Systems and methods for transmitting clock signals asynchronously to dual-port memory cells

    公开(公告)号:US11437080B2

    公开(公告)日:2022-09-06

    申请号:US17092384

    申请日:2020-11-09

    Abstract: Embodiments of the disclosure provide systems and methods for transmitting clock signals asynchronously to dual-port memory cells. A system according to embodiments of the disclosure may include a source clock configured to generate a clock signal, a dual-port memory cell having a first input port, and a second input port coupled to the source clock. A clock tuner coupled between the source clock and the first input port of the dual-port memory cell delays the clock signal by one of a plurality of delay times and transmits the clock signal to the first input port.

    Sense amplifier circuit for current sensing

    公开(公告)号:US11475926B1

    公开(公告)日:2022-10-18

    申请号:US17344133

    申请日:2021-06-10

    Abstract: The present disclosure relates to integrated circuits, and more particularly, to a sense amplifier circuit for current sensing in a memory structure and methods of manufacture and operation. In particular, the present disclosure relates to a circuit including: a sensing circuit including a first set of transistors, at least one data cell circuit, and a reference cell circuit; a reference voltage holding circuit comprising a second set of transistors and a bitline capacitor; and a comparator differential circuit which receives a data sensing voltage signal from the sensing circuit and a reference voltage level from the reference voltage holding circuit and outputs an output signal.

    SYSTEMS AND METHODS FOR TRANSMITTING CLOCK SIGNALS ASYNCHRONOUSLY TO DUAL-PORT MEMORY CELLS

    公开(公告)号:US20220148633A1

    公开(公告)日:2022-05-12

    申请号:US17092384

    申请日:2020-11-09

    Abstract: Embodiments of the disclosure provide systems and methods for transmitting clock signals asynchronously to dual-port memory cells. A system according to embodiments of the disclosure may include a source clock configured to generate a clock signal, a dual-port memory cell having a first input port, and a second input port coupled to the source clock. A clock tuner coupled between the source clock and the first input port of the dual-port memory cell delays the clock signal by one of a plurality of delay times and transmits the clock signal to the first input port.

    METHOD AND SYSTEM FOR TESTING OF MEMORY
    7.
    发明公开

    公开(公告)号:US20230298681A1

    公开(公告)日:2023-09-21

    申请号:US17655389

    申请日:2022-03-18

    CPC classification number: G11C29/12015 H03K3/037 G06F1/06 G11C11/417

    Abstract: Embodiments of the present disclosure provide a level-sensitive register unit, including: a data latch for receiving data; a flip-flop including a first latch and a second latch, wherein an output of the data latch is coupled to an input of the first latch of the flip-flop; a first clock signal coupled to the data latch; and a second clock signal, wherein the second latch of the flip-flop is clocked by the second clock signal, and wherein the first latch of the flip-flop is clocked by an inverse of the second clock signal.

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