Abstract:
A substrate for an electronic circuit, the substrate comprising a wafer of silicon Si having a top face covered in an electrically insulating layer of silicon nitride SiN, said electrically insulating layer of silicon nitride supporting one or more conductive tracks obtained by metallizing the top face of said electrically insulating layer for the purpose of enabling one or more electronic components to be connected.
Abstract:
A power switching module is provided having at least one power switch placed above at least one other power switch, each power switch in turn including an upper wall and a lower wall, each of which is cooled through thermal conduction by a cooling medium that circulates in channels and voids that are provided along the walls for this purpose.
Abstract:
A method of testing a power module including a control gate, an emitter, a collector, at least one power component on a dielectric substrate and a diode connected in antiparallel with the power component measures partial discharges occurring between the emitter and the collector when an alternating current voltage source superimposed on a direct current voltage source is connected between the collector and the emitter of the power module. The voltage Vtest received by the power module between the collector and the emitter verifies at all times the condition Vtest>0 so that the diode never conducts. The power component is maintained in a turned off state during the test by means of a direct current voltage source connected between the control gate and the emitter.
Abstract:
An electronic power circuit substrate including a wafer of electrically insulating material, wherein said wafer presents a face supporting one or more conductive tracks directly connected to one or more electronic power components, said conductive tracks being obtained by fine metallization of said face to a thickness that is less than 150nullm.