公开(公告)号：US20180277348A1

公开(公告)日：2018-09-27

申请号：US15996033

申请日：2018-06-01

Applicant: Agilent Technologies, Inc.

Inventor： Harry F. Prest ,  Mingda Wang ,  Jeffrey T. Kernan

IPC: H01J49/08 ,  H01J49/14 ,  H01J49/00

CPC classification number: H01J49/08 ,  H01J49/0031 ,  H01J49/147

Abstract: Mass spectrometry is performed utilizing an electron ionization (EI) source. The EI source ionizes a sample at different electron energies, including below and above 70 eV. The EI source may be utilized for soft ionization as well as hard ionization. The value of the electron energy may be selected so as to favor the formation of molecular ions or other ions of high analytical value. The ion source may be an axial ion source.

公开(公告)号：US20140374583A1

公开(公告)日：2014-12-25

申请号：US13925470

申请日：2013-06-24

Applicant: Agilent Technologies, Inc.

Inventor： Harry F. Prest ,  Mingda Wang ,  Jeffrey T. Kernan

IPC: H01J49/08

CPC classification number: H01J49/08 ,  H01J49/0031 ,  H01J49/147

Abstract: Mass spectrometry is performed utilizing an electron ionization (EI) source. The EI source ionizes a sample at different electron energies, including below and above 70 eV. The EI source may be utilized for soft ionization as well as hard ionization. The value of the electron energy may be selected so as to favor the formation of molecular ions or other ions of high analytical value. The ion source may be an axial ion source.

Abstract translation: 使用电子电离（EI）源进行质谱分析。 EI源以不同的电子能量离子化样品，包括低于70 eV以上。 EI源可以用于软电离以及硬质电离。 可以选择电子能量的值，以有利于分子离子或其它具有高分析值的离子的形成。 离子源可以是轴向离子源。

公开(公告)号：US20170089915A1

公开(公告)日：2017-03-30

申请号：US15210336

申请日：2016-07-14

Applicant: AGILENT TECHNOLOGIES, INC.

Inventor： Mingda Wang ,  Harry F. Prest

IPC: G01N33/68 ,  G01N30/72

CPC classification number: G01N33/6848 ,  G01N30/06 ,  G01N30/72 ,  G01N33/6851 ,  G01N2030/067 ,  G01N2560/00

Abstract: Methods of analyte derivatization and soft ionization are provided. The methods include contacting a sample including an analyte with a derivatization agent to produce a modified analyte including a pseudo-molecular analyte group and a leaving group connected via a fragmentable bond; and selectively breaking the fragmentable bond under soft ionization conditions to produce a predominant first fragmentation product including the pseudo-molecular analyte group and a second fragmentation product including the leaving group. The method may further include analyzing the first and second fragmentation products in a mass spectrometer to identify an ion corresponding to the pseudo-molecular analyte group. Also provided are methods for detecting analytes using gas chromatography-mass spectroscopy (GC-MS). These methods find use in a variety of applications in which mass spectroscopic analysis of samples is desired.

公开(公告)号：US10176977B2

公开(公告)日：2019-01-08

申请号：US14950983

申请日：2015-11-24

Applicant: Agilent Technologies, Inc.

Inventor： Mingda Wang

IPC: H01J49/00 ,  H01J49/14

Abstract: An ion source is configured for soft electron ionization and produces a low electron-energy, yet high-intensity, electron beam. The ion source includes an electron source that produces the electron beam and transmits it into an ionization chamber. The electron beam interacts with sample material in the ionization chamber to produce an ion beam that may be transmitted to a downstream device. The electron source is configured for generating a virtual cathode upstream of the ionization chamber, which enhances the intensity of the electron beam.

公开(公告)号：US10546738B1

公开(公告)日：2020-01-28

申请号：US16226351

申请日：2018-12-19

Applicant: Agilent Technologies, Inc.

Inventor： Mingda Wang ,  Maozi Liu ,  Patrick D. Perkins ,  Jing Tang

IPC: H01J49/04 ,  H01J49/24

Abstract: An ion transfer device includes a tube, a resistive layer on an inside surface of the tube, and a dielectric layer on the resistive layer. The device defines a conduit providing a transfer path for gas and ions. The conduit is surrounded by the dielectric layer. The dielectric layer protects the resistive layer from the chemical environment in the conduit, while being thin enough to allow charges to pass through the dielectric layer and be dissipated by the resistive layer.

公开(公告)号：US20160172146A1

公开(公告)日：2016-06-16

申请号：US14950983

申请日：2015-11-24

Applicant: Agilent Technologies, Inc.

Inventor： Mingda Wang

IPC: H01J27/20 ,  H01J49/14 ,  H01J49/00

CPC classification number: H01J49/147

Abstract: An ion source is configured for soft electron ionization and produces a low electron-energy, yet high-intensity, electron beam. The ion source includes an electron source that produces the electron beam and transmits it into an ionization chamber. The electron beam interacts with sample material in the ionization chamber to produce an ion beam that may be transmitted to a downstream device. The electron source is configured for generating a virtual cathode upstream of the ionization chamber, which enhances the intensity of the electron beam.

Abstract translation: 离子源被配置为软电子电离，并产生低电子能量但高强度的电子束。 离子源包括产生电子束并将其传输到电离室中的电子源。 电子束与电离室中的样品材料相互作用，以产生可以传输到下游装置的离子束。 电子源被配置为在电离室的上游产生虚拟阴极，这增强了电子束的强度。