公开(公告)号：US20180315589A1

公开(公告)日：2018-11-01

申请号：US15770018

申请日：2015-10-23

Applicant: SHIMADZU CORPORATION

Inventor： Tomoyuki OSHIRO

IPC: H01J49/40 ,  H01J49/08

CPC classification number: H01J49/401 ,  H01J49/0009 ,  H01J49/08

Abstract: An orthogonal acceleration time-of-flight (TOF) mass spectrometer in which an ion injected into an orthogonal acceleration area is periodically accelerated in a direction orthogonal to a direction of the injection and thereby ejected into a flight space. The mass spectrometer includes: an orthogonal acceleration electrode; a voltage supplier for applying a fixed level of voltage to the orthogonal acceleration electrode with a predetermined period; a TOF determiner for detecting an ion after a completion of a flight of the ion within the flight space, and determining the TOF of the ion; a storage section in which mass determination information defining a relationship between the TOF and mass-to-charge ratio of the ion depending on the period of the applied voltage is stored; and a mass-to-charge-ratio determiner for determining the mass-to-charge ratio of an ion from the TOF of the ion determined by the TOF determiner, based on the mass determination information.

公开(公告)号：US20180277348A1

公开(公告)日：2018-09-27

申请号：US15996033

申请日：2018-06-01

Applicant: Agilent Technologies, Inc.

Inventor： Harry F. Prest ,  Mingda Wang ,  Jeffrey T. Kernan

IPC: H01J49/08 ,  H01J49/14 ,  H01J49/00

CPC classification number: H01J49/08 ,  H01J49/0031 ,  H01J49/147

Abstract: Mass spectrometry is performed utilizing an electron ionization (EI) source. The EI source ionizes a sample at different electron energies, including below and above 70 eV. The EI source may be utilized for soft ionization as well as hard ionization. The value of the electron energy may be selected so as to favor the formation of molecular ions or other ions of high analytical value. The ion source may be an axial ion source.

公开(公告)号：US10037876B2

公开(公告)日：2018-07-31

申请号：US15320953

申请日：2015-12-09

Applicant: Korea Basic Science Institute

Inventor： Seung Yong Kim ,  Mo Yang ,  Hyun Sik Kim

IPC: H01J49/00 ,  H01J49/08 ,  H01J49/42

CPC classification number: H01J49/08 ,  H01J49/147 ,  H01J49/422 ,  H01J49/424

Abstract: The present invention relates to an electron bean injection control of a mass spectrometer. A mass spectrometer of the present invention includes: a reference waveform generator configured to generate a reference waveform signal having one type of a square wave and a sine wave, a waveform generator configured to generate a sync signal synchronized with the reference waveform signal; an RF module configured to generate an RF voltage signal from the reference waveform signal and apply the RF voltage signal to an RF electrode in the ion trap, an electron beam generator configured to control an operation of an ultraviolet (UV) diode for generating an electron beam injected into the ion trap according to an input control signal, and a control circuit configured to generate the control signal by using the square wave signal.

公开(公告)号：US20140374583A1

公开(公告)日：2014-12-25

申请号：US13925470

申请日：2013-06-24

Applicant: Agilent Technologies, Inc.

Inventor： Harry F. Prest ,  Mingda Wang ,  Jeffrey T. Kernan

IPC: H01J49/08

CPC classification number: H01J49/08 ,  H01J49/0031 ,  H01J49/147

Abstract: Mass spectrometry is performed utilizing an electron ionization (EI) source. The EI source ionizes a sample at different electron energies, including below and above 70 eV. The EI source may be utilized for soft ionization as well as hard ionization. The value of the electron energy may be selected so as to favor the formation of molecular ions or other ions of high analytical value. The ion source may be an axial ion source.

Abstract translation: 使用电子电离（EI）源进行质谱分析。 EI源以不同的电子能量离子化样品，包括低于70 eV以上。 EI源可以用于软电离以及硬质电离。 可以选择电子能量的值，以有利于分子离子或其它具有高分析值的离子的形成。 离子源可以是轴向离子源。

公开(公告)号：US08716673B2

公开(公告)日：2014-05-06

申请号：US13306032

申请日：2011-11-29

Applicant: Brian Roberts Routh, Jr.

Inventor： Brian Roberts Routh, Jr.

IPC: H01J49/08 ,  H01J49/10 ,  H01J37/30

CPC classification number: H01J37/285 ,  G01T1/28 ,  H01J27/16 ,  H01J37/05 ,  H01J37/077 ,  H01J37/08 ,  H01J37/10 ,  H01J37/1471 ,  H01J37/265 ,  H01J37/30 ,  H01J37/304 ,  H01J37/305 ,  H01J37/3056 ,  H01J2237/0817 ,  H01J2237/24415 ,  H01J2237/2445 ,  H01J2237/24475 ,  H01J2237/2448 ,  H01J2237/31749

Abstract: A single column inductively coupled plasma source with user selectable configurations operates in ion-mode for FIB operations or electron mode for SEM operations. Equipped with an x-ray detector, energy dispersive x-ray spectroscopy analysis is possible. A user can selectively configure the ICP to prepare a sample in the ion-mode or FIB mode then essentially flip a switch selecting electron-mode or SEM mode and analyze the sample using EDS or other types of analysis.

Abstract translation: 具有用户可选配置的单列电感耦合等离子体源以离子模式操作，用于FIB操作或用于SEM操作的电子模式。 配备了X射线检测器，可进行能量色散X射线光谱分析。 用户可以选择性地配置ICP以制备离子模式或FIB模式的样品，然后基本上翻转选择电子模式或SEM模式的开关，并使用EDS或其他类型的分析来分析样品。

公开(公告)号：US20120037800A1

公开(公告)日：2012-02-16

申请号：US13096203

申请日：2011-04-28

Applicant: Nobuyuki TADOKORO ,  Sureerat KUNCHOO ,  Supaporn PANNAKARN ,  Veraphat PARNICH

Inventor： Nobuyuki TADOKORO ,  Sureerat KUNCHOO ,  Supaporn PANNAKARN ,  Veraphat PARNICH

IPC: H01J49/44 ,  H01J49/08

CPC classification number: G01N23/2273 ,  B29D11/0098 ,  G01N2223/61

Abstract: An aspect of the present invention relates to a method of evaluating performance of a film-forming material for forming a functional film on an eyeglass lens substrate or a functional film formed by the use of the film-forming material. The performance to be evaluated is selected from the group consisting of a sliding sensation of a surface of the functional film and an adhesion of the functional film, and the evaluation is conducted based on a change over time in a quantity of photoelectrons generated by irradiating with an X-ray the film-forming material or the functional film.

Abstract translation: 本发明的一个方面涉及一种评估用于在眼镜镜片基底上形成功能膜的成膜材料的性能的方法或通过使用成膜材料形成的功能膜。 要评价的性能选自功能膜的表面的滑动感和功能膜的粘附性，并且基于随着时间的变化而进行评价，所述光电子量通过照射而产生的光电子量 X射线成膜材料或功能膜。

公开(公告)号：US07884324B2

公开(公告)日：2011-02-08

申请号：US12130103

申请日：2008-05-30

Applicant: Robert H. Blick ,  Michael S. Westphall ,  Hua Qin ,  Lloyd M. Smith

Inventor： Robert H. Blick ,  Michael S. Westphall ,  Hua Qin ,  Lloyd M. Smith

IPC: G01N23/00 ,  G01N13/10 ,  H01J49/08

CPC classification number: H01J1/32 ,  H01J29/023 ,  H01J43/246 ,  Y10S977/762

Abstract: The present invention provides systems, devices, device components and structures for modulating the intensity and/or energies of electrons, including a beam of incident electrons. In some embodiments, for example, the present invention provides nano-structured semiconductor membrane structures capable of generating secondary electron emission. Nano-structured semiconductor membranes of this aspect of the present invention include membranes having an array of nanopillar structures capable of providing electron emission for amplification, filtering and/or detection of incident radiation, for example secondary electron emission and/or field emission. Nano-structured semiconductor membranes of the present invention are useful as converters wherein interaction of incident primary electrons and nanopillars of the nanopillar array generates secondary emission. Nano-structured semiconductor membranes of this aspect of the present invention are also useful as directed charge amplifiers wherein secondary emission from a nanopillar array provides gain functionality for increasing the intensity of radiation comprising incident electrons.

Abstract translation: 本发明提供了用于调制包括入射电子束的电子的强度和/或能量的系统，装置，器件组件和结构。 在一些实施例中，例如，本发明提供能够产生二次电子发射的纳米结构的半导体膜结构。 本发明该方面的纳米结构半导体膜包括具有能够提供用于放射，滤波和/或检测入射辐射的电子发射的纳米柱结构阵列的膜，例如二次电子发射和/或场发射。 本发明的纳米结构半导体膜可用作其中纳米柱阵列的入射一次电子和纳米柱的相互作用产生二次发射的转换器。 本发明该方面的纳米结构半导体膜也可用作定向电荷放大器，其中来自纳米柱阵列的二次发射提供了用于增加包括入射电子的辐射强度的增益功能。

公开(公告)号：US20100243887A1

公开(公告)日：2010-09-30

申请号：US12730475

申请日：2010-03-24

Applicant: Motohiro SUYAMA ,  Etsuo Iizuka ,  Akio Suzuki ,  Hiroshi Kobayashi

Inventor： Motohiro SUYAMA ,  Etsuo Iizuka ,  Akio Suzuki ,  Hiroshi Kobayashi

IPC: H01J49/40 ,  H01J49/24 ,  H01J49/08

CPC classification number: H01J49/40 ,  H01J49/025

Abstract: A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube 2 where ions fly is arranged in a vacuum vessel composed of a vacuum flange 6 and a body 1, and an MCP group 4 is attached to a tail end of the flight tube 2 via an MCP-IN electrode 3. A vacuum flange 6 is attachably and detachably attached to the body 1, and the MCP group 4, by a spring 710 provided on a circuit board 7 for detection attached to the vacuum flange 6, is urged toward an end portion of the flight tube 2 so that its orthogonality with respect to an ion flight track is secured.

Abstract translation: 提供了一种允许容易地更换MCP（微通道板）并且能够以高精度确保MCP的入射表面和离子轨道之间的正交性的质谱仪。 离子飞行的飞行管2布置在由真空法兰6和主体1组成的真空容器中，并且MCP组4经由MCP-IN电极3附接到飞行管2的尾端。真空 凸缘6可附接和可拆卸地附接到主体1，并且MCP组4通过设置在连接到真空凸缘6上的用于检测的电路板7上的弹簧710朝向飞行管2的端部被推动，使得 其相对于离子飞行轨道的正交性得到保证。

公开(公告)号：US07385210B2

公开(公告)日：2008-06-10

申请号：US11471426

申请日：2006-06-20

Applicant: Andreas Ulrich ,  Wolfgang Baether ,  Jochen Wieser

Inventor： Andreas Ulrich ,  Wolfgang Baether ,  Jochen Wieser

IPC: H01J49/00 ,  H01J49/08 ,  B01D59/44

CPC classification number: G01N27/622

Abstract: A device for spectroscopy using charged analytes has an electron generator, which sends electrons through membrane into a charging chamber. The thermal strain of the membrane may be lowered significantly if a material is selected for the membrane which contains at least one component from the group of oxides, nitrides, and carbides with at least one of the elements B, Al, C, Si, and Ti or polysilicon.

Abstract translation: 使用带电分析物的光谱仪器具有电子发生器，其通过膜将电子发送到充电室。 如果为包含至少一种元素的氧化物，氮化物和碳化物的组分的膜选择材料，则膜的热应变可以显着降低，其中元素B，Al，C，Si和 Ti或多晶硅。

公开(公告)号：US5569919A

公开(公告)日：1996-10-29

申请号：US530408

申请日：1995-09-19

Applicant: Kazushi Yokoyama ,  Norio Suzuki ,  Kenichi Inoue ,  Yukito Furukawa

Inventor： Kazushi Yokoyama ,  Norio Suzuki ,  Kenichi Inoue ,  Yukito Furukawa

IPC: G01N23/225 ,  G01Q60/44 ,  G21K1/06 ,  H01J49/08

CPC classification number: G01N23/2252

Abstract: An X-ray analytical apparatus of a wavelength dispersion type having a construction of essential parts improved using a microprobe of ion beam. An ion beam 10 is controlled to be deflected to scan in a fine region of a sample 3, a characteristic X-ray generated by irradiation of the ion beam is subjected spectro-process by a analyzing element 5 set to a predetermined radius of curvature by a curvature changing mechanism, and an X-ray having a specific wavelength selected by the spectro-process is detected by a proportional counter 7. When an angle of the analyzing element is set by a rotational stage to an incident angle of a specific X-ray determined by a detection element on the sample 3, a wide range of wavelength can be subjected to spectro-measured while the sample 3, the analyzing element 5 and the proportional counter 7 remain fixed in position. Since the proportional counter 7 is provided with a lengthy sensing portion, even if an incident position of the X-ray is changed, measurement can be made while a position of a detector remains fixed. Being a position sensitive type detector, incident position information of the X-ray different according to the wavelength can be removed, and the wavelength and strength of the X-ray can be measured while discriminating each X-ray quantum.

Abstract translation: 一种具有使用离子束的微探针改进的基本部件结构的波长分散型的X射线分析装置。 控制离子束10被偏转以在样品3的细微区域扫描，通过离子束的照射产生的特征X射线被分析元件5进行分光处理，分析元件5被设定为预定的曲率半径， 通过比例计数器7检测曲率变化机构和具有通过分光处理选择的特定波长的X射线。当将分析元件的角度设定为特定X射线的入射角时， 通过样品3上的检测元件确定的光线，可以在样品3，分析元件5和比例计数器7保持固定的位置的同时对宽范围的波长进行光谱测量。 由于比例计数器7设置有长度感测部分，所以即使X射线的入射位置改变，也可以在检测器的位置保持固定的情况下进行测量。 作为位置敏感型检测器，可以除去根据波长不同的X射线的入射位置信息，并且可以在区分每个X射线量子的同时测量X射线的波长和强度。