Surge arrester for an electric machine

    公开(公告)号:US09603237B2

    公开(公告)日:2017-03-21

    申请号:US14424831

    申请日:2013-08-06

    Inventor: Tobias Stiefel

    CPC classification number: H05K1/0259 H02K11/26 H05K2201/10204

    Abstract: Surge arrester for a an electric machine, comprising a dummy component (2) which is, compared to components on a circuit board (1) of the electric machine, mounted at the shortest distance from a discharge element (4) of the electric machine, the dummy component (2) being connected to earth potential in at least one terminal.

    Method for forming through-hole in insulating substrate by using laser beam
    86.
    发明授权
    Method for forming through-hole in insulating substrate by using laser beam 有权
    通过使用激光束在绝缘基板上形成通孔的方法

    公开(公告)号:US09205698B2

    公开(公告)日:2015-12-08

    申请号:US14481572

    申请日:2014-09-09

    Inventor: Kohei Horiuchi

    Abstract: A method including a) forming a through-hole in a dummy substrate including a surface by radiating a laser to the surface of the dummy substrate in a state where the dummy substrate is moved relative to the laser along a direction parallel to the surface of the dummy substrate, b) determining an angle α (−90°

    Abstract translation: 一种方法,包括:在虚拟衬底相对于激光器沿着平行于所述虚拟衬底的表面的方向相对于激光器移动的状态下,通过在所述虚设衬底的表面辐射激光而在包括表面的虚设衬底中形成通孔 虚拟基板,b)确定通孔相对于垂直于虚设基板的表面的线的角度α(-90°<α<+ 90°),以及c)在绝缘基板中形成通孔 与步骤a)相同的条件,除了以角度&bgr辐射激光; 相对于垂直于绝缘基板的表面的线。 角度&bgr 被设定为相对于垂直于绝缘基板的表面的线的角度α线对称,并且满足&bgr =α的关系。

    Test access component for automatic testing of circuit assemblies
    88.
    发明授权
    Test access component for automatic testing of circuit assemblies 有权
    用于电路组件自动测试的测试接入组件

    公开(公告)号:US08604820B2

    公开(公告)日:2013-12-10

    申请号:US12707930

    申请日:2010-02-18

    Inventor: Anthony J. Suto

    Abstract: A reliable and durable method of testing of printed circuit boards is presented. Test access components are placed in contact regions for providing electrical connectivity between test probes and the printed circuit board. In some cases, a test access component may be a surface mount resistor. The test access component may provide two points of contact for test probes to make electrical and mechanical contact with the printed circuit board. Test access components may also provide for increased durability of testing, allowing for a greater number of test contacts to be made between test probes and printed circuit boards than were previously possible.

    Abstract translation: 介绍了一种可靠耐用的印刷电路板测试方法。 测试访问组件放置在接触区域中,以提供测试探针与印刷电路板之间的电连接。 在某些情况下,测试访问组件可能是表面贴装电阻。 测试访问组件可以为测试探针提供两个接触点,以与印刷电路板进行电气和机械接触。 测试访问组件还可以提供更高的测试耐久性,允许在测试探针和印刷电路板之间进行比以前更多的测试接触。

    Apparatus for roll-to-roll manufacturing semiconductor parts and feeding method thereof
    89.
    发明授权
    Apparatus for roll-to-roll manufacturing semiconductor parts and feeding method thereof 有权
    用于卷对卷制造半导体部件的装置及其馈送方法

    公开(公告)号:US08601680B2

    公开(公告)日:2013-12-10

    申请号:US12545371

    申请日:2009-08-21

    Abstract: Provided is a method of roll-to-roll processing of semiconductor parts, the method including: supplying to a processing unit a first material uncoiled from a first roll for processing at the processing unit; connecting a leading board to a leading portion of the first material before the processing so that the first material led by the leading board is processed during transfer in the processing unit along a path; cutting the leading board from the leading portion of the first material after the processing; and if a terminal edge of the first material begins to be processed at the processing unit, connecting another leading board to a leading portion of a second material uncoiled from a second roll and supplying the second material to the processing unit for processing.

    Abstract translation: 提供一种半导体部件的卷对卷处理的方法,该方法包括:向处理单元提供从第一辊展开的第一材料,以在处理单元处进行处理; 在处理之前将前导板连接到第一材料的引导部分,使得由前导板引导的第一材料沿着路径在处理单元中传送期间被处理; 在处理后从第一材料的引导部分切割引导板; 并且如果所述第一材料的端边缘在所述处理单元处开始被处理,则将另一前导板连接到从第二辊展开的第二材料的引导部分,并将所述第二材料供应到所述处理单元用于处理。

    Electronic device and method for testing a circuit board
    90.
    发明授权
    Electronic device and method for testing a circuit board 失效
    用于测试电路板的电子设备和方法

    公开(公告)号:US08508236B2

    公开(公告)日:2013-08-13

    申请号:US12959049

    申请日:2010-12-02

    Abstract: An electronic device, and associated method, provided with a circuit board (10), with a set of input contacts (IN/COM), a set of output contacts (OUT/COM) and an electrical circuit (18) connected between the input contacts (IN/COM) and the output contacts (OUT/COM) and a controller. The controller carries out a real-time test of the circuit board using a test signal introduced into the electrical circuit, the electrical circuit (18) being designed as a passive network having a characteristic transfer function and provided with at least two separate partial circuits (18′, 18″) wherein the separate partial circuits are electrically connected in the assembled state by cooperation with at least one of: at least one device components and/or assembly components (181).

    Abstract translation: 一种具有电路板(10)的电子设备和相关方法,具有一组输入触点(IN / COM),一组输出触点(OUT / COM)和连接在输入端之间的电路(18) 触点(IN / COM)和输出触点(OUT / COM)和控制器。 控制器使用引入电路的测试信号对电路板进行实时测试,电路(18)被设计为具有特征传递功能的无源网络,并且具有至少两个分开的部分电路( 18',18“),其中所述分开的部分电路通过与至少一个器件部件和/或组件部件(181)中的至少一个协作而在组装状态下电连接。

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