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    Temperature compensation in optical sensing system
    61.
    发明授权
    Temperature compensation in optical sensing system 有权

    公开(公告)号：US09900953B2

    公开(公告)日：2018-02-20

    申请号：US15168858

    申请日：2016-05-31

    Applicant: TT Electronics Plc

    Inventor： James P. Cusey ,  Alain Potteck ,  Tri-Tue Truong

    IPC: H05B33/08 ,  G01J1/42 ,  G01J1/02

    CPC classification number: H05B33/0854 ,  G01J1/0252 ,  G01J1/08 ,  G01J1/32 ,  G01J1/42 ,  G01J2001/086 ,  H05B33/0848

    Abstract: A temperature compensation circuit for a light source (e.g., light emitting diode (LED)) whose radiant energy output decreases when ambient temperature increases includes a first circuit element for generating a first current that increases proportional to an increase in the ambient temperature, and a second circuit element for generating a second current that is first order independent of the ambient temperature. The circuit further includes a weighted current adder for generating a third current by combining the first and second currents with first and second weights applied to the first and second currents respectively. The circuit further includes a third circuit element responsive to the third current for supplying a fourth current to the light source to maintain a radiant energy output of the light source constant independent of the ambient temperature.

    Illumination Device and Method for Calibrating an Illumination Device over Changes in Temperature, Drive Current, and Time
    65.
    发明申请
    Illumination Device and Method for Calibrating an Illumination Device over Changes in Temperature, Drive Current, and Time 有权
    照明装置和照明装置的温度，驱动电流和时间变化的校准方法

    公开(公告)号：US20150377699A1

    公开(公告)日：2015-12-31

    申请号：US14314451

    申请日：2014-06-25

    Applicant: Ketra, Inc.

    Inventor： Horace C. Ho ,  Jason E. Lewis ,  David J. Knapp

    IPC: G01J1/44

    CPC classification number: H05B33/0851 ,  G01J1/0252 ,  G01J1/32 ,  G01J1/42 ,  G01J3/0286 ,  G01J3/465 ,  G01J3/505 ,  G01J2001/4252 ,  G01J2001/444 ,  G01R31/44 ,  H05B33/0866 ,  H05B33/0869 ,  H05B37/02 ,  H05B37/0227

    Abstract: An illumination device and method is provided herein for calibrating individual LEDs in the illumination device, so as to obtain a desired luminous flux and a desired chromaticity of the device over changes in drive current, temperature, and over time as the LEDs age. The calibration method may include subjecting the illumination device to a first ambient temperature, successively applying at least three different drive currents to a first LED to produce illumination at three or more different levels of brightness, obtaining a plurality of optical measurements from the illumination produced by the first LED at each of the at least three different drive currents, obtaining a plurality of electrical measurements from the photodetector and storing results of the obtaining steps within the illumination device to calibrate the first LED at the first ambient temperature. The plurality of optical measurements may generally include luminous flux and chromaticity, the plurality of electrical measurements may generally include induced photocurrents and forward voltages, and the calibration method steps may be repeated for each LED included within the illumination device and upon subjecting the illumination device to a second ambient temperature.

    Abstract translation: 本文提供一种用于校准照明装置中的各个LED的照明装置和方法，以便随着LED寿命而获得期望的光通量和装置的驱动电流，温度和随时间的变化的期望色度。 校准方法可以包括使照明装置经受第一环境温度，连续地向第一LED施加至少三个不同的驱动电流以产生三个或更多个不同亮度级别的照明，从由以下的照明产生的照明获得多个光学测量值 在所述至少三个不同驱动电流中的每一个处的所述第一LED，从所述光电检测器获得多个电测量值，并且存储所述照明装置内的所述获得步骤的结果，以在所述第一环境温度下校准所述第一LED。 多个光学测量通常可以包括光通量和色度，多个电测量通常可以包括感应光电流和正向电压，并且可以针对包括在照明装置内的每个LED重复校准方法步骤，并且对照明装置 第二个环境温度。

    LASER PATTERNING EXAMINING APPARATUS
    68.
    发明申请
    LASER PATTERNING EXAMINING APPARATUS 有权
    激光测试仪器

    公开(公告)号：US20140168639A1

    公开(公告)日：2014-06-19

    申请号：US13920266

    申请日：2013-06-18

    Applicant: Seok-Joo LEE ,  Jin-Hong JEUN

    Inventor： Seok-Joo LEE ,  Jin-Hong JEUN

    IPC: G01J1/42

    CPC classification number: G01J1/4257 ,  G01J1/0252 ,  G01J1/0414 ,  G01J1/0448 ,  G01J1/0477

    Abstract: A laser patterning examining apparatus includes a fixing plate, a rotating plate configured to move vertically with respect to the fixing plate and to rotate, a housing connected to the rotating plate, a laser emission unit over the fixing plate and emits a laser beam, a prism unit on the housing and refracts a first portion of the laser beam received from the laser emission unit and transmits a second portion of the laser beam, and a beam profiler on the housing and analyzes the pattern of the first portion refracted by the prism unit.

    Abstract translation: 激光图案检查装置包括固定板，配置成相对于固定板垂直移动并旋转的旋转板，连接到旋转板的壳体，固定板上方的激光发射单元，并发射激光束; 棱镜单元，并折射从激光发射单元接收的激光束的第一部分，并将激光束的第二部分和光束轮廓仪传输到壳体上，并分析由棱镜单元折射的第一部分的图案 。

    Chemical leak inspection system
    69.
    发明授权
    Chemical leak inspection system 有权
    化学品泄漏检测系统

    公开(公告)号：US08426813B2

    公开(公告)日：2013-04-23

    申请号：US13462609

    申请日：2012-05-02

    Applicant: David W Furry

    Inventor： David W Furry

    IPC: G01J5/02

    CPC classification number: G01M3/04 ,  G01J1/0252 ,  G01J1/0488 ,  G01J1/4228 ,  G01J3/42 ,  G01J5/0265 ,  G01J5/061 ,  G01J5/0846 ,  G01J5/0862 ,  G01J2005/0077 ,  G01M3/202 ,  G01N21/3518 ,  G01N33/0036 ,  G01N2021/1793 ,  G01N2021/3531 ,  H04N5/33

    Abstract: A method of visually detecting a leak of a chemical emanating from a component includes aiming a passive infrared camera system towards the component; filtering an infrared image with an optical bandpass filter, the infrared image being that of the leak; after the infrared image passes through the lens and optical bandpass filter, receiving the filtered infrared image with an infrared sensor device; electronically processing the filtered infrared image received by the infrared sensor device to provide a visible image representing the filtered infrared image; and visually identifying the leak based on the visible image. The passive infrared camera system includes: a lens; a refrigerated portion including the infrared sensor device and the optical bandpass filter (located along an optical path between the lens and the infrared sensor device). At least part of a pass band for the optical bandpass filter is within an absorption band for the chemical.

    Abstract translation: 视觉检测从部件发出的化学物质的泄漏的方法包括将被动红外摄像机系统朝向部件瞄准; 用光学带通滤波器过滤红外图像，红外图像是泄漏的图像; 在红外图像通过透镜和光学带通滤光器之后，用红外传感器装置接收过滤的红外图像; 电子地处理由红外线传感器装置接收的滤波后的红外图像，以提供表示经滤波的红外图像的可视图像; 并基于可见图像目视识别泄漏。 被动红外摄像机系统包括：镜头; 包括红外线传感器装置和光学带通滤光器（沿着透镜和红外线传感器装置之间的光路定位）的冷藏部。 用于光学带通滤波器的通带的至少一部分在化学品的吸收带内。

    ELECTRONIC COMPONENT
    70.
    发明申请
    ELECTRONIC COMPONENT 审中-公开
    电子元件

    公开(公告)号：US20110156190A1

    公开(公告)日：2011-06-30

    申请号：US12977695

    申请日：2010-12-23

    Applicant: Ryuji Mori

    Inventor： Ryuji Mori

    IPC: H01L23/26 ,  H01L31/02

    CPC classification number: H01L23/26 ,  G01J1/0252 ,  G01J1/0271 ,  G01J1/0407 ,  G01J5/02 ,  G01J5/041 ,  G01J5/045 ,  G01J5/046 ,  G01J5/0875 ,  H01L23/04 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/09701 ,  H01L2924/00014

    Abstract: An electronic component includes a base member comprising a main surface, a cap member on the base member, a first concave portion between the main surface and the cap member, a second concave portion on the main surface, an element on the main surface and above the second concave portion, and a getter member in the second concave portion and under the element. The second concave portion, when observed from a planar view, includes a first opening portion overlapping the element and a second opening portion not overlapping the element.

    Abstract translation: 电子部件包括：基部构件，包括主表面，基座构件上的盖构件，主表面和盖构件之间的第一凹部，主表面上的第二凹部，主表面上方的元件 所述第二凹部，以及所述第二凹部中的所述元件下的吸气部件。 当从平面观察时，第二凹部包括与元件重叠的第一开口部分和不与元件重叠的第二开口部分。

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