. The dispersive beamsplitter, the bandpass filter, the illumination radiation rejection filter and spectrograph are tunable in correspondence to a selected one of the plurality of spectral wavelengths of the source of illumination radiation. The dispersive beamsplitter directs the selected one of the plurality of spectral wavelengths of illumination radiation to a sample and directs elastically scattered and reflected radiation from the sample out of a measurement beam of light emanating from the sample. The inelastically scattered light passes through the dispersive beamsplitter essentially unaffected and is directed to the illumination radiation rejection filter and the spectrograph.
Abstract:
A device for monitoring wavelength division multiplexed optical signals for use in an optical network and in an optical performance monitor. A device has a structure for supporting components of the device. An optical component is supported at one end of the structure for transmitting the optical signals. A diffraction grating is supported at an opposing end of the structure for diffracting the optical signals from the optical component. An optical sensor is supported in relation to the diffraction grating by the structure for monitoring the optical signals. A telephoto lens assembly is supported by the structure and disposed between the optical sensor and the diffraction grating, the lens assembly having a focal length for focusing the optical signals in relation to the optical sensor. Thermal effects on the structure are balanced against thermal effects on the lens assembly. A prism is disposed between the lens assembly and diffraction grating. The prism is configured to anamorphically compress the diffracted optical signals. Thermal effects on the diffraction grating are balanced against thermal effects on the lens and prism.
Abstract:
The spectrometer comprises, in combination: a slit (1) for the entry of a light beam; a collimator; a dispersion system (9); focusing means and a detector (13). The collimator comprises at least a first concave spherical mirror (3) and at least a first Schmidt plate (5) in an off-axis arrangement.
Abstract:
A transform spectrometer determines the spectrum of light based on the Talbot effect. Light to be analyzed is passed through a spatially periodic object, thereby generating a series of Talbot images. The intensities of these Talbot images at different optical distances from the spatially periodic object are then detected, and Fourier transformed to determine the spectrum of the light. Preferably, the detector comprises a spatial masking pattern such that the intensities detected are maximized at Talbot planes or at the midpoints between Talbot planes. In one embodiment, the optical distance between the spatially periodic object and the detector is changed in order to detect image intensities at different Talbot planes. In another embodiment, the detector and the spatially periodic object are positioned along a common optical axis at relative angle &thgr; such that different detector rows detect intensities at different Talbot planes. In yet another embodiment, the spatially periodic object is both a grating and a detector, and the Talbot images generated by the grating are reflected off a mirror back to the detector.
Abstract:
An apparatus and method for utilizing NIR spectrography for measuring major constituents of substances in real time includes a monochromator or other sensor having no moving optical parts. At least one of the monochromator and the substance are moving relative to one another. An NIR radiation source irradiates a substance and the reflected or passed-through radiation is transmitted to the monochromator, which isolates and detects narrow portions of the received spectrum. By analyzing the intensities and wavelengths of the received radiation, the presence and amount of major constituents of the substance can be determined.
Abstract:
The present invention includes a system and method for characterizing the wavelength of a beam of radiation using a known reference transition. The invention comprises a vapor including a material having a transition which absorbs radiation of a known wavelength, the vapor being contained in a container. The container includes an optical path along which the beam of radiation can propagate through the vapor. A dispersive optical element is aligned along the optical path. A detector is aligned along the optical path after the dispersive element. Wavelength information about the beam of radiation is determined from the position of a dip in the detector signal that is correlated to the known reference transition. This method is most useful when the laser bandwidth substantially exceeds the transition bandwidth.
Abstract:
The present invention relates to an optical amplifier and an optical communication system applied to WDM (wavelength division multiplexing). The optical amplifier includes an optical amplifying medium to which WDM signal light obtained by wavelength division multiplexing a plurality of optical signals having different wavelengths is supplied, a pumping unit for pumping the optical amplifying medium such that the medium gives a gain to the WDM signal light, a feedback loop for controlling the pumping unit so that the gain is maintained constant, and an optical attenuator for giving a variable attenuation to the WDM signal light. Through the structure of the present invention, it becomes possible to provide an optical amplifier which can maintain constant the optical output level per channel of WDM and can maintain the gain characteristic constant.
Abstract:
The present invention is related to a Wollaston prism (WP) comprising two birefringent wedges (W1, W2) joined by their hypotenuse to form a composite block, said wedges having optic axes (OA1, OA2) to each other at right angle. According to the invention, the optic axes (OA1, OA2) of said wedges (W1, W2) are rotated by an angle of 45° or 135°, respectively, with regard to a position wherein one of the optic axes (OA1, OA2) lies parallel to the plane formed by the hypotenuse. In an embodiment of the present invention, liquid crystal is used as material for the wedges (W1, W2) resulting in inexpensive and easy to handle Wollaston prisms.
Abstract:
A method and apparatus for the spectrochemical analysis of a sample in which a solid state array detector (82) is used to detect radiation (62) of spectrochemical interest. The invention involves the use of a shutter (72) adjacent the entrance aperture (70) of a polychromator (74-80) to expose the detector (82) to the radiation (62) for varying lengths of time whereby for short duration exposure times charge accumulation in elements (i.e. pixels) of the detector (82) due to high intensity components of the radiation is limited and for longer exposure times charge accumulation in elements (pixels) of the detector (82) due to feeble intesity components of radiation (62) is increased. This ensures that each reading of the detector (82) includes at least one exposure in which the amount of charge accumulated at each wavelength of interest is neither too little or too great. The problems of feeble radiation components not being accurately measurable and of high intensity radiation components exceeding the charge carrying capacity of elements (pixels) of the detector (82) are thereby able to be avoided. An attenuator (90) may be placed between the radiation source (60) and the detector (82) to permit longer exposure times to be used for very high intensity radiation.