公开(公告)号：US20150036129A1

公开(公告)日：2015-02-05

申请号：US14311364

申请日：2014-06-23

Applicant: Genesis Photonics Inc.

Inventor： Cheng-Pin Chen ,  Yun-Li Li ,  Shou-Wen Hsu ,  Chih-Hung Tseng ,  Pei-Yi Huang ,  Ching-Cheng Sun ,  Tsung-Syun Huang ,  Yung-Tsung Lin ,  Ping-Tsung Tsai

IPC: G01N21/01 ,  G01N21/95

CPC classification number: G01N21/63 ,  G01N21/6489 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9501 ,  G01N2021/646 ,  G01N2201/061 ,  G01N2201/0636

Abstract: An inspection apparatus is capable for inspecting at least one light-emitting device. The inspection apparatus includes a working machine and an inspection light source. The inspection light source is disposed on the working machine and located above the light-emitting device. A dominant wavelength of the inspection light source is smaller than a dominant wavelength of the light-emitting device so as to excite the light-emitting device and get an optical property of the light-emitting device.

Abstract translation: 检查装置能够检查至少一个发光装置。 检查装置包括作业机和检查光源。 检查光源设置在工作机上并位于发光装置的上方。 检查光源的主波长小于发光装置的主波长，从而激发发光装置并获得发光装置的光学特性。

公开(公告)号：US20160153909A1

公开(公告)日：2016-06-02

申请号：US15016301

申请日：2016-02-05

Applicant: Genesis Photonics Inc.

Inventor： Cheng-Pin Chen ,  Yun-Li Li ,  Shou-Wen Hsu ,  Chih-Hung Tseng ,  Pei-Yi Huang ,  Ching-Cheng Sun ,  Tsung-Syun Huang ,  Yung-Tsung Lin ,  Ping-Tsung Tsai

IPC: G01N21/63 ,  G01N21/88

CPC classification number: G01N21/63 ,  G01N21/6489 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9501 ,  G01N2021/646 ,  G01N2201/061 ,  G01N2201/0636

Abstract: An inspection apparatus is capable for inspecting at least one light-emitting device. The inspection apparatus includes a working machine and an inspection light source. The inspection light source is disposed on the working machine and located above the light-emitting device. A dominant wavelength of the inspection light source is smaller than a dominant wavelength of the light-emitting device so as to excite the light-emitting device and get an optical property of the light-emitting device.

Abstract translation: 检查装置能够检查至少一个发光装置。 检查装置包括作业机和检查光源。 检查光源设置在工作机上并位于发光装置的上方。 检查光源的主波长小于发光装置的主波长，从而激发发光装置并获得发光装置的光学特性。