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公开(公告)号：US10401342B2
公开(公告)日：2019-09-03
申请号：US15356579
申请日：2016-11-19
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Hideyuki Akiyama , Kentaro Yamada , Toshitada Takeuchi
Abstract: Disclosed herein are an evolved gas analyzer and a method for analyzing evolved gas, the apparatus cooling a sample holder in a short time without using excessive cooling performance and without providing the entire apparatus in an excessively large size, thereby enhancing analysis work efficiency. The apparatus 200 includes: a sample holder 20 holding a sample S; a heating unit 10 receiving the sample holder therein, and evolving a gas component G by heating the sample; a detecting means 110 detecting the gas component; a sample holder supporting unit 204L movably supporting the sample holder to move the sample holder to predetermined outer and inner positions of the heating unit; and a cooling unit 30 provided at an outside of the heating unit, and cooling the sample holder by being in direct or indirect contact with the sample holder, when the sample holder is moved to a discharging position.
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公开(公告)号：US20170276538A1
公开(公告)日：2017-09-28
申请号：US15468187
申请日：2017-03-24
Applicant: Hitachi High-Tech Science Corporation
Inventor： Kentaro Yamada , Yasuyuki Takagi
Abstract: A sample container of a thermal analyzer that performs thermogravimetry or calorimetry includes a bottomed cylindrical body portion and a cover portion abutting against an opening of the body portion and covering at least a part of the opening. The cover portion includes a first cover portion abutting against an edge portion of the opening and having a second opening in a part of the first cover portion, and a second cover portion separated from the first cover portion in an axial direction of the body portion so as to cover at least a part of the second opening.
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公开(公告)号：US11143541B2
公开(公告)日：2021-10-12
申请号：US15468187
申请日：2017-03-24
Applicant: Hitachi High-Tech Science Corporation
Inventor： Kentaro Yamada , Yasuyuki Takagi
Abstract: A sample container of a thermal analyzer that performs thermogravimetry or calorimetry includes a bottomed cylindrical body portion and a cover portion abutting against an opening of the body portion and covering at least a part of the opening. The cover portion includes a first cover portion abutting against an edge portion of the opening and having a second opening in a part of the first cover portion, and a second cover portion separated from the first cover portion in an axial direction of the body portion so as to cover at least a part of the second opening.
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公开(公告)号：US09899198B2
公开(公告)日：2018-02-20
申请号：US15356581
申请日：2016-11-19
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Hideyuki Akiyama , Kentaro Yamada , Masafumi Watanabe , Toshitada Takeuchi , Kantaro Maruoka
CPC classification number: H01J49/0422 , G01N30/7206 , H01J49/0009 , H01J49/0409 , H01J49/049 , H01J49/10
Abstract: Disclosed herein is a method for analyzing evolved gas and an evolved gas analyzer, the method correcting detection sensitivity differences in analysis devices, day-to-day variations thereof, thereby quantifying a measurement target with high accuracy. The method for analyzing evolved gas of the apparatus including: a sample holder; a heating unit evolving a gas component; an ion source generating ions by ionizing the gas component; a mass spectrometer detecting the gas component; and a gas channel through which mixed gas flows, the method including: operating a discharged flow rate controlling process of controlling a flow rate of the mixed gas discharged to outside; operating a sample holder cooling process of cooling the sample holder by bringing the sample holder into contact with a cooling unit; and operating a correction process including: correcting a mass spectrum position; calculating a sensitivity correction factor; and calculating a heating correction factor.
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Patent Agency Ranking
公开(公告)号：US11644399B2
公开(公告)日：2023-05-09
申请号：US16812056
申请日：2020-03-06
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Takashi Kumazaki , Kentaro Yamada
IPC: G01N5/00
CPC classification number: G01N5/00
Abstract: A thermal analysis apparatus includes: a cylindrical heating furnace extending in an axial direction; a weight detector arranged on a rear-end side in the axial direction of the cylindrical heating furnace and including levers extending in the axial direction to detect a weight; a connecting portion for connecting the cylindrical heating furnace and the weight detector to communicate an internal space of the cylindrical heating furnace with an internal space of the weight detector and positioning the levers from the weight detector into the cylindrical heating furnace; sample holding portions connected to tip ends of the levers and arranged inside the cylindrical heating furnace and holding a sample; resistance heaters arranged to cover the weight detector and energized by an electric current of 6 A or less; and a heater control part for controlling an energization state of the resistance heaters to maintain the weight detector at a constant temperature.
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公开(公告)号：US10088402B2
公开(公告)日：2018-10-02
申请号：US14560003
申请日：2014-12-04
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Kentaro Yamada , Kanji Nagasawa , Ryoji Takasawa
Abstract: A thermal analyzer is provided with: a furnace tube; a pair of sample holders; a heating furnace; a measurement chamber; and a measurement unit arranged inside the measurement chamber. The sample holders are arranged inside the furnace tube and are provided with mounting faces on which a pair of sample containers are mounted respectively. The heating furnace has an opening through which a measurement sample is observable, the opening being located at a position above the center of a virtual segment which connects centers of gravity of the mounting faces of the sample holders. The opening is formed to have a size, as viewed in a direction perpendicular to the axial direction and the mounting faces, of 7 mm or more in the direction along the virtual segment and of 3 mm or more in the direction perpendicular to the virtual segment.
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公开(公告)号：US09753509B2
公开(公告)日：2017-09-05
申请号：US14606345
申请日：2015-01-27
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Hirohito Fujiwara , Kentaro Yamada
CPC classification number: G06F1/206 , G01N5/04 , G01N25/4853 , H04N5/2252 , H04N5/2254
Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.
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公开(公告)号：US20150153292A1
公开(公告)日：2015-06-04
申请号：US14560003
申请日：2014-12-04
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Kentaro Yamada , Kanji Nagasawa , Ryoji Takasawa
IPC: G01N25/02
CPC classification number: G01N5/00
Abstract: A thermal analyzer is provided with: a furnace tube; a pair of sample holders; a heating furnace; a measurement chamber; and a measurement unit arranged inside the measurement chamber. The sample holders are arranged inside the furnace tube and are provided with mounting faces on which a pair of sample containers are mounted respectively. The heating furnace has an opening through which a measurement sample is observable, the opening being located at a position above the center of a virtual segment which connects centers of gravity of the mounting faces of the sample holders. The opening is formed to have a size, as viewed in a direction perpendicular to the axial direction and the mounting faces, of 7 mm or more in the direction along the virtual segment and of 3 mm or more in the direction perpendicular to the virtual segment.
Abstract translation: 热分析仪配有：炉管; 一对样品架; 加热炉; 测量室; 以及设置在测量室内的测量单元。 样品保持器布置在炉管内部并且分别设置有安装面，一对样品容器分别安装在该安装面上。 加热炉具有可观察到测量样品的开口，该开口位于连接样品保持器的安装面的重心的虚拟段的中心上方的位置。 开口形成为沿垂直于轴线方向和安装面的方向沿着虚拟段的方向具有7mm或更大的尺寸并且在垂直于虚拟段的方向上具有3mm或更大的尺寸 。
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9.发明申请Imaging Apparatus for Thermal Analyzer and Thermal Analyzer Including the Same 有权用于热分析仪和热分析仪的成像仪器包括它公开(公告)号：US20150264277A1
公开(公告)日：2015-09-17
申请号：US14606345
申请日：2015-01-27
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Shinya Nishimura , Hirohito Fujiwara , Kentaro Yamada
CPC classification number: G06F1/206 , G01N5/04 , G01N25/4853 , H04N5/2252 , H04N5/2254
Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.
Abstract translation: 用于热分析器的成像装置被配置为从热分析器主体部分中设置的观察窗对热分析器主体部分内的加热样品进行成像。 成像装置设置有：成像装置，其具有透镜壳体和主体部分; 保持部，其构造成将所述摄像装置保持为具有朝向所述观察窗的方向，所述主体部位于所述观察窗的穿过所述镜片壳体的相反侧; 以及冷却风扇，其构造成在所述保持部内部提供气流。 保持部设有具有进气部和排气部的冷却风通路。 透镜壳体的至少一部分布置在冷却空气通道中，以由冷却风扇提供的气流进行冷却。
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