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公开(公告)号:US20220122804A1
公开(公告)日:2022-04-21
申请号:US17563186
申请日:2021-12-28
Applicant: Hitachi High-Tech Corporation
Inventor: Toshiyuki YOKOSUKA , Chahn LEE , Hideyuki KAZUMI , Hajime KAWANO , Shahedul HOQUE , Kumiko SHIMIZU , Hiroyuki TAKAHASHI
IPC: H01J37/28 , H01J37/147 , H01J37/20 , H01J37/22
Abstract: The scanning charged particle beam microscope according to the present application is characterized in that, in acquiring an image of the FOV (field of view), interspaced beam irradiation points are set, and then, a deflector is controlled so that a charged particle beam scan is performed faster when the charged particle beam irradiates a position on the sample between each of the irradiation points than when the charged particle beam irradiates a position on the sample corresponding to each of the irradiation points (a position on the sample corresponding to each pixel detecting a signal). This allows the effects from a micro-domain electrification occurring within the FOV to be mitigated or controlled.
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公开(公告)号:US20200312615A1
公开(公告)日:2020-10-01
申请号:US16900176
申请日:2020-06-12
Applicant: Hitachi High-Tech Corporation
Inventor: Toshiyuki YOKOSUKA , Chahn LEE , Hideyuki KAZUMI , Hajime KAWANO , Shahedul HOQUE , Kumiko SHIMIZU , Hiroyuki TAKAHASHI
IPC: H01J37/28 , H01J37/147 , H01J37/20 , H01J37/22
Abstract: The scanning charged particle beam microscope according to the present application is characterized in that, in acquiring an image of the FOV (field of view), interspaced beam irradiation points are set, and then, a deflector is controlled so that a charged particle beam scan is performed faster when the charged particle beam irradiates a position on the sample between each of the irradiation points than when the charged particle beam irradiates a position on the sample corresponding to each of the irradiation points (a position on the sample corresponding to each pixel detecting a signal). This allows the effects from a micro-domain electrification occurring within the FOV to be mitigated or controlled.
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