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公开(公告)号：US09683951B2
公开(公告)日：2017-06-20
申请号：US14620936
申请日：2015-02-12
Applicant: Hitachi High-Tech Science Corporation
Inventor： Toshitada Takeuchi
IPC: H05G1/00 , G01N23/22 , G01N23/223
CPC classification number: G01N23/2204 , G01N23/223
Abstract: A sample holder for X-ray analysis is provided with: a first annular member; a second annular member configured to be inserted and fitted into the first annular member in a state where a first film is sandwiched between the first annular member and the second annular member while the first film is being stretched to cover a lower opening portion of the second annular member; and a third annular member configured to be inserted and fitted into the second annular member in a state where a second film is sandwiched between the second annular member and the third annular member while the second film is being stretched to cover a lower opening portion of the third annular member. The first film and the second film are configured to hold a sample for X-ray analysis by sandwiching the sample between the first film and the second film.
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Patent Agency Ranking
公开(公告)号：US20140294143A1
公开(公告)日：2014-10-02
申请号：US14219579
申请日：2014-03-19
Applicant: Hitachi High-Tech Science Corporation
Inventor： Hiroaki Nohara , Yoshiki Matoba , Noriaki Sakai , Toshitada Takeuchi
IPC: G01N23/223
CPC classification number: G01N23/223 , G01N2223/076
Abstract: An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage.
Abstract translation: X射线荧光光谱仪包括：样品台，被配置为在其上放置样品; X射线源，被配置为用原始X射线照射样品; 检测器，其被配置为检测由所述主X射线照射的样品产生的荧光X射线，并且包括由可透射荧光X射线的窗口材料形成的X射线入射窗; 以及气体吹送机构，被配置为将气体吹送到X射线入射窗和样品台的外表面中的至少一个。
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公开(公告)号：US10401342B2
公开(公告)日：2019-09-03
申请号：US15356579
申请日：2016-11-19
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Hideyuki Akiyama , Kentaro Yamada , Toshitada Takeuchi
Abstract: Disclosed herein are an evolved gas analyzer and a method for analyzing evolved gas, the apparatus cooling a sample holder in a short time without using excessive cooling performance and without providing the entire apparatus in an excessively large size, thereby enhancing analysis work efficiency. The apparatus 200 includes: a sample holder 20 holding a sample S; a heating unit 10 receiving the sample holder therein, and evolving a gas component G by heating the sample; a detecting means 110 detecting the gas component; a sample holder supporting unit 204L movably supporting the sample holder to move the sample holder to predetermined outer and inner positions of the heating unit; and a cooling unit 30 provided at an outside of the heating unit, and cooling the sample holder by being in direct or indirect contact with the sample holder, when the sample holder is moved to a discharging position.
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公开(公告)号：US09899198B2
公开(公告)日：2018-02-20
申请号：US15356581
申请日：2016-11-19
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Hideyuki Akiyama , Kentaro Yamada , Masafumi Watanabe , Toshitada Takeuchi , Kantaro Maruoka
CPC classification number: H01J49/0422 , G01N30/7206 , H01J49/0009 , H01J49/0409 , H01J49/049 , H01J49/10
Abstract: Disclosed herein is a method for analyzing evolved gas and an evolved gas analyzer, the method correcting detection sensitivity differences in analysis devices, day-to-day variations thereof, thereby quantifying a measurement target with high accuracy. The method for analyzing evolved gas of the apparatus including: a sample holder; a heating unit evolving a gas component; an ion source generating ions by ionizing the gas component; a mass spectrometer detecting the gas component; and a gas channel through which mixed gas flows, the method including: operating a discharged flow rate controlling process of controlling a flow rate of the mixed gas discharged to outside; operating a sample holder cooling process of cooling the sample holder by bringing the sample holder into contact with a cooling unit; and operating a correction process including: correcting a mass spectrum position; calculating a sensitivity correction factor; and calculating a heating correction factor.
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公开(公告)号：US09400255B2
公开(公告)日：2016-07-26
申请号：US14219579
申请日：2014-03-19
Applicant: Hitachi High-Tech Science Corporation
Inventor： Hiroaki Nohara , Yoshiki Matoba , Noriaki Sakai , Toshitada Takeuchi
IPC: G01N23/223
CPC classification number: G01N23/223 , G01N2223/076
Abstract: An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage.
Abstract translation: X射线荧光光谱仪包括：样品台，被配置为在其上放置样品; X射线源，被配置为用原始X射线照射样品; 检测器，其被配置为检测由所述主X射线照射的样品产生的荧光X射线，并且包括由可透射荧光X射线的窗口材料形成的X射线入射窗; 以及气体吹送机构，被配置为将气体吹送到X射线入射窗和样品台的外表面中的至少一个。
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公开(公告)号：US20150226686A1
公开(公告)日：2015-08-13
申请号：US14620936
申请日：2015-02-12
Applicant: Hitachi High-Tech Science Corporation
Inventor： Toshitada Takeuchi
IPC: G01N23/22 , G01N23/223
CPC classification number: G01N23/2204 , G01N23/223
Abstract: A sample holder for X-ray analysis is provided with: a first annular member; a second annular member configured to be inserted and fitted into the first annular member in a state where a first film is sandwiched between the first annular member and the second annular member while the first film is being stretched to cover a lower opening portion of the second annular member; and a third annular member configured to be inserted and fitted into the second annular member in a state where a second film is sandwiched between the second annular member and the third annular member while the second film is being stretched to cover a lower opening portion of the third annular member. The first film and the second film are configured to hold a sample for X-ray analysis by sandwiching the sample between the first film and the second film.
Abstract translation: 用于X射线分析的样品架设有：第一环形构件; 第二环形构件，其构造成在所述第一膜被所述第一环状构件和所述第二环状构件之间夹持的状态下插入并嵌合在所述第一环状构件中，同时所述第一膜被拉伸以覆盖所述第二环状构件的下部开口部 环形构件; 以及第三环状构件，其构造成在第二膜被夹在第二环状构件和第三环状构件之间的状态下插入并嵌合到第二环形构件中，同时第二膜被拉伸以覆盖第二膜的下开口部 第三环形构件。 第一膜和第二膜被配置为通过将样品夹在第一膜和第二膜之间来保持用于X射线分析的样品。
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