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    System and method for dense-stochastic-sampling imaging
    71.
    发明授权
    System and method for dense-stochastic-sampling imaging 有权

    公开(公告)号：US09933363B2

    公开(公告)日：2018-04-03

    申请号：US14461779

    申请日：2014-08-18

    Applicant: GE HEALTCARE BIO-SCIENCES CORP.

    Inventor： Gaudenz Danuser ,  Paul C. Goodwin

    IPC: G01N21/64 ,  G01N21/63 ,  G02B21/36 ,  G06T3/40

    CPC classification number: G01N21/6428 ,  G01N21/636 ,  G01N21/6458 ,  G01N2021/6415 ,  G01N2021/6419 ,  G01N2201/126 ,  G02B21/365 ,  G02B21/367 ,  G06T3/4053

    Abstract: Embodiments of the present invention are directed to imaging technologies, and, in particular, to an imaging system that detects relatively weak signals, over time, and that uses the detected signals to determine the positions of signal emitters. Particular embodiments of the present invention are directed to methods and systems for imaging fluorophore-labeled samples in order to produce images of the sample at resolutions significantly greater than the diffraction-limited resolution associated with optical microscopy. Embodiments of the present invention employ overlapping-emitter-image disambiguation to allow data to be collected from densely arranged emitters, which significantly decreases the data-collection time for producing intermediate images as well as the number of intermediate images needed to computationally construct high-resolution final images. Additional embodiments of the present invention employ hierarchical image-processing techniques to further resolve and interpret disambiguated images.

    METHOD AND APPARATUS FOR MONITORING SURFACE PHENOMENA
    72.
    发明申请
    METHOD AND APPARATUS FOR MONITORING SURFACE PHENOMENA 审中-公开
    用于监测表面活性剂的方法和装置

    公开(公告)号：US20170067826A1

    公开(公告)日：2017-03-09

    申请号：US15123258

    申请日：2015-02-18

    Applicant: BioNavis Oy

    Inventor： Janusz SADOWSKI ,  Niko GRANQVIST ,  Jussi TUPPURAINEN ,  Annika JOKINEN

    IPC: G01N21/552 ,  G01N33/543 ,  G01N21/77

    CPC classification number: G01N21/553 ,  G01N21/43 ,  G01N21/77 ,  G01N33/54373 ,  G01N2021/7773 ,  G01N2201/1217 ,  G01N2201/126

    Abstract: A method for monitoring surface phenomena includes measuring a first surface plasmon resonance angle value (φSPR,REF) of a sample region (REG1), measuring a first critical angle value (φTIR,REF) of the sample region (REG1), causing a change of surface concentration (cM1,SRF) of an analyte (M1) at the sample region (REG1), changing the bulk composition at the sample region (REG1), measuring a second surface plasmon resonance angle value (φSPR(t)) of the sample region (REG1), measuring a second critical angle value (φTIR(t)) of the sample region (REG1), and determining an indicator value (φAUX(t)) indicative of the change of the surface concentration (cM1,SRF), wherein the indicator value (φAUX(t)) is determined from the second surface plasmon resonance angle value (φSPR(t)) by compensating an effect of the bulk composition, and wherein the magnitude (φCOMP) of said effect is determined by using the second critical angle value (φTIR(t)).

    Abstract translation: 一种用于监测表面现象的方法包括： - 测量样品区域（REG1）的第一表面等离子体共振角值（φSPR，REF）， - 测量样品区域（REG1）的第一临界角度值（φTIR，REF） - 引起样品区域（REG1）处的分析物（M1）的表面浓度（cM1，SRF）的变化， - 改变样品区域（REG1）处的体积组分， - 测量第二表面等离子体共振角值（φSPR （t））， - 测量样本区域（REG1）的第二临界角度值（φTIR（t）），以及 - 确定指示变化的指标值（φAUX（t）） 通过补偿本体组合物的影响，从第二表面等离子体共振角度值（φSPR（t））确定指标值（φAUX（t））的表面浓度（cM1，SRF），其中大小（φCOMP ）通过使用第二临界角度值（φTIR（t））来确定。

    Defect inspection method and defect inspection device
    74.
    发明授权
    Defect inspection method and defect inspection device 有权
    缺陷检查方法和缺陷检查装置

    公开(公告)号：US09291574B2

    公开(公告)日：2016-03-22

    申请号：US14232929

    申请日：2012-06-28

    Applicant: Shunichi Matsumoto ,  Atsushi Taniguchi ,  Toshifumi Honda ,  Yukihiro Shibata ,  Yuta Urano

    Inventor： Shunichi Matsumoto ,  Atsushi Taniguchi ,  Toshifumi Honda ,  Yukihiro Shibata ,  Yuta Urano

    IPC: G01N21/00 ,  G01N21/95 ,  G01N21/956 ,  H01L21/66

    CPC classification number: G01N21/9501 ,  G01N21/956 ,  G01N2201/126 ,  G01N2201/127 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: A defect inspection method and device for irradiating a linear region on a surface-patterned sample mounted on a table, with illumination light from an inclined direction to the sample, next detecting in each of a plurality of directions an image of the light scattered from the sample irradiated with the illumination light, then processing signals obtained by the detection of the images of the scattered light, and thereby detecting a defect present on the sample; wherein the step of detecting the scattered light image in the plural directions is performed through oval shaped lenses in which elevation angles of the optical axes thereof are different from each other, within one plane perpendicular to a plane formed by the normal to the surface of the table on which to mount the sample and the longitudinal direction of the linear region irradiated with the irradiation light.

    Abstract translation: 一种缺陷检查方法和装置，用于将安装在台上的表面图案样品上的线性区域照射到具有来自倾斜方向的样品的照明光，并在多个方向上检测从所述多个方向散射的光的图像 用照射光照射的样品，然后处理通过检测散射光的图像获得的信号，从而检测样品上存在的缺陷; 其特征在于，通过椭圆形透镜，其光轴的仰角彼此不同，在垂直于由所述平面形成的法线形成的平面的一个平面内，通过椭圆形透镜来检测多个方向上的散射光图像的步骤 用于安装样品的台面和用照射光照射的线性区域的纵向方向。

    SPECTROPHOTOMETER
    76.
    发明申请
    SPECTROPHOTOMETER 有权
    分光光度计

    公开(公告)号：US20150247793A1

    公开(公告)日：2015-09-03

    申请号：US14422276

    申请日：2013-07-22

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Takayuki Wakui ,  Hayato Tobe ,  Koichi Nakamura ,  Koji Yamamoto

    IPC: G01N21/31 ,  G01J3/42 ,  G01N21/01

    CPC classification number: G01N21/31 ,  G01J3/0291 ,  G01J3/42 ,  G01N21/01 ,  G01N21/274 ,  G01N2201/0253 ,  G01N2201/062 ,  G01N2201/126

    Abstract: A spectrophotometer includes: a sample-chamber lid capable of opening and closing an opening portion of a sample chamber for setting a sample and a reference sample; and sample-chamber lid opening-closing detecting means for detecting an opening-closing state of the sample-chamber lid, and the spectrophotometer is capable of controlling a measurement of a xenon flash tube as a light source, a spectroscope, a detector, an amplifier, an AD converter, a processor, a storage device, and a data display part. In the spectrophotometer, the light source is turned on after a state of the lid changing from an opening state to a closing state is detected in a sample-setting instruction state by the sample-chamber lid opening-closing detecting means; absorbancy, transmissivity, reflectivity, a sample-side energy value, or a reference-side energy value is measured; and a measurement result is displayed on the data display part.

    Abstract translation: 分光光度计包括：样品室盖，其能够打开和关闭用于设置样品和参考样品的样品室的开口部分; 以及用于检测样品室盖的打开 - 关闭状态的样品室盖打开 - 关闭检测装置，并且分光光度计能够控制作为光源的氙闪光管的测量，分光计，检测器， 放大器，AD转换器，处理器，存储设备和数据显示部件。 在分光光度计中，在样本室盖开闭检测单元的样本设定指示状态下，在从打开状态变为闭状态的状态之后，光源被接通， 测量吸收率，透射率，反射率，样品侧能量值或参考侧能量值; 并且在数据显示部分上显示测量结果。

    System and method for dynamically measuring oxygen levels
    77.
    发明授权
    System and method for dynamically measuring oxygen levels 有权
    用于动态测量氧气含量的系统和方法

    公开(公告)号：US08942944B2

    公开(公告)日：2015-01-27

    申请号：US13231661

    申请日：2011-09-13

    Applicant: David E. Forsyth

    Inventor： David E. Forsyth

    IPC: G06F19/00 ,  G06F17/40 ,  G01N33/00 ,  G01N21/64 ,  G01N21/27

    CPC classification number: G01N21/643 ,  G01N21/274 ,  G01N33/00 ,  G01N2021/6432 ,  G01N2201/1211 ,  G01N2201/1218 ,  G01N2201/126 ,  G01N2201/127 ,  G01N2201/12746 ,  G06F17/40 ,  G06F19/00

    Abstract: An oxygen sensing system including an oxygen sensor, a microprocessor and one or more additional sensors for sensing parameters associated with the environment or with the oxygen sensor, accounts for one or more sensed conditions when calculating oxygen levels. The one or more sensors may sense conditions associated with environmental effects or effects of use that may cause the oxygen sensor to degrade over usage or over time. A baseline amplification and measurement circuit coupled to the oxygen sensor may enable the sensor to operate less frequently or for shorter periods of time, thereby increasing the life span, calibration hold time of the sensor, and reducing power requirements.

    Abstract translation: 包括氧传感器，微处理器和用于感测与环境相关联的参数或氧传感器的一个或多个附加传感器的氧气感测系统在计算氧水平时考虑了一个或多个感测到的状况。 一个或多个传感器可以感测与环境影响或使用效果相关的条件，这可能导致氧传感器在使用或时间上降级。 耦合到氧传感器的基线放大和测量电路可以使得传感器能够较少频繁地操作或者更短的时间段，由此增加寿命，传感器的校准保持时间和降低功率需求。

    Method for Auto-Learning Tool Matching
    78.
    发明申请
    Method for Auto-Learning Tool Matching 审中-公开
    自动学习工具匹配的方法

    公开(公告)号：US20140358480A1

    公开(公告)日：2014-12-04

    申请号：US14270148

    申请日：2014-05-05

    Applicant: KLA-Tencor Corporation

    Inventor： Francis Raquel ,  Matthew Manzer ,  Christopher Lee

    IPC: G01M99/00 ,  G01N21/95

    CPC classification number: G01N21/9501 ,  G01M99/008 ,  G01N2201/126

    Abstract: The present disclosure is directed to a method of tool matching that employs an auto-learning feedback loop to update a library of key parameters. According to the method, measurements are performed on a control wafer to collect a set of parameters associated with the process/analysis tool that is being matched. When deviated parameters correlate to a correctable tool condition (i.e. a tool matching event), the parameters are added to the library of key parameters. These key or critical parameters may be monitored on a more frequent basis to identify deviations that have a strong likelihood of matching with a correctable tool condition. The tool matching methodology advantageously allows for monitoring of an automatically updated list of key parameters instead of needing to look at the full set of parameters collected from a control wafer each time. As such, tool matching can be performed on a more frequent basis.

    Abstract translation: 本公开涉及一种使用自动学习反馈循环来更新关键参数库的工具匹配方法。 根据该方法，在控制晶片上进行测量以收集与正在匹配的过程/分析工具相关联的一组参数。 当偏差参数与可修正的刀具条件（即刀具匹配事件）相关时，将参数添加到关键参数库中。 可以在更频繁的基础上监视这些关键或关键参数，以识别具有与可修正工具条件匹配的强烈可能性的偏差。 工具匹配方法有利地允许监视自动更新的关键参数列表，而不是每次都需要查看从控制晶片收集的全部参数。 因此，可以更频繁地进行工具匹配。

    System and method for dense-stochastic-sampling imaging
    80.
    发明授权
    System and method for dense-stochastic-sampling imaging 有权
    密集随机抽样成像的系统和方法

    公开(公告)号：US08830314B2

    公开(公告)日：2014-09-09

    申请号：US13535468

    申请日：2012-06-28

    Applicant: Gaudenz Danuser ,  Paul C. Goodwin

    Inventor： Gaudenz Danuser ,  Paul C. Goodwin

    IPC: H04N7/18 ,  G02B21/36 ,  G01N21/64

    CPC classification number: G01N21/6428 ,  G01N21/636 ,  G01N21/6458 ,  G01N2021/6415 ,  G01N2021/6419 ,  G01N2201/126 ,  G02B21/365 ,  G02B21/367 ,  G06T3/4053

    Abstract: Embodiments of the present invention are directed to imaging technologies, and, in particular, to an imaging system that detects relatively weak signals, over time, and that uses the detected signals to determine the positions of signal emitters. Particular embodiments of the present invention are directed to methods and systems for imaging fluorophore-labeled samples in order to produce images of the sample at resolutions significantly greater than the diffraction-limited resolution associated with optical microscopy. Embodiments of the present invention employ overlapping-emitter-image disambiguation to allow data to be collected from densely arranged emitters, which significantly decreases the data-collection time for producing intermediate images as well as the number of intermediate images needed to computationally construct high-resolution final images. Additional embodiments of the present invention employ hierarchical image-processing techniques to further resolve and interpret disambiguated images.

    Abstract translation: 本发明的实施例涉及成像技术，特别涉及一种随时间检测相对较弱信号的成像系统，并且使用所检测的信号来确定信号发射器的位置。 本发明的具体实施方案涉及用于成像荧光团标记的样品的方法和系统，以便以明显大于与光学显微镜相关联的衍射限制分辨率的分辨率产生样品的图像。 本发明的实施例采用重叠 - 发射 - 图像消歧以允许从密集布置的发射器收集数据，这显着减少用于产生中间图像的数据收集时间以及计算构建高分辨率所需的中间图像的数量 最终图像。 本发明的另外的实施例采用分层图像处理技术来进一步解析和解释消歧图像。

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